AD5301/AD5311/AD5321 Data Sheet
Rev. C | Page 4 of 24
B Version
1
Parameter
2
Min Typ Max Unit Test Conditions/Comments
LOGIC OUTPUT (SDA)
5
Output Low Voltage, V
OL
0.4 V I
SINK
= 3 mA.
0.6 V I
SINK
= 6 mA.
Three-State Leakage
Current
±1 μA
Three-State Output
Capacitance
6 pF
POWER REQUIREMENTS
V
DD
2.5
V
I
DD
specification is valid for all DAC codes.
I
DD
(Normal Mode) DAC active and excluding load current.
V
DD
= 4.5 V to 5.5 V 150 250 μA V
IH
= V
DD
and V
IL
= GND.
V
DD
= 2.5 V to 3.6 V 120 220 μA V
IH
= V
DD
and V
IL
= GND.
I
DD
(Power-Down Mode)
V
DD
= 4.5 V to 5.5 V 0.2 1 μA V
IH
= V
DD
and V
IL
= GND.
V
DD
= 2.5 V to 3.6 V 0.05 1 μA V
IH
= V
DD
and V
IL
= GND.
1
Temperature range is as follows: B Version: −40°C to +105°C.
2
See the Terminology section.
3
DC specifications tested with the outputs unloaded.
4
Linearity is tested using a reduced code range: AD5301 (Code 7 to 250); AD5311 (Code 28 to 1000); and AD5321 (Code 112 to 4000).
5
Guaranteed by design and characterization, not production tested.
6
Input filtering on both the SCL and SDA inputs suppress noise spikes that are less than 50 ns.
Data Sheet AD5301/AD5311/AD5321
Rev. C | Page 5 of 24
AC CHARACTERISTICS
1
V
DD
= 2.5 V to 5.5 V; R
L
= 2 kΩ to GND; C
L
= 200 pF to GND; all specifications T
MIN
to T
MAX
, unless otherwise noted.
Table 2.
B Version
2
Parameter
3
Min Typ Max Unit Test Conditions/Comments
Output Voltage Settling Time V
DD
= 5 V
AD5301 6 8 μs 1/4 scale to 3/4 scale change (0x40 to 0xC0)
AD5311 7 9 μs 1/4 scale to 3/4 scale change (0x100 to 0x300)
AD5321 8 10 μs 1/4 scale to 3/4 scale change (0x400 to 0xC00)
Slew Rate 0.7 V/μs
Major-Code Change Glitch Impulse 12 nV-s 1 LSB change around major carry
Digital Feedthrough 0.3 nV-s
1
See the Terminology section.
2
Temperature range for the B Version is as follows: –40°C to +105°C.
3
Guaranteed by design and characterization, not production tested.
TIMING CHARACTERISTICS
1
V
DD
= 2.5 V to 5.5 V; all specifications T
MIN
to T
MAX
, unless otherwise noted.
Table 3.
Parameter
2
Limit at T
MIN
,
T
MAX,
B Version Unit Test Conditions/Comments
f
SCL
400 kHz max SCL clock frequency
t
1
2.5 μs min SCL cycle time
t
2
0.6 μs min t
HIGH
, SCL high time
t
3
1.3 μs min t
LOW
, SCL low time
t
4
0.6 μs min t
HD,STA
, start/repeated start condition hold time
t
5
100 ns min t
SU,DAT,
data setup time
t
6
3
0.9 μs max t
HD,DAT
, data hold time
0 μs min
t
7
0.6 μs min t
SU,STA
, setup time for repeated start
t
8
0.6 μs min t
SU,STO
, stop condition setup time
t
9
1.3 μs min t
BUF
, bus free time between a stop condition and a start condition
t
10
300 ns max t
R
, rise time of both SCL and SDA when receiving
4
0 ns min May be CMOS driven
t
11
250 ns max t
F
, fall time of SDA when receiving
4
300 ns max t
F
, fall time of both SCL and SDA when transmitting
4
20 + 0.1C
b
5
ns min
C
b
400 pF max Capacitive load for each bus line
1
See Figure 2.
2
Guaranteed by design and characterization, not production tested.
3
A master device must provide a hold time of at least 300 ns for the SDA signal (refer to the V
IH MIN
of the SCL signal) in order to bridge the undefined region of the
falling edge of the SCL.
4
t
R
and t
F
measured between 0.3 V
DD
and 0.7 V
DD
.
5
C
b
is the total capacitance of one bus line in picofarads.
START
CONDITION
REPEATED
START
CONDITION
STOP
CONDITION
SDA
SCL
t
9
t
3
t
10
t
4
t
6
t
5
t
2
t
11
t
7
t
4
t
1
t
8
00927-002
Figure 2. 2-Wire Serial Interface Timing Diagram
AD5301/AD5311/AD5321 Data Sheet
Rev. C | Page 6 of 24
ABSOLUTE MAXIMUM RATINGS
T
A
= 25°C, unless otherwise noted.
1
Table 4.
Parameter Rating
V
DD
to GND −0.3 V to +7 V
SCL, SDA to GND −0.3 V to V
DD
+ 0.3 V
PD, A1, A0 to GND
−0.3 V to V
DD
+ 0.3 V
V
OUT
to GND −0.3 V to V
DD
+ 0.3 V
Operating Temperature Range
Industrial (B Version) −40°C to +105°C
Storage Temperature Range −65°C to +150°C
Junction Temperature (T
J
max) 150°C
SOT-23 Package
Power Dissipation (T
J
max − T
A
)/θ
JA
θ
JA
Thermal Impedance 229.6°C/W
MSOP Package
Power Dissipation (T
J
max – T
A
)/θ
JA
θ
JA
Thermal Impedance 206°C/W
Lead Temperature JEDEC Industry Standard
Soldering J-STD-020
1
Transient currents of up to 100 mA do not cause SCR latch-up.
Stresses at or above those listed under Absolute Maximum
Ratings may cause permanent damage to the product. This is a
stress rating only; functional operation of the product at these
or any other conditions above those indicated in the operational
section of this specification is not implied. Operation beyond
the maximum operating conditions for extended periods may
affect product reliability.
ESD CAUTION

AD5311BRMZ-REEL7

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Digital to Analog Converters - DAC 12C 10-BIT VOUT IC 7uS
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