Lattice Semiconductor LA-ispMACH 4000V/Z Automotive Family Data Sheet
25
Power Consumption
Power Estimation Coefficients
1
Device A B
LA-ispMACH 4032V 11.3 0.010
LA-ispMACH 4064V 11.5 0.010
LA-ispMACH 4128V 11.5 0.011
LA-ispMACH 4032Z 0.010 0.010
LA-ispMACH 4064Z 0.011 0.010
LA-ispMACH 4128Z 0.012 0.010
1. For further information about the use of these coefficients, refer to TN1005, Power Esti-
mation in ispMACH 4000V/B/C/Z Devices.
0 10050 150 200 250 300 350 400
50 100 200150 250
ICC (mA)
ICC (mA)
4032Z
4032V
4064V
4128V
4064Z
4128Z
60
80
100
40
20
Note: The devices are configured with the maximum number
of 16-bit counters, typical current at 1.8V, 25°C.
Note: The devices are configured with the maximum number
of 16-bit counters, typical current at 3.3V, 2.5V, 25°C.
LA-ispMACH 4000Z
Typical I
CC
vs. Frequency
(Preliminary Information)
LA-ispMACH 4000V
Typical I
CC
vs. Frequency
0 300
Frequency (MHz)Frequency (MHz)
00
50
100
150
Lattice Semiconductor LA-ispMACH 4000V/Z Automotive Family Data Sheet
26
Switching Test Conditions
Figure 12 shows the output test load that is used for AC testing. The specific values for resistance, capacitance,
voltage, and other test conditions are shown in Table 9.
Figure 12. Output Test Load, LVTTL and LVCMOS Standards
Table 9. Test Fixture Required Components
Test Condition R
1
R
2
C
L
1
Timing Ref. V
CCO
LVCMOS I/O, (L -> H, H -> L) 106Ω 106Ω 35pF
LVCMOS 3.3 = 1.5V LVCMOS 3.3 = 3.0V
LVCMOS 2.5 = V
CCO
/2 LVCMOS 2.5 = 2.3V
LVCMOS 1.8 = V
CCO
/2 LVCMOS 1.8 = 1.65V
LVCMOS I/O (Z -> H) 106Ω 35pF 1.5V 3.0V
LVCMOS I/O (Z -> L) 106Ω∞ 35pF 1.5V 3.0V
LVCMOS I/O (H -> Z) 106Ω 5pF V
OH
- 0.3 3.0V
LVCMOS I/O (L -> Z) 106Ω∞ 5pF V
OL
+ 0.3 3.0V
1. C
L
includes test fixtures and probe capacitance.
V
CCO
R
1
R
2
C
L
DUT
Test
Point
0213A/ispm4
k
Lattice Semiconductor LA-ispMACH 4000V/Z Automotive Family Data Sheet
27
Signal Descriptions
LA-ispMACH 4000V ORP Reference Table
LA-ispMACH 4000Z ORP Reference Table
Signal Names Description
TMS Input – This pin is the IEEE 1149.1 Test Mode Select input, which is used to control
the state machine
TCK Input – This pin is the IEEE 1149.1 Test Clock input pin, used to clock through the
state machine
TDI Input – This pin is the IEEE 1149.1 Test Data In pin, used to load data
TDO Output – This pin is the IEEE 1149.1 Test Data Out pin used to shift data out
GOE0/IO, GOE1/IO These pins are configured to be either Global Output Enable Input or as general I/O
pins
GND Ground
NC Not Connected
V
CC
The power supply pins for the logic core and JTAG port
CLK0/I, CLK1/I, CLK2/I, CLK3/I These pins are configured to be either CLK input or as an input
V
CCO0
, V
CCO1
The power supply pins for each I/O bank
yzz
Input/Output
1
These are the general purpose I/O used by the logic array. y is GLB
reference (alpha) and z is macrocell reference (numeric). z: 0-15
LA-ispMACH 4032V/Z y: A-B
LA-ispMACH 4064V/Z y: A-D
LA-ispMACH 4128V/Z y: A-H
1. In some packages, certain I/Os are only available for use as inputs. See the signal connections table for details.
4032V 4064V 4128V
Number of I/Os 30
1
32 30
2
32 64 64 92
3
96
Number of GLBs 2244 4 888
Number of I/Os /GLB 16 16 8 8 16 8 12 12
Reference ORP Table 16 I/Os / GLB 8 I/Os / GLB 16 I/Os / GLB 8 I/Os /GLB 12 I/Os / GLB
1. 32-macrocell device, 44 TQFP: 2 GLBs have 15 out of 16 I/Os bonded out.
2. 64-macrocells device, 44 TQFP: 2 GLBs have 7 out of 8 I/Os bonded out.
3. 128-macrocell device, 128 TQFP: 4 GLBs have 11 out of 12 I/Os
4032Z 4064Z 4128Z
Number of I/Os 32 32 64 64
Number of GLBs 2448
Number of I/Os / GLB 16 8 16 8
Reference ORP Table
16 I/Os /
GLB
8 I/Os /
GLB
16 I/Os /
GLB
8 I/Os /
GLB

LA4032V-75TN44E

Mfr. #:
Manufacturer:
Lattice
Description:
CPLD - Complex Programmable Logic Devices Auto Grade (AEC-Q100 ) ispMACH4032V
Lifecycle:
New from this manufacturer.
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