ADuM230D/ADuM230E/ADuM231D/ADuM231E Data Sheet
Rev. A | Page 16 of 21
TYPICAL PERFORMANCE CHARACTERISTICS
Figure 10. ADuM230D/ADuM230E I
DD1
Supply Current vs. Data Rate at
Various Voltages
Figure 11. ADuM230D/ADuM230E I
DD2
Supply Current vs. Data Rate at
Various Voltages
Figure 12. ADuM231D/ADuM231E I
DD1
Supply Current vs. Data Rate at
Various Voltages
Figure 13. ADuM231D/ADuM231E I
DD2
Supply Current vs. Data Rate at
Various Voltages
Figure 14. Propagation Delay (t
PLH
) vs. Temperature at Various Voltages
Figure 15. Propagation Delay( t
PHL
) vs. Temperature at Various Voltages
I
DD1
SUPPLY CURRENT (mA)
16
14
12
10
8
6
4
2
0
0 20406080
DATA RATE (Mbps)
100 120 140 160
5.0V
3.3V
2.5V
1.8V
13577-110
0
2
4
6
8
10
12
14
16
0 20406080100120140160
I
DD2
SUPPLY CURRENT (mA)
DATA RATE (Mbps)
5.0V
3.3V
2.5V
1.8V
13577-111
0
2
4
6
8
10
12
14
16
0 20406080100120140160
I
DD1
SUPPLY CURRENT (mA)
DATA RATE (Mbps)
5.0V
3.3V
2.5V
1.8V
13577-112
0
2
4
6
8
10
12
14
16
0 20406080100120140160
I
DD2
SUPPLY CURRENT (mA)
DATA RATE (Mbps)
5.0V
3.3V
2.5V
1.8V
13577-113
0
2
4
6
8
10
12
14
40200 20406080100120140
PROPAGATION DELAY (t
PLH
) (ns)
TEMPERATURE (°C)
5.0V
3.3V
2.5V
1.8V
13577-114
0
2
4
6
8
10
12
14
–40 –20 0 20 40 60 80 100 120 140
PROPAGATION DELAY (
t
PHL
) (ns)
TEMPERATURE (°C)
5.0V
3.3V
2.5V
1.8V
13577-115
Data Sheet ADuM230D/ADuM230E/ADuM231D/ADuM231E
Rev. A | Page 17 of 21
THEORY OF OPERATION
The ADuM230D/ADuM230E/ADuM231D/ADuM231E use a
high frequency carrier to transmit data across the isolation
barrier using iCoupler chip scale transformer coils separated by
layers of polyimide isolation. Using an on/off keying (OOK)
technique and the differential architecture shown in Figure 16
and Figure 17, the ADuM230D/ADuM230E/ADuM231D/
ADuM231E have very low propagation delay and high speed.
Internal regulators and input/output design techniques allow
logic and supply voltages over a wide range from 1.7 V to 5.5 V,
offering voltage translation of 1.8 V, 2.5 V, 3.3 V, and 5 V logic.
The architecture is designed for high common-mode transient
immunity and high immunity to electrical noise and magnetic
interference. Radiated emissions are minimized with a spread
spectrum OOK carrier and other techniques.
Figure 16 illustrates the waveforms for the models of the
ADuM230D/ADuM230E/ADuM231D/ADuM231E that have
the condition of the fail-safe output state equal to low, where the
carrier waveform is off when the input state is low. If the input
side is off or not operating, the low fail-safe output state (the
ADuM230D0, ADuM231D0, ADuM230E0, and ADuM231E0
models) sets the output to low. For the ADuM230D/ADuM230E/
ADuM231D/ADuM231E models that have a fail-safe output
state of high, Figure 17 illustrates the conditions where the
carrier waveform is off when the input state is high. When the
input side is off or not operating, the high fail-safe output state
(the ADuM230D1, ADuM231D1, ADuM230E0, and
ADuM231E1 models) sets the output to high. See the Ordering
Guide for the model numbers that have the fail-safe output state
of low or the fail-safe output state of high.
Figure 16. Operational Block Diagram of a Single Channel with a Low Fail-Safe Output State
Figure 17. Operational Block Diagram of a Single Channel with a High Fail-Safe Output State
TRANSMITTER
GND
1
GND
2
V
IN
V
OUT
RECEIVER
REGULATOR REGULATOR
13577-014
TRANSMITTER
GND
1
GND
2
V
IN
V
OUT
RECEIVER
REGULATOR REGULATOR
13577-015
ADuM230D/ADuM230E/ADuM231D/ADuM231E Data Sheet
Rev. A | Page 18 of 21
APPLICATIONS INFORMATION
PCB LAYOUT
The ADuM230D/ADuM230E/ADuM231D/ADuM231E digital
isolators require no external interface circuitry for the logic
interfaces. Power supply bypassing is strongly recommended at
the input and output supply pins (see Figure 18). Bypass capaci-
tors are most conveniently connected between Pin 1 and Pin 2
for V
DD1
and between Pin 15 and Pin 16 for V
DD2
. The recom-
mended bypass capacitor value is between 0.01 μF and 0.1 μF.
The total lead length between both ends of the capacitor and
the input power supply pin must not exceed 10 mm. Bypassing
between Pin 1 and Pin 8 and between Pin 9 and Pin 16 must
also be considered, unless the ground pair on each package side
is connected close to the package.
Figure 18. Recommended PCB Layout
In applications involving high common-mode transients, ensure
that board coupling across the isolation barrier is minimized.
Furthermore, design the board layout such that any coupling
that does occur equally affects all pins on a given component
side. Failure to ensure this can cause voltage differentials between
pins exceeding the Absolute Maximum Ratings of the device,
thereby leading to latch-up or permanent damage.
See the AN-1109 Application Note for board layout guidelines.
PROPAGATION DELAY RELATED PARAMETERS
Propagation delay is a parameter that describes the time
required for a logic signal to propagate through a component.
The propagation delay to a Logic 0 output may differ from the
propagation delay to a Logic 1 output.
Figure 19. Propagation Delay Parameters
Pulse width distortion is the maximum difference between these
two propagation delay values and is an indication of how
accurately the timing of the input signal is preserved.
Channel matching is the maximum amount the propagation
delay differs between channels within a single ADuM230D/
ADuM230E/ADuM231D/ADuM231E component.
Propagation delay skew is the maximum amount the propagation
delay differs between multiple ADuM230D/ADuM230E/
ADuM231D/ADuM231E components operating under the
same conditions.
JITTER MEASUREMENT
Figure 20 shows the eye diagram for the ADuM230D/ADuM230E/
ADuM231D/ADuM231E. The measurement was taken using an
Agilent 81110A pulse pattern generator at 150 Mbps with
pseudorandom bit sequences (PRBS), 2(n − 1), n = 14, for 5 V
supplies. Jitter was measured with the Tektronix Model 5104B
oscilloscope, 1 GHz, 10 GSPS with the DPOJET jitter and eye
diagram analysis tools. The result shows a typical measurement
on the ADuM230D/ADuM230E/ADuM231D/ADuM231E with
630 ps p-p jitter.
Figure 20. Eye Diagram
INSULATION LIFETIME
All insulation structures eventually break down when subjected
to voltage stress over a sufficiently long period. The rate of
insulation degradation is dependent on the characteristics of the
voltage waveform applied across the insulation as well as on the
materials and material interfaces.
The two types of insulation degradation of primary interest are
breakdown along surfaces exposed to the air and insulation wear
out. Surface breakdown is the phenomenon of surface tracking
and the primary determinant of surface creepage requirements
in system level standards. Insulation wear out is the phenomenon
where charge injection or displacement currents inside the
insulation material cause long-term insulation degradation.
Surface Tracking
Surface tracking is addressed in electrical safety standards by
setting a minimum surface creepage based on the working
voltage, the environmental conditions, and the properties of the
insulation material. Safety agencies perform characterization
testing on the surface insulation of components, which allows
the components to be categorized in different material groups.
Lower material group ratings are more resistant to surface
tracking and, therefore, can provide adequate lifetime with
smaller creepage. The minimum creepage for a given working
voltage and material group is in each system level standard and
is based on the total rms voltage across the isolation, pollution
V
DD1
GND
1
V
IA
V
IB
V
IC
/V
OC
NIC
DISABLE
1
/V
E1
NIC = NO INTERNAL CONNECTION. LEAVE THIS PIN FLOATING.
GND
1
V
DD2
GND
2
V
OA
V
OB
V
IC
/V
OC
NIC
DISABLE
2
/V
E2
GND
2
13577-010
INPUT (V
Ix
)
OUTPUT (V
Ox
)
t
PLH
t
PHL
50%
50%
13577-011
105
0
1
2
3
4
VOL
T
AGE (V)
5
0
TIME (ns)
–5–10
13577-012

ADUM230E1BRIZ-RL

Mfr. #:
Manufacturer:
Analog Devices Inc.
Description:
Digital Isolators IC Robust 3 ch ISO 3:0 ch
Lifecycle:
New from this manufacturer.
Delivery:
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