1999 Jan 22 16
Philips Semiconductors Product specification
Frequency Shift Keying (FSK)/Amplitude
Shift Keying (ASK) receiver
UAA3220TS
Table 3 Tests and results
P
1
is the maximum available power from signal generator 1 at the input of the test board; P
2
is the maximum available
power from signal generator 2 at the input of the test board.
Notes
1. The voltage at pin PWD of the test circuit alternates between operating mode: on (50 ms; 0 V) and off (138 ms; V
CC
);
see Fig.4.
2. Probe of spectrum analyzer connected to pin FA (pin 22).
3. Spectrum analyzer connected to the input of the test board.
TEST
GENERATOR
RESULT
12
ASK sensitivity into
pin MIXIN (see Fig.5)
modulated test signal 1;
P
1
≤−113 dBm for
f
i(RF)
= 433.92 MHz;
P
1
≤−110 dBm for
f
i(RF)
= 868.35 MHz
− BER ≤ 3 × 10
−2
(e.g. 60 bit errors per second for 2000 bits/s)
FSK sensitivity into
pin MIXIN (see Fig.5)
modulated test signal 2;
P
1
≤−100 dBm
− BER ≤ 3 × 10
−2
(e.g. 60 bit errors per second for 2000 bits/s)
Maximum input power
for ASK (see Fig.5)
modulated test signal 1;
P
1
≥−22 dBm
− BER ≤ 3 × 10
−2
(e.g. 60 bit errors per second for 2000 bits/s)
Maximum input power
for FSK (see Fig.5)
modulated test signal 2;
P
1
≥−6 dBm
− BER ≤ 3 × 10
−2
(e.g. 60 bit errors per second for 2000 bits/s)
Receiver turn-on
time; see note 1 and
Fig.4
modulated test
signal 1 or 2;
P
1
=P
ref
+3dB
− check that the first 10 bits are correct;
error counting is started 10 ms after power down
is switched into operating mode on
Interception point
(mixer + PMA)
see note 2 and Fig.6
test signal 3;
P
1
= −40 dBm
test signal 4;
P
2
=P
1
measure with high impedance probe at pin FA
(for IM3 see Fig.6)
Spurious radiation;
see note 3 and Fig.7
−−no spurious signals (25 MHz to 1 GHz) with level
higher than maximum P
SPUR
IP3
PMA
P
1
IM3
2
----------
dBm+=
Fig.4 Timing diagram for pulsed power down voltage.
handbook, full pagewidth
MGM745
V
PWD
(V)
2.7
0
0 50 188 238 376 426
t (ms)
