74LVC169 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2012. All rights reserved.
Product data sheet Rev. 6 — 29 November 2012 13 of 24
NXP Semiconductors
74LVC169
Presettable synchronous 4-bit up/down binary counter
Measurement points are given in Table 8.
Logic levels: V
OL
and V
OH
are the typical output voltage levels that occur with the output load.
Fig 9. Input (CET) to output (TC) propagation delays
001aaa652
CET
TC
t
PHL
t
PLH
GND
V
I
V
M
V
OH
V
OL
V
M
V
I
Measurement points are given in Table 8.
Logic levels: V
OL
and V
OH
are the typical output voltage levels that occur with the output load.
Fig 10. The up/down control input (U/D) to output (TC) propagation delays
001aaa653
U/D
TC
t
PHL
t
PLH
GND
V
I
V
M
V
OH
V
OL
V
M
V
I
74LVC169 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2012. All rights reserved.
Product data sheet Rev. 6 — 29 November 2012 14 of 24
NXP Semiconductors
74LVC169
Presettable synchronous 4-bit up/down binary counter
The shaded areas indicate when the input is permitted to change for predictable output performance.
Measurement points are given in Table 8
.
Logic levels: V
OL
and V
OH
are the typical output voltage levels that occur with the output load.
Fig 11. Set-up and hold times for the input (Dn) and parallel enable input (PE)
001aaa654
GND
GND
GND
t
h
t
h
t
su
t
su
t
su
t
h
t
h
t
su
V
M
V
M
V
M
V
I
V
I
CP input
PE input
Dn input
V
I
The shaded areas indicate when the input is permitted to change for predictable output performance.
Measurement points are given in Table 8
.
Logic levels: V
OL
and V
OH
are the typical output voltage levels that occur with the output load.
Fig 12. Set-up and hold times for count enable inputs (CEP and CET) and control input (U/D)
001aaa655
t
h
t
su
t
h
t
su
GND
V
I
V
M
V
M
GND
V
I
CP input
CEP, CET, U/D input
Table 8. Measurement points
Supply voltage Input Output
V
CC
V
I
V
M
V
M
1.2 V V
CC
0.5 V
CC
0.5 V
CC
1.65 V to 1.95 V V
CC
0.5 V
CC
0.5 V
CC
2.3 V to 2.7 V V
CC
0.5 V
CC
0.5 V
CC
2.7 V 2.7 V 1.5 V 1.5 V
3.0 V to 3.6 V 2.7 V 1.5 V 1.5 V
74LVC169 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2012. All rights reserved.
Product data sheet Rev. 6 — 29 November 2012 15 of 24
NXP Semiconductors
74LVC169
Presettable synchronous 4-bit up/down binary counter
[1] The circuit performs better when R
L
= 1000 k.
Test data is given in Table 9
.
Definitions for test circuit:
R
L
= Load resistance.
C
L
= Load capacitance including jig and probe capacitance.
R
T
= Termination resistance should be equal to output impedance Z
o
of the pulse generator.
V
EXT
= External voltage for measuring switching times.
Fig 13. Test circuit for measuring switching times
V
M
V
M
t
W
t
W
10 %
90 %
0 V
V
I
V
I
negative
pulse
positive
pulse
0 V
V
M
V
M
90 %
10 %
t
f
t
r
t
r
t
f
001aae331
V
EXT
V
CC
V
I
V
O
DUT
C
L
R
T
R
L
R
L
G
Table 9. Test data
Supply voltage Input Load S1 position
V
CC
V
I
t
r
, t
f
C
L
R
L
t
PLH
, t
PHL
1.2 V V
CC
2 ns 30 pF 1 k
[1]
open
1.65 V to 1.95 V V
CC
2 ns 30 pF 1 k
[1]
open
2.3 V to 2.7 V V
CC
2 ns 30 pF 500 open
2.7V 2.7V 2.5ns 50pF 500 open
3.0Vto3.6V 2.7V 2.5ns 50pF 500 open

74LVC169DB,118

Mfr. #:
Manufacturer:
NXP Semiconductors
Description:
Counter ICs 3.3V SYNC 4-BIT BIN
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
T/T Paypal Visa MoneyGram Western Union