9DB433
FOUR OUTPUT DIFFERENTIAL BUFFER FOR PCIE GEN1,2,3
IDT®
FOUR OUTPUT DIFFERENTIAL BUFFER FOR PCIE GEN1,2,3 4
9DB433 REV H 06/07/16
Absolute Maximum Ratings
Stresses above the ratings listed below can cause permanent damage to the 9DB433. These ratings, which are standard
values for IDT commercially rated parts, are stress ratings only. Functional operation of the device at these or any other
conditions above those indicated in the operational sections of the specifications is not implied. Exposure to absolute
maximum rating conditions for extended periods can affect product reliability. Electrical parameters are guaranteed only over
the recommended operating temperature range.
Electrical Characteristics–DIF 0.7V Current Mode Differential Outputs
PARAMETER SYMBOL CONDITIONS
MIN TYP MAX
UNITS NOTES
3.3V Core Supply Voltage VDDA/R 4.6 V 1,2
3.3V Logic Supply Voltage VDD 4.6 V
1,2
IL
GND-0.5 V 1
Input High Voltage V
IH
Except for SMBus interface V
DD
+0.5V V 1
Input High Voltage V
IHSMB
SMBus clock and data pins 5.5V V 1
Storage Temperature Ts -65 150
°
C
1
Junction Temperature Tj 125 °C
1
Input ESD protection
ESD prot Human Body Model 2000 V 1
1
Guaranteed by design and characterization, not 100% tested in production.
2
Operation under these conditions is neither implied nor
uaranteed.
T
A
= T
COM
or T
IND;
Supply Voltage VDD = 3.3 V +/-5%
PARAMETER SYMBOL CONDITIONS MIN TYP MAX UNITS NOTES
Slew rate Trf Scope avera
in
on 1.5 2.8 4
1, 2, 3
Slew rate matching
∆
Trf Slew rate matching, Scope averaging on 8 20
%
1, 2, 4
Voltage High VHigh 660 797 850 1
Voltage Low VLow -150 14 150 1
Max Voltage Vmax 813 1150 1
Min Voltage Vmin -300 -1 1
Vswing Vswing Scope averaging off (Differential) 300 1596.9 mV 1, 2
Crossing Voltage (abs) Vcross_abs Scope averaging off 250 378 550 mV 1, 5
Crossing Voltage (var)
∆
-Vcross Scope averaging off 16 140 mV 1, 6
2
Measured from differential waveform
6
The total variation of all Vcross measurements in any particular system. Note that this is a subset of V_cross_min/max (V_cross
absolute) allowed. The intent is to limit Vcross induced modulation by setting V_cross_delta to be smaller than V_cross absolute.
mV
Statistical measurement on single-ended signal
using oscilloscope math function. (Scope
averaging on)
Measurement on single ended signal using
absolute value. (Scope averaging off)
mV
1
Guaranteed by design and characterization, not 100% tested in production. IREF = VDD/(3xR
R
). For R
R
= 475
Ω
(1%), I
REF
= 2.32mA.
I
OH
= 6 x I
REF
and V
OH
= 0.7V @ Z
O
=50
Ω
(100
Ω
differential impedance).
3
Slew rate is measured through the Vswing voltage range centered around differential 0V. This results in a +/-150mV window around
differential 0V.
4
Matching applies to rising edge rate for Clock and falling edge rate for Clock#. It is measured using a +/-75mV window centered on
the average cross point where Clock rising meets Clock# falling. The median cross point is used to calculate the voltage thresholds the
oscilloscope is to use for the edge rate calculations.
5
Vcross is defined as voltage where Clock = Clock# measured on a component test board and only applies to the differential rising
edge (i.e. Clock rising and Clock# falling).
