PDF: 09005aef80e5e752/Source: 09005aef80e5e626 Micron Technology, Inc., reserves the right to change products or specifications without notice.
HTF18C64_128_256x72.fm - Rev. E 3/07 EN
7 ©2003 Micron Technology, Inc. All rights reserved.
512MB, 1GB, 2GB (x72, ECC, SR) 240-Pin DDR2 SDRAM RDIMM
Electrical Specifications
Electrical Specifications
Stresses greater than those listed in Table 8 may cause permanent damage to the
module. This is a stress rating only, and functional operation of the module at these or
any other conditions above those indicated in the operational sections of this specifica-
tion is not implied. Exposure to absolute maximum rating conditions for extended
periods may affect reliability.
Notes: 1. The refresh rate is required to double when 85°C < TC 95°C.
2. For further information, refer to technical note TN-00-08: Thermal Applications, available
on Micron’s Web site.
Input Capacitance
Micron encourages designers to simulate the performance of the module to achieve
optimum values. Simulations are significantly more accurate and realistic than a gross
estimation of module capacitance when inductance and delay parameters associated
with trace lengths are used in simulations. JEDEC modules are currently designed using
simulations to close timing budgets.
Component AC Timing and Operating Conditions
Recommended AC operating conditions are given in the DDR2 component data sheets.
Component specifications are available on Microns Web site. Module speed grades
correlate with component speed grades as shown in Table 9.
Table 8: Absolute Maximum Ratings
Symbol Parameter Min Max Units
V
DD/VDDQ
VDD supply voltage relative to VSS
–0.5 +2.3 V
V
IN, VOUT
Voltage on any pin relative to VSS
–0.5 +2.3 V
I
I
Input leakage current; Any input 0V VIN VDD;
V
REF input 0V VIN 0.95V; (All other pins not under
test = 0V)
Command/address,
RAS#, CAS#, WE#, S#,
CKE, ODT, BA
–5 +5
µA
CK, CK#
–250 +250
I
OZ
Output leakage current; 0V VOUT VDDQ; DQs and
ODT are disabled
DQ, DQS, DQS#
–5 +5 µA
I
VREF
VREF leakage current; VREF = Valid VREF level
–36 +36 µA
T
A
Module ambient operating temperature Commercial
0+70
°C
Industrial
–40 +85
°C
T
C
1
DDR2 SDRAM component case operating
temperature
2
Commercial
0+85
°C
Industrial –40 +85
°C
Table 9: Module and Component Speed Grades
Module Speed Grade Component Speed Grade
-80E -25E
-800 -25
-667 -3
-53E -37E
-40E -5E
PDF: 09005aef80e5e752/Source: 09005aef80e5e626 Micron Technology, Inc., reserves the right to change products or specifications without notice.
HTF18C64_128_256x72.fm - Rev. E 3/07 EN
8 ©2003 Micron Technology, Inc. All rights reserved.
512MB, 1GB, 2GB (x72, ECC, SR) 240-Pin DDR2 SDRAM RDIMM
I
DD
Specifications
IDD Specifications
Table 10: DDR2 IDD Specifications and Conditions – 512MB
Values shown for MT47H64M4 DDR2 SDRAM only and are computed from values specified in the
256Mb (64 Meg x 4) component data sheet
Parameter/Condition Symbol -53E -40E Units
Operating one bank active-precharge current:
t
CK =
t
CK (IDD),
t
RC =
t
RC (IDD),
t
RAS =
t
RAS MIN (IDD); CKE is HIGH, S# is HIGH between valid
commands; Address bus inputs are switching; Data bus inputs are switching
IDD0 1,440 1,350 mA
Operating one bank active-read-precharge current: I
OUT = 0mA; BL = 4,
CL = CL (IDD), AL = 0;
t
CK =
t
CK (IDD),
t
RC =
t
RC (IDD),
t
RAS =
t
RAS MIN (IDD),
t
RCD =
t
RCD (IDD); CKE is HIGH, S# is HIGH between valid commands; Address
bus inputs are switching; Data pattern is same as I
DD4W
I
DD1 1,620 1,530 mA
Precharge power-down current: All device banks idle;
t
CK =
t
CK (IDD); CKE is
LOW; Other control and address bus inputs are stable; Data bus inputs are
floating
I
DD2P 90 90 mA
Precharge quiet standby current: All device banks idle;
t
CK =
t
CK (IDD); CKE
is HIGH, S# is HIGH; Other control and address bus inputs are stable; Data bus
inputs are floating
IDD2Q 630 450 mA
Precharge standby current: All device banks idle;
t
CK =
t
CK (IDD); CKE is
HIGH, S# is HIGH; Other control and address bus inputs are switching; Data bus
inputs are switching
IDD2N 630 540 mA
Active power-down current: All device banks open;
t
CK =
t
CK (IDD); CKE is LOW; Other control and address bus
inputs are stable; Data bus inputs are floating
Fast PDN exit
MR[12] = 0
I
DD3P 450 360 mA
Slow PDN exit
MR[12] = 1
108 108 mA
Active standby current: All device banks open;
t
CK =
t
CK (IDD),
t
RAS =
t
RAS MAX (IDD),
t
RP =
t
RP (IDD); CKE is HIGH, S# is HIGH between valid
commands; Other control and address bus inputs are switching; Data bus inputs
are switching
I
DD3N 720 540 mA
Operating burst write current: All device banks open; Continuous burst
writes; BL = 4, CL = CL (IDD), AL = 0;
t
CK =
t
CK (IDD),
t
RAS =
t
RAS MAX (IDD),
t
RP =
t
RP (IDD); CKE is HIGH, S# is HIGH between valid commands; Address bus
inputs are switching; Data bus inputs are switching
I
DD4W 2,880 2,250 mA
Operating burst read current: All device banks open; Continuous burst
reads; IOUT = 0mA; BL = 4, CL = CL (IDD), AL = 0;
t
CK =
t
CK (IDD),
t
RAS =
t
RAS MAX
(I
DD),
t
RP =
t
RP (IDD); CKE is HIGH, S# is HIGH between valid commands; Address
bus inputs are switching; Data bus inputs are switching
I
DD4R 2,700 2,070 mA
Burst refresh current:
t
CK =
t
CK (IDD); REFRESH command at every
t
RFC (IDD)
interval; CKE is HIGH, S# is HIGH between valid commands; Other control and
address bus inputs are switching; Data bus inputs are switching
I
DD5 3,060 2,970 mA
Self refresh current: CK and CK# at 0V; CKE 0.2V; Other control and address
bus inputs are floating; Data bus inputs are floating
I
DD690 90mA
Operating bank interleave read current: All device banks interleaving
reads; I
OUT = 0mA; BL = 4, CL = CL (IDD), AL =
t
RCD (IDD) - 1 x
t
CK (IDD);
t
CK =
t
CK (IDD),
t
RC =
t
RC (IDD),
t
RRD =
t
RRD (IDD),
t
RCD =
t
RCD (IDD); CKE is
HIGH, S# is HIGH between valid commands; Address bus inputs are stable
during deselects; Data bus inputs are switching
I
DD7 4,320 4,140 mA
PDF: 09005aef80e5e752/Source: 09005aef80e5e626 Micron Technology, Inc., reserves the right to change products or specifications without notice.
HTF18C64_128_256x72.fm - Rev. E 3/07 EN
9 ©2003 Micron Technology, Inc. All rights reserved.
512MB, 1GB, 2GB (x72, ECC, SR) 240-Pin DDR2 SDRAM RDIMM
I
DD
Specifications
Table 11: DDR2 IDD Specifications and Conditions – 1GB
Values shown for MT47H128M4 DDR2 SDRAM only and are computed from values specified in the
512Mb (128 Meg x 4) component data sheet
Parameter/Condition Symbol
-80E/
-800
-667 -53E -40E Units
Operating one bank active-precharge current:
t
CK =
t
CK (IDD),
t
RC =
t
RC (IDD),
t
RAS =
t
RAS MIN (IDD); CKE is HIGH, S# is HIGH between valid
commands; Address bus inputs are switching; Data bus inputs are switching
IDD0 1,800 1,620 1,440 1,440 mA
Operating one bank active-read-precharge current: I
OUT = 0mA;
BL = 4, CL = CL (IDD), AL = 0;
t
CK =
t
CK (IDD),
t
RC =
t
RC (IDD),
t
RAS =
t
RAS MIN
(IDD),
t
RCD =
t
RCD (IDD); CKE is HIGH, S# is HIGH between valid commands;
Address bus inputs are switching; Data pattern is same as I
DD4W
I
DD1 2,070 1,890 1,710 1,620 mA
Precharge power-down current: All device banks idle;
t
CK =
t
CK (IDD);
CKE is LOW; Other control and address bus inputs are stable; Data bus
inputs are floating
I
DD2P 126 126 126 126 mA
Precharge quiet standby current: All device banks idle;
t
CK =
t
CK (IDD);
CKE is HIGH, S# is HIGH; Other control and address bus inputs are stable;
Data bus inputs are floating
IDD2Q 900 810 720 630 mA
Precharge standby current: All device banks idle;
t
CK =
t
CK (IDD); CKE is
HIGH, S# is HIGH; Other control and address bus inputs are switching; Data
bus inputs are switching
IDD2N 990 900 810 720 mA
Active power-down current: All device banks open;
t
CK =
t
CK (IDD); CKE is LOW; Other control and address bus
inputs are stable; Data bus inputs are floating
Fast PDN exit
MR[12] = 0
I
DD3P 720 630 540 450 mA
Slow PDN exit
MR[12] = 1
216 216 216 216 mA
Active standby current: All device banks open;
t
CK =
t
CK (IDD),
t
RAS =
t
RAS MAX (IDD),
t
RP =
t
RP (IDD); CKE is HIGH, S# is HIGH between valid
commands; Other control and address bus inputs are switching; Data bus
inputs are switching
I
DD3N 1,260 1,170 990 810 mA
Operating burst write current: All device banks open; Continuous burst
writes; BL = 4, CL = CL (IDD), AL = 0;
t
CK =
t
CK (IDD),
t
RAS =
t
RAS MAX (IDD),
t
RP =
t
RP (IDD); CKE is HIGH, S# is HIGH between valid commands; Address
bus inputs are switching; Data bus inputs are switching
I
DD4W 3,510 3,060 2,520 2,070 mA
Operating burst read current: All device banks open; Continuous burst
reads; IOUT = 0mA; BL = 4, CL = CL (IDD), AL = 0;
t
CK =
t
CK (IDD),
t
RAS =
t
RAS MAX (IDD),
t
RP =
t
RP (IDD); CKE is HIGH, S# is HIGH between
valid commands; Address bus inputs are switching; Data bus inputs are
switching
I
DD4R 3,690 3,240 2,610 2,070 mA
Burst refresh current:
t
CK =
t
CK (IDD); REFRESH command at every
t
RFC (IDD) interval; CKE is HIGH, S# is HIGH between valid commands; Other
control and address bus inputs are switching; Data bus inputs are switching
I
DD5 4,140 3,240 3,060 2,970 mA
Self refresh current: CK and CK# at 0V; CKE 0.2V; Other control and
address bus inputs are floating; Data bus inputs are floating
I
DD6 126 126 126 126 mA
Operating bank interleave read current: All device banks interleaving
reads; I
OUT = 0mA; BL = 4, CL = CL (IDD), AL =
t
RCD (IDD) - 1 x
t
CK (IDD);
t
CK =
t
CK (IDD),
t
RC =
t
RC (IDD),
t
RRD =
t
RRD (IDD),
t
RCD =
t
RCD (IDD); CKE is
HIGH, S# is HIGH between valid commands; Address bus inputs are stable
during deselects; Data bus inputs are switching
I
DD7 5,400 4,320 4,050 3,960 mA

MT18HTF6472Y-53EB2

Mfr. #:
Manufacturer:
Micron
Description:
MODULE DDR2 SDRAM 512MB 240RDIMM
Lifecycle:
New from this manufacturer.
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