AD678
REV. C
–5–
ORDERING GUIDE
Model
1
Package Temperature Range Tested and Specified Package Option
2
AD678JN 28-Lead Plastic DIP 0°C to +70°C AC N-28
AD678KN 28-Lead Plastic DIP 0°C to +70°C AC + DC N-28
AD678JD 28-Lead Ceramic DIP 0°C to +70°C AC D-28
AD678KD 28-Lead Ceramic DIP 0°C to +70°C AC + DC D-28
AD678AD 28-Lead Ceramic DIP –40°C to +85°C AC D-28
AD678BD 28-Lead Ceramic DIP –40°C to +85°C AC + DC D-28
AD678AJ 44-Lead Ceramic JLCC –40°C to +85°C AC J-44
AD678BJ 44-Lead Ceramic JLCC –40°C to +85°C AC + DC J-44
AD678SD 28-Lead Ceramic DIP –55°C to +125°C AC D-28
AD678TD 28-Lead Ceramic DIP –55°C to +125°C AC + DC D-28
NOTES
1
For details on grade and package offerings screened in accordance with MIL-STD-883, refer to Analog Devices Military Products Databook or /883 data sheet.
2
N = Plastic DIP; D = Ceramic DIP; J = J-Leaded Ceramic Chip Carrier.
ABSOLUTE MAXIMUM RATINGS*
With
Respect
Specification To Min Max Units
V
CC
AGND –0.3 +18 V
V
EE
AGND –18 +0.3 V
V
CC
V
EE
–0.3 +26.4 V
V
DD
DGND 0 +7 V
AGND DGND –1 +1 V
AIN, REF
IN
AGND V
EE
V
CC
V
Digital Inputs DGND –0.5 +7 V
Digital Outputs DGND –0.5 V
DD
+ 0.3 V
Max Junction
Temperature 175 °C
Operating Temperature
J and K Grades 0 +70 °C
A and B Grades –40 +85 °C
S and T Grades –55 +125 °C
Storage Temperature –65 +150 °C
Lead Temperature
(10 sec max) +300 °C
*Stresses above those listed under Absolute Maximum Ratings may cause perma-
nent damage to the device. This is a stress rating only; functional operation of the
device at these or any other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect device reliability.
ESD SENSITIVITY
The AD678 features input protection circuitry consisting of large “distributed” diodes and polysilicon
series resistors to dissipate both high energy discharges (Human Body Model) and fast, low energy
pulses (Charged Device Model). Per Method 3015.2 of MIL-STD-883C, the AD678 has been
classified as a Category 1 device.
Proper ESD precautions are strongly recommended to avoid functional damage or performance
degradation. Charges as high as 4000 volts readily accumulate on the human body and test equipment
and discharge without detection. Unused devices must be stored in conductive foam or shunts, and
the foam should be discharged to the destination socket before devices are removed. For further
information on ESD precautions, refer to Analog Devices’ ESD Prevention Manual.
AD678
CS
SC OE EOCEN
SYNC
12/8
EOC
DB11
DB2
DB1
(R/L)
DB0
(HBE)
V
CC
V
EE
V
DD
DGND
OUTPUT
REGISTER
4-BIT FLASH
A/D
CONVERTER
CONTROL LOGIC
CONVERSION
LOGIC
SAMPLE/
HOLD
GAIN
STAGE
12-BIT D/A
CONVERTER
VOLTAGE
REF.
12
12
4
REF
OUT
REF
IN
BIPOFF
AIN
AGND
Functional Block Diagram
WARNING!
ESD SENSITIVE DEVICE
