74LCX00 Electrical characteristics
Doc ID 4972 Rev 7 7/16
Table 8. AC electrical characteristics
Symbol Parameter
Test condition Value
Unit
V
CC
(V)
C
L
(pF)
R
L
(Ω)
t
s
= t
r
(ns)
-40 to 85 °C
Min. Max.
t
PLH
t
PHL
Propagation delay
time
2.7
50 500 2.5
5.1
ns
3.0 to 3.6 1.0 4.3
t
OSLH
t
OSHL
Output-to-output
skew time
(1)
,
(2)
1. Skew is defined as the absolute value of the difference between the actual propagation delay for any two
outputs of the same device switching in the same direction, either HIGH or LOW (t
OSLH
= | t
PLHm
- t
PLHn
|,
t
OSHL
= | t
PHLm
- t
PHLn
|).
2. Parameter guaranteed by design.
3.0 to 3.6 50 500 2.5 1.0 ns
Table 9. Capacitive characteristics
Symbol Parameter
Test condition Value
Unit
V
CC
(V)
T
A
= 25 °C
Min. Typ. Max.
C
IN
Input capacitance 3.3
V
IN
= 0 to V
CC
6pF
C
PD
Power dissipation
capacitance
(1)
1. C
PD
is defined as the value of the IC’s internal equivalent capacitance which is calculated from the
operating current consumption without load. (Refer to Section 5: Test circuit). Average operating current
can be obtained by the following equation. I
CC(opr)
= C
PD
x V
CC
x f
IN
+ I
CC
/4 (per gate).
3.3
f
IN
= 10 MHz
V
IN
= 0 or V
CC
35 pF
Test circuit 74LCX00
8/16 Doc ID 4972 Rev 7
5 Test circuit
Figure 4. Test circuit
Note: C
L
= 50 pF or equivalent (includes jig and probe capacitance)
R
L
= 500
Ω
or equivalent
R
T
= Z
OUT
of pulse generator (typically 50
Ω
).
74LCX00 Waveforms
Doc ID 4972 Rev 7 9/16
6 Waveforms
Figure 5. Waveform - propagation delay (f = 1 MHz; 50% duty cycle)

74LCX00YTTR

Mfr. #:
Manufacturer:
STMicroelectronics
Description:
Logic Gates Lo Vltg CMOS QUAD 2-Input NAND gate
Lifecycle:
New from this manufacturer.
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