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M27W801 DC and AC parameters
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4 DC and AC parameters
This section summarizes the operating and measurement conditions, and the DC and AC
characteristics of the device. The parameters in the DC and AC Characteristic tables that
follow are derived from tests performed under the Measurement Conditions summarized in
the relevant tables. Designers should check that the operating conditions in their circuit
match the measurement conditions when relying on the quoted parameters.
Figure 6. AC testing input output waveform
Figure 7. AC testing load circuit
Table 5. AC measurement conditions
High Speed Standard
Input Rise and Fall Times 10ns 20ns (10% to 90%)
Input Pulse Voltages 0 to 3V 0.4V to 2.4V
Input and Output Timing Ref. Voltages 1.5V 0.8V and 2V
AI01822
3V
High Speed
0V
1.5V
2.4V
Standard
0.4V
2.0V
0.8V
AI01823B
1.3V
OUT
C
L
C
L
= 30pF for High Speed
C
L
= 100pF for Standard
C
L
includes JIG capacitance
3.3k
1N914
DEVICE
UNDER
TEST
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DC and AC parameters M27W801
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Table 6. Capacitance
(1)
(2)
1. T
A
= 25 °C, f = 1 MHz
2. Sampled only, not 100% tested.
Symbol Parameter Test Condition Min Max Unit
C
IN
Input Capacitance V
IN
= 0V 6 pF
C
OUT
Output Capacitance V
OUT
= 0V 12 pF
Table 7. Read mode DC characteristics
(1)
(2)
1. T
A
= –40 to 85 °C; V
CC
= 2.7V to 3.6V; V
PP
= V
CC
2. V
CC
must be applied simultaneously with or before V
PP
and removed simultaneously or after V
PP
.
Symbol Parameter Test Condition Min Max Unit
I
LI
Input Leakage Current 0V
V
IN
V
CC
±10 µA
I
LO
Output Leakage Current 0V V
OUT
V
CC
±10 µA
I
CC
Supply Current
E = V
IL
, GV
PP
= V
IL
,
I
OUT
= 0mA,
f = 5MHz, V
CC
3.6V
15 mA
I
CC1
Supply Current (Standby) TTL E = V
IH
1mA
I
CC2
Supply Current (Standby) CMOS
E
> V
CC
– 0.2V,
V
CC
3.6V
30 µA
I
PP
Program Current V
PP
= V
CC
10 µA
V
IL
Input Low Voltage –0.6 0.2 V
CC
V
V
IH
(3)
3. Maximum DC voltage on Output is V
CC
+0.5V.
Input High Voltage 0.7 V
CC
V
CC
+ 0.5 V
V
OL
Output Low Voltage I
OL
= 2.1mA 0.4 V
V
OH
Output High Voltage TTL I
OH
= –1mA 2.4 V
Table 8. Programming mode DC characteristics
(1)
(2)
1. T
A
= 25 °C; V
CC
= 6.25V ± 0.25V; V
PP
= 12.75V ± 0.25V
2. V
CC
must be applied simultaneously with or before V
PP
and removed simultaneously or after V
PP
.
Symbol Parameter Test Condition Min Max Unit
I
LI
Input Leakage Current V
IL
V
IN
V
IH
±10 µA
I
CC
Supply Current 50 mA
I
PP
Program Current E = V
IL
50 mA
V
IL
Input Low Voltage –0.3 0.8 V
V
IH
Input High Voltage 2 V
CC
+ 0.5 V
V
OL
Output Low Voltage I
OL
= 2.1mA 0.4 V
V
OH
Output High Voltage TTL I
OH
= –1mA 3.6 V
V
ID
A9 Voltage 11.5 12.5 V
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M27W801 DC and AC parameters
15/24
Figure 8. Read mode AC waveforms
Table 9. Read mode AC characteristics
(1)
(2)
1. T
A
= –40 to 85 °C; V
CC
= 2.7V to 3.6V; V
PP
= V
CC
2. V
CC
must be applied simultaneously with or before V
PP
and removed simultaneously or after V
PP
.
Symbol Alt Parameter
Test
Condition
M27W801
Unit
-100
(3)
3. Speed obtained with High Speed AC measurement conditions.
-120 (-150/-200)
V
CC
= 3.0V
to 3.6V
V
CC
= 2.7V
to 3.6V
V
CC
= 2.7V to
3.6V
Min Max Min Max Min Max
t
AVQV
t
ACC
Address Valid to
Output Valid
E = V
IL
,
G
= V
IL
80 100 120 ns
t
ELQV
t
CE
Chip Enable Low to
Output Valid
G
= V
IL
80 100 120 ns
t
GLQV
t
OE
Output Enable Low
to Output Valid
E
= V
IL
50 60 70 ns
t
EHQZ
(4)
4. Sampled only, not 100% tested.
t
DF
Chip Enable High to
Output Hi-Z
G
= V
IL
0 50 0 60 0 70 ns
t
GHQZ
(4)
t
DF
Output Enable High
to Output Hi-Z
E
= V
IL
0 50 0 60 0 70 ns
t
AXQX
t
OH
Address Transition
to Output Transition
E = V
IL
,
G
= V
IL
00 0 ns
AI01583B
tAXQX
tEHQZ
A0-A19
E
G
Q0-Q7
tAVQV
tGHQZ
tGLQV
tELQV
VALID
Hi-Z
VALID
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M27W801-100K6

Mfr. #:
Manufacturer:
STMicroelectronics
Description:
EPROM 8M (1Mx8) 100ns
Lifecycle:
New from this manufacturer.
Delivery:
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