Philips Semiconductors Product data
AU5790Single wire CAN transceiver
2001 May 18
10
SYMBOL UNITMAX.TYP.MIN.CONDITIONSPARAMETER
Pin TxD (continued)
t
TrHS
Transmit delay in high-speed
mode, bus rising edge
NSTB = 5 V, EN = 0 V;
R
L
= 100 , C
L
= 15 nF;
8 V < V
BAT
< 16 V;
measured from the falling edge on
TxD to V
CANH
= 3.0 V
0.1 1.5 µs
t
TfHS
Transmit delay in high-speed
mode, bus falling edge
NSTB = 5 V, EN = 0 V;
R
L
= 100 , C
L
= 15 nF;
8 V < V
BAT
< 16 V;
measured from the rising edge on
TxD to V
CANH
= 1.0 V
0.2 3 µs
Pin RxD
t
DN
Receive delay in normal mode,
bus rising and falling edge
NSTB = 5 V, EN = 5 V;
5.5 V < V
BAT
< 27 V;
CANH to RxD time measured from
V
CANH
= 2.0 V to V
RxD
= 2.5 V
0.3 1 µs
t
DW
Receive delay in wake-up mode,
bus rising and falling edge
NSTB = 0 V, EN = 5 V;
5.5 V < V
BAT
< 27 V;
CANH to RxD time measured from
V
CANH
= 2.0 V to V
RxD
= 2.5 V
0.3 1 µs
t
DHS
Receive delay in high-speed
mode, bus rising and falling edge
NSTB = 5 V, EN = 0 V;
8 V < V
BAT
< 16 V;
CANH to RxD time measured from
V
CANH
= 2.0 V to V
RxD
= 2.5 V
0.3 1 µs
t
DS
Receive delay in sleep mode,
bus rising edge
NSTB = 0 V, EN = 0 V;
CANH to RxD time, measured from
V
CANH
= min {(V
BAT
– 3.78 V),
7.13 V} to V
RxD
= 2.5 V
10 70 µs
NOTES:
1. Operation at battery voltages down to 5.3 volts is guaranteed by design. Operation higher than 18 volts (18 V < V
BAT
< 27 V) for up to two
minutes is permitted if the thermal design of the board prevents reaching the thermal protection temperature limit, T
sd
, otherwise the device
will self protect. Typically these requirements will be encountered during jump start operation at T
amb
85 °C and V
BAT
< 27 V. Refer to the
“Thermal Characteristics” section of this data sheet, or application note AN2005 for guidance.
2. This parameter is characterized but not subject to production test.
Philips Semiconductors Product data
AU5790Single wire CAN transceiver
2001 May 18
11
SL01255
TxD
50%
CANH
3 V
2 V
1 V
RxD
50%
t
Tr
t
Tf
t
D
t
D
NOTE:
1. When AU5790 is in normal, high-speed, or wake-up mode, the transmit delay in rising edge t
Tr
may be expressed as t
TrN
, t
TrHS
, or t
TrW
,
respectively; the transmit delay in falling edge t
Tf
may be expressed as t
TfN
, t
TfHS
, or t
TfW
, respectively; and the receive delay t
D
as t
DN
,
t
DHS
, or t
DW
, respectively.
Figure 2. Timing Diagrams: Pin TxD, CANH, and RxD
Philips Semiconductors Product data
AU5790Single wire CAN transceiver
2001 May 18
12
TEST CIRCUITS
AU5790
TxD
NSTB
EN
RxD
GND
CANH
RTH
BAT
2.4 k
5.1V
9.1 k
1.5 k
1 µF
S3
V
BAT
I_CAN_LG
SL01234
S1
S2
Figure 3. Loss of ground test circuit
NOTES:
Opening S3 simulates loss of module ground.
Check I_CAN_LG with the following switch positions to simulate loss of ground in all modes:
1. S1 = open = S2
2. S1 = open, S2 = closed
3. S1 = closed, S2 = open
4. S1 = closed = S2

AU5790D,118

Mfr. #:
Manufacturer:
NXP Semiconductors
Description:
IC CAN TXRX SINGLE WIRE 8SOIC
Lifecycle:
New from this manufacturer.
Delivery:
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