OMO ElectronicOMO Electronic
Expand menu
Hello, Sign inMy Account
0 Cart

ADUM5230ARWZ

P1-P3P4-P6P7-P9P10-P12P13-P15P16-P16
ADuM5230 Data Sheet
Rev. C | Page 12 of 15
POWER CONSUMPTION
The power converter in the ADuM5230 provides 13 mA of
power to the secondary in its default configuration. Power is
provided to both the data channel, V
OA
, and the V
ISO
pin for off-
chip use. Current consumption of V
OA
varies with frequency as
shown in Figure 8. The maximum available power for external
use decreases as the frequency of the data channel increases to
stay within the total available current.
INCREASING AND DECREASING AVAILABLE POWER
The V
ADJ
pin is used to increase or decrease the available power
at the V
ISO
pin. This allows the increase of the V
ISO
voltage for a
given load or the increase of the maximum V
ISO
load. Alternatively,
power can also be reduced when it is not required at the output,
lowering the quiescent current and saving power.
Power adjustment is accomplished by adding a voltage divider
between V
ADJ
, V
DD1
, and GND, as shown in Figure 25. Under
normal operation, the V
ADJ
pin is left open, allowing the internal
bias network to set the duty factor of the internal PWM. If the
V
ADJ
pin is connected via a resistor divider, a duty factor other
than the default can be chosen. The relationship between the
duty factor of the internal PWM and the available power under
load is shown in Figure 13. When the desired duty factor is
chosen, the values of the upper and lower divider resistors can
be chosen as shown in Figure 14, which assumes a 10 kΩ total
divider resistance.
COMMON-MODE TRANSIENT IMMUNITY
In general, common-mode transients consist of linear and
sinusoidal components. The linear component of a common-
mode transient is given by
V
CM, linear
= (ΔV/Δt) t
where ΔV/Δt is the slope of the transient shown in Figure 19
and Figure 20.
The transient of the linear component is given by
dV
CM
/dt = ΔV/Δt
The ability of the ADuM5230 to operate correctly in the
presence of linear transients is characterized by the data in
Figure 22. The data is based on design simulation and is the
maximum linear transient magnitude that the ADuM5230 can
tolerate without an operational error. This data shows a higher
level of robustness than what is shown in Table 1 because the
transient immunity values obtained in Table 1 use measured
data and apply allowances for measurement error and margin.
GND
1
V
DD1
∆V
∆t
∆V
∆t
5V
GND
1
V
DD1
15V
15V
GND
ISO
AND GND
B
V
ISO
AND V
DDB
5V
GND
ISO
AND GND
B
V
ISO
AND V
DDB
15V
15V
07080-006
Figure 19. Common-Mode Transient Immunity Waveforms, Input to Output
GND
B
/GND
B
V
ISO
/V
DDB
∆V
∆t
∆V
∆t
15V
GND
B
/GND
B
V
ISO
/V
DDB
15V
15V
GND
ISO
/GND
B
V
ISO
/V
DDB
15V
GND
ISO
/GND
B
V
ISO
/V
DDB
15V
15V
07080-007
Figure 20. Common-Mode Transient Immunity Waveforms Between Outputs
GND
ISO
/GND
B
V
ISO
/V
DDB
V
ISO
/V
DDB
GND
ISO
/GND
B
07080-008
∆V
DD
∆t
Figure 21. Transient Immunity Waveforms, Output Supplies
Data Sheet ADuM5230
Rev. C | Page 13 of 15
07080-003
TEMPERATURE (°C)
100–40 0 40 80–20 20 60
TRANSIENT IMMUNITY (kV/µs)
300
250
200
150
100
50
0
WORST-CASE PROCESS VARIATION
BEST-CASE PROCESS VARIATION
Figure 22. Transient Immunity (Linear Transients) vs. Temperature
The sinusoidal component (at a given frequency) is given by
V
CM, sinusoidal
= V
0
sin(2πft)
where:
V
0
is the magnitude of the sinusoidal.
f is the frequency of the sinusoidal.
The transient magnitude of the sinusoidal component is given by
dV
CM
/dt = 2πf V
0
The ability of the ADuM5230 to operate correctly in the pres-
ence of sinusoidal transients is characterized by the data in
Figure 23 and Figure 24. The data is based on design simulation
and is the maximum sinusoidal transient magnitude (2πf V
0
)
that the ADuM5230 can tolerate without an operational error.
Values for immunity against sinusoidal transients are not
included in Table 1 because measurements to obtain such values
have not been possible.
07080-004
FREQUENCY (MHz)
20000 500 1000 1500 1750250 750 1250
TRANSIENT IMMUNITY (kV/µs)
200
160
180
120
80
40
140
100
60
20
0
WORST-CASE PROCESS VARIATION
BEST-CASE PROCESS VARIATION
Figure 23. Transient Immunity (Sinusoidal Transients),
27°C Ambient Temperature
07080-005
FREQUENCY (MHz)
20000 500 1000 1500 1750250 750 1250
TRANSIENT IMMUNITY (kV/µs)
200
140
100
60
20
160
180
120
80
40
0
WORST-CASE PROCESS VARIATION
BEST-CASE PROCESS VARIATION
Figure 24. Transient Immunity (Sinusoidal Transients),
100°C Ambient Temperature
TYPICAL APPLICATION USAGE
The ADuM5230 is intended for driving low gate capacitance
transistors (200 pF typically). Most high voltage applications
involve larger transistors than this. To accommodate these
applications, users can implement a buffer configuration with
the ADuM5230, as shown in Figure 25. In many cases, the
buffer configuration is the least expensive option and provides
the greatest amount of design flexibility. The precise buffer/high
voltage transistor combination can be selected to fit the needs of
the application.
07080-009
+H
V
–HV
GND
1
V
DD1
V
ADJ
V
IA
V
ISO
V
OA
GND
ISO
V
DDB
V
OB
GND
B
V
IB
ADuM5230
FLOATING V
DDB
R
UPPER
R
LOWER
Figure 25. Application Circuit
ADuM5230 Data Sheet
Rev. C | Page 14 of 15
INSULATION LIFETIME
All insulation structures eventually break down when subjected
to voltage stress over a sufficiently long period. The rate of
insulation degradation depends on the characteristics of the
voltage waveform applied across the insulation. In addition to
the testing performed by the regulatory agencies, Analog
Devices conducts an extensive set of evaluations to determine
the lifetime of the insulation structure within the ADuM5230.
Analog Devices performs accelerated life testing using voltage
levels higher than the rated continuous working voltage.
Acceleration factors for several operating conditions are
determined. These factors allow calculation of the time to
failure at the actual working voltage. Table 7 summarizes the
peak voltages for 50 years of service life for a bipolar ac operating
condition and the maximum Analog Devices recommended
working voltages. In many cases, the approved working voltage
is higher than the 50-year service life voltage. Operation at these
high working voltages can lead to shortened insulation life in
some cases.
The insulation lifetime of the ADuM5230 depends on the
voltage waveform type imposed across the isolation barrier.
The iCoupler insulation structure degrades at different rates
depending on whether the waveform is bipolar ac, unipolar ac,
or dc. Figure 26, Figure 27, and Figure 28 illustrate these different
isolation voltage waveforms.
Bipolar ac voltage is the most stringent environment. The goal
of a 50-year operating lifetime under the ac bipolar condition
determines the maximum working voltage recommended by
Analog Devices.
In the case of unipolar ac or dc voltage, the stress on the insulation
is significantly lower. This allows operation at higher working
voltages while still achieving a 50-year service life. The working
voltages listed in Table 7 can be applied while maintaining the 50-
year minimum lifetime, provided the voltage conforms to either
the unipolar ac or dc voltage cases. Treat any cross-insulation
voltage waveform that does not conform to Figure 27 or Figure 28
as a bipolar ac waveform, and limit its peak voltage to the 50-year
lifetime voltage value listed in Table 7. Note that the voltage
presented in Figure 27 is shown as sinusoidal for illustration
purposes only. It is meant to represent any voltage waveform
varying between 0 V and some limiting value. The limiting value
can be positive or negative, but the voltage cannot cross 0 V.
0V
RATED PEAK VOLTAGE
07080-026
Figure 26. Bipolar AC Waveform
0V
RATED PEAK VOLTAGE
07080-027
Figure 27. Unipolar AC Waveform
0V
RATED PEAK VOLTAGE
07080-028
Figure 28. DC Waveform
P1-P3P4-P6P7-P9P10-P12P13-P15P16-P16

ADUM5230ARWZ

Mfr. #:
Buy ADUM5230ARWZ
Manufacturer:
Analog Devices Inc.
Description:
Digital Isolators Half-Bridge Dvr w/ Intg Hi-Side Supply
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
T/T Paypal Visa MoneyGram Western Union

Products related to this Datasheet