Si5018
Rev. 1.3 7
Table 3. AC Characteristics (Clock and Data)
(V
A
2.5 V ±5%, T
A
= –40 to 85 °C)
Parameter Symbol Test Condition Min Typ Max Unit
Output Clock Rate f
CLK
2.4 2.7 GHz
Output Rise/Fall Time t
R,
t
F
Figure 3 80 110 ps
Clock to Data Delay
FEC (2.7 GHz)
OC-48
t
C-D
Figure 2
225
225
250
250
270
270
ps
Input Return Loss 100 kHz–2.5 GHz
2.5 GHz–4.0 GHz
16
13
dB
dB
Table 4. AC Characteristics (PLL Characteristics)
(V
A
2.5 V ±5%, T
A
= –40 to 85 °C)
Parameter Symbol Test Condition Min Typ Max Unit
Jitter Tolerance* J
TOL(P–P)
f=600Hz 40 UI
PP
f = 6000 Hz 4 UI
PP
f=100kHz 4 UI
PP
f = 1 MHz .4 UI
PP
RMS Jitter Generation
*
J
GEN(rms)
with no jitter on serial data 2.9 5.0 mUI
Peak-to-Peak Jitter Generation
*
J
GEN(PP)
with no jitter on serial data 25 55 mUI
Jitter Transfer Bandwidth
*
J
BW
——2.0MHz
Jitter Transfer Peaking
*
J
P
—0.030.1dB
Acquisition Time T
AQ
After falling edge of
PWRDN/CAL
1.45 1.5 1.7 ms
From the return of valid data 40 60 150 μs
Input Reference Clock Duty
Cycle
C
DUTY
40 50 60 %
Input Reference Clock Frequency
Tolerance
C
TOL
–100 100 ppm
Reference Clock Range 19.44 168.75 MHz
Frequency Difference at which
Receive PLL goes out of Lock
(REFCLK compared to the
divided down VCO clock)
LOL 450 600 750 ppm
Frequency Difference at which
Receive PLL goes into Lock
(REFCLK compared to the
divided down VCO clock)
LOCK 150 300 450 ppm
*Note: Bellcore specifications: GR-253-CORE, Issue 2, December 1995. Using PRBS 2
23
– 1 data pattern.
Si5018
8 Rev. 1.3
Table 5. Absolute Maximum Ratings
Parameter Symbol Value Unit
DC Supply Voltage V
DD
–0.5 to 2.8 V
LVTTL Input Voltage V
DIG
–0.3 to 3.6 V
Differential Input Voltages V
DIF
–0.3 to (V
DD
+ 0.3) V
Maximum Current any output PIN ±50 mA
Operating Junction Temperature T
JCT
–55 to 150 °C
Storage Temperature Range T
STG
–55 to 150 °C
ESD HBM Tolerance (100 pf, 1.5 kΩ)1kV
Note: Permanent device damage may occur if the absolute maximum ratings are exceeded. Functional operation should be
restricted to the conditions as specified in the operational sections of this data sheet. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
Table 6. Thermal Characteristics
Parameter Symbol Test Condition Value Unit
Thermal Resistance Junction to Ambient ϕ
JA
Still Air 38 °C/W
Si5018
Rev. 1.3 9
3. Typical Application Schematic
Si5018
Powerdown
Loss-of-Lock
Indicator
LOL
High-Speed
Serial Input
System
Reference
Clock
DIN+
DIN–
REFCLK+
REFCLK–
REXT
VDD
GND
DOUT+
DOUT–
CLKOUT+
CLKOUT–
Recovered
Data
Recovered
Clock
0.1 μF
2200 pF
VDD
10 kΩ
(1%)
PWRDN/CAL
20 pF

SI5018-B-GMR

Mfr. #:
Manufacturer:
Silicon Labs
Description:
Clock Generators & Support Products
Lifecycle:
New from this manufacturer.
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