HEF4040B_Q100 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2013. All rights reserved.
Product data sheet Rev. 1 — 4 April 2013 6 of 13
NXP Semiconductors
HEF4040B-Q100
12-stage binary ripple counter
10. Dynamic characteristics
[1] The typical values of the propagation delay and transition times are calculated from the extrapolation formulas shown (C
L
in pF).
[2] For loads other than 50 pF at the n
th
output, use the slope given.
[3] t
t
is the same as t
THL
and t
TLH
.
Table 6. Dynamic characteristics
V
SS
= 0 V; T
amb
= 25
C; unless otherwise specified; for test circuit see Figure 6.
Symbol Parameter Conditions V
DD
Extrapolation formula
[1]
Min Typ Max Unit
t
PHL
HIGH to LOW
propagation delay
CP Q0
see Figure 5
5 V 78 ns + (0.55 ns/pF)C
L
- 105 210 ns
10 V 34 ns + (0.23 ns/pF)C
L
-4590ns
15 V 27 ns + (0.16 ns/pF)C
L
-3570ns
Qn Qn + 1 5 V
[2]
(0.55 ns/pF)C
L
-3570ns
10 V
[2]
(0.23 ns/pF)C
L
-1530ns
15 V
[2]
(0.16 ns/pF)C
L
-1020ns
MR Qn
see Figure 5
5 V 63 ns + (0.55 ns/pF)C
L
- 90 180 ns
10 V 29 ns + (0.23 ns/pF)C
L
-4080ns
15 V 22 ns + (0.16 ns/pF)C
L
-3060ns
t
PLH
LOW to HIGH
propagation delay
CP Q0
see Figure 5
5 V 58 ns + (0.55 ns/pF)C
L
- 85 170 ns
10 V 29 ns + (0.23 ns/pF)C
L
-4080ns
15 V 22 ns + (0.16 ns/pF)C
L
-3060ns
Qn Qn + 1 5 V
[2]
(0.55 ns/pF)C
L
-3570ns
10 V
[2]
(0.23 ns/pF)C
L
-1530ns
15 V
[2]
(0.16 ns/pF)C
L
-1020ns
t
t
transition time see Figure 5 5 V
[3]
10 ns + (1.00 ns/pF)C
L
- 60 120 ns
10 V 9 ns + (0.42 ns/pF)C
L
-3060ns
15 V 6 ns + (0.28 ns/pF)C
L
-2040ns
t
W
pulse width CP input HIGH;
minimum width;
see Figure 5
5 V 50 25 - ns
10 V 30 15 - ns
15 V 20 10 - ns
MR input HIGH;
minimum width;
see Figure 5
5 V 40 20 - ns
10 V 30 15 - ns
15 V 20 10 - ns
t
rec
recovery time MR input;
see Figure 5
5 V 40 20 - ns
10 V 30 15 - ns
15 V 20 10 - ns
f
max
maximum
frequency
CP input;
see Figure 5
5 V 10 20 - MHz
10 V 15 30 - MHz
15 V 25 50 - MHz
HEF4040B_Q100 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2013. All rights reserved.
Product data sheet Rev. 1 — 4 April 2013 7 of 13
NXP Semiconductors
HEF4040B-Q100
12-stage binary ripple counter
11. Waveforms
Table 7. Dynamic power dissipation P
D
P
D
can be calculated from the formulas shown. V
SS
= 0 V; t
r
= t
f
20 ns; T
amb
= 25
C.
Symbol Parameter V
DD
Typical formula for P
D
(W) where:
P
D
dynamic power
dissipation
5 V P
D
= 400 f
i
+ (f
o
C
L
) V
DD
2
f
i
= input frequency in MHz,
f
o
= output frequency in MHz,
C
L
= output load capacitance in pF,
V
DD
= supply voltage in V,
(f
o
C
L
) = sum of the outputs.
10 V P
D
= 2000 f
i
+ (f
o
C
L
) V
DD
2
15 V P
D
= 5200 f
i
+ (f
o
C
L
) V
DD
2
Logic levels: V
OL
and V
OH
are typical output voltage levels that occur with the output load.
Transition times: transition time (t
t
) = HIGH LOW (t
THL
) or LOW HIGH (t
TLH
) transition times.
Measurement points are given in Table 8
, test circuit in Figure 6 and test data in Table 9
Fig 5. Waveforms showing propagation delays for MR to Qn and CP to Q0, minimum MR and CP pulse widths
MR input
Qn + 1 output
CP input
V
SS
Q0 or Qn
output
t
W
t
PHL
1/f
max
t
rec
V
M
V
M
V
I
V
I
V
M
001aaj763
t
PLH
t
W
t
TLH
t
THL
t
PLH
t
PHL
t
PHL
V
M
V
SS
V
OH
V
OL
V
OH
V
OL
Table 8. Measurement points
Supply voltage Input Output
V
DD
V
I
V
M
V
M
5 V to 15 V V
DD
or V
SS
0.5V
DD
0.5V
DD
HEF4040B_Q100 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2013. All rights reserved.
Product data sheet Rev. 1 — 4 April 2013 8 of 13
NXP Semiconductors
HEF4040B-Q100
12-stage binary ripple counter
a. Input waveforms
b. Test circuit
Test data is given in Table 9.
Definitions test circuit:
DUT = Device Under Test;
C
L
= load capacitance, including the jig and probe capacitance;
R
L
= load resistance, which should be equal to the output impedance of the pulse generator.
Fig 6. Test circuit for measuring switching times
V
M
V
M
t
W
t
W
10 %
90 %
10 %
90 %
0 V
V
I
V
I
negative
pulse
positive
pulse
0 V
V
M
V
M
90 %
10 %
90 %
10 %
t
f
t
r
t
r
t
f
001aaj781
V
DD
V
I
V
O
001aag182
DUT
C
L
R
T
G
Table 9. Test data
Supply voltage Input Load
V
DD
V
I
t
r
, t
f
C
L
5 V to 15 V V
SS
or V
DD
20 ns 50 pF

HEF4040BT-Q100J

Mfr. #:
Manufacturer:
Nexperia
Description:
Counter ICs 12-stage binary ripple counter
Lifecycle:
New from this manufacturer.
Delivery:
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