4Mb
SMART 3 BOOT BLOCK FLASH MEMORY
09005aef8114a789 Micron Technology, Inc., reserves the right to change products or specifications without notice.
F45.fm - Rev. E 6/04 EN
19 ©2003 Micron Technology, Inc. All rights reserved.
NOTE:
1. Vcc = MAX Vcc during ICC tests.
2. ICC is dependent on cycle rates.
3. I
CC is dependent on output loading. Specified values are obtained with the outputs open.
Table 10: Capacitance
(T
A
= 25°C; f = 1 MHz)
PARAMETER/CONDITION SYMBOL MAX UNITS NOTES
Input Capacitance
C
I 9pF
Output Capacitance
C
O 12 pF
Table 11: READ and STANDBY Current Drain
1
Commercial Temperature (0°C T
A
+70°C) and Extended Temperature (-40°C T
A
+85°C)
PARAMETER/CONDITION SYMBOL MAX UNITS NOTES
READ CURRENT: WORD-WIDE, CMOS INPUT LEVELS
(CE# 0.2V; OE# V
CC - 0.2V; f = 5 MHz;
Other inputs 0.2V or VCC - 0.2V; RP# VCC - 0.2V)
I
CC115mA2, 3
READ CURRENT: BYTE-WIDE, CMOS INPUT LEVELS
(CE# 0.2V; OE#
VCC - 0.2V; f = 5 MHz;
Other inputs 0.2V or VCC - 0.2V; RP# = VCC - 0.2V)
I
CC215mA2, 3
STANDBY CURRENT: TTL INPUT LEVELS
VCC power supply standby current
(CE# = RP# = VIH; Other inputs = VIL or VIH)
I
CC32mA
STANDBY CURRENT: CMOS INPUT LEVELS
VCC power supply standby current
(CE# = RP# =
VCC - 0.2V)
I
CC4100 µA
DEEP POWER-DOWN CURRENT:
VCC SUPPLY (RP# = VSS ±0.2V)
I
CC620 µA
STANDBY OR READ CURRENT:
VPP SUPPLY (VPP 5.5V)
I
PP15 µA
DEEP POWER-DOWN CURRENT:
VPP SUPPLY (RP# = VSS ±0.2V)
I
PP25 µA
4Mb
SMART 3 BOOT BLOCK FLASH MEMORY
09005aef8114a789 Micron Technology, Inc., reserves the right to change products or specifications without notice.
F45.fm - Rev. E 6/04 EN
20 ©2003 Micron Technology, Inc. All rights reserved.
NOTE:
1. Measurements tested under AC Test Conditions.
2. OE# may be delayed by
t
ACE minus
t
AOE after CE# falls before
t
ACE is affected.
AC Test Conditions
Input pulse levels. . . . . . . . . . . . . . . . . . . . . . . . . . 0V to 3V
Input rise and fall times . . . . . . . . . . . . . . . . . . . . . . .<10ns
Input timing reference level . . . . . . . . . . . . . . . . . . . . 1.5V
Output timing reference level. . . . . . . . . . . . . . . . . . . 1.5V
Output load. . . . . . . . . . . . . . . . 1TTL gate and CL = 50pF
Table 12: READ Timing Parameters Electrical Characteristics and Recommended
AC Operating Conditions
1
Commercial Temperature (0°C T
A
+70°C) and Extended Temperature (-40°C T
A
+85°C); Vcc = +3.3V ±0.3V
AC CHARACTERISTICS
SYMBOL
-8/-8 ET
UNITS NOTESPARAMETER MIN MAX
READ cycle time
t
RC
80 ns
Access time from CE#
t
ACE
80 ns 2
Access time from OE#
t
AOE
40 ns 2
Access time from address
t
AA
80 ns
RP# HIGH to output valid delay
t
RWH
1,000 ns
OE# or CE# HIGH to output in High-Z
t
OD
25 ns
Output hold time from OE#, CE# or address change
t
OH
0ns
RP# LOW pulse width
t
RP
150 ns
4Mb
SMART 3 BOOT BLOCK FLASH MEMORY
09005aef8114a789 Micron Technology, Inc., reserves the right to change products or specifications without notice.
F45.fm - Rev. E 6/04 EN
21 ©2003 Micron Technology, Inc. All rights reserved.
Figure 10: Word-Wide READ Cycle
1
Timing Parameters
Commercial Temperature (0ºC T
A
+70ºC)
Extended Temperature (-40ºC T
A
+85ºC)
NOTE:
1. BYTE# = HIGH (MT28F400B3 only).
VALID DATA
VALID ADDRESS
CE#
A0–A17/(A18)
OE#
DQ0–DQ15
t
RC
t
ACE
t
AOE
t
OD
t
OH
t
AA
WE#
RP#
V
IH
V
IL
V
IH
V
IL
V
IH
V
IL
V
IH
V
IL
V
IH
V
IL
V
IH
VIL
t
RWH
DON
UND
SYMBOL
-8/-8 ET
UNITSMIN MAX
t
RC
80 ns
t
ACE
80 ns
t
AOE
40 ns
t
AA
80 ns
t
RWH
1,000 ns
t
OD
25 ns
t
OH
0ns
SYMBOL
-8/-8 ET
UNITSMIN MAX

MT28F400B3SG-8 T

Mfr. #:
Manufacturer:
Micron
Description:
IC FLASH 4M PARALLEL 44SOP
Lifecycle:
New from this manufacturer.
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