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6 - 6
20090220b
MWI 75-12A8
IXYS reserves the right to change limits, test conditions and dimensions.
0 40 80 120 160
0
8
16
24
32
0
2
4
6
8
0 40 80 120 160
0
5
10
15
20
0.0001 0.001 0.01 0.1 1 10
0.0001
0.001
0.01
0.1
1
0 10 20 30 40 50 60
0
5
10
15
0 10 20 30 40 50 60
0
8
16
24
32
0
2
4
6
8
0 200 400 600 800 1000 1200 1400
0
50
100
150
200
I
C
[A]
E
on
[mJ]
t
[ns]
t [s]
Z
thJC
[K/W]
E
on
singlepulse
diode
IGBT
E
on
t
d(on)
V
CE
= 600 V
V
GE
=±15V
I
C
=75A
T
VJ
=125°C
V
CE
= 600 V
V
GE
=±15V
I
C
=75A
T
VJ
=125°C
R
G
=15W
T
VJ
=125°C
V
CE
= 600 V
V
GE
=±15V
R
G
=15W
T
VJ
=125°C
V
CE
= 600 V
V
GE
=±15V
R
G
=15W
T
VJ
=125°C
t
d(on)
MWI75-12A8
E
off
[mJ]
I
C
[A]
E
on
[mJ]
R
G
[W]
E
off
[mJ]
R
G
[W]
t
[ns]
I
CM
[A]
V
CE
[V]
Fig.7 Typ.turnonenergyandswitching
times versus collector current
Fig.8 Typ.turnoffenergyandswitching
times versus collector current
Fig.9 Typ.turnonenergyandswitching
times versus gate resistor
Fig.10 Typ.turnoffenergyandswitching
times versus gate resistor
Fig.11ReversebiasedsafeoperatingareaRBSOA Fig.12 Typ.transientthermalimpedance