AR
C
HIVE INF
O
RMATI
O
N
ARCHIVE INFORMATION
4
RF Device Data
Freescale Semiconductor
MMG3010NT1
50 OHM TYPICAL CHARACTERISTICS
5
20
0
T
C
= 85°C
f, FREQUENCY (GHz)
Figure 2. Small-Signal Gain (S21) versus
Frequency
15
10
1234
G
p
, SMALL−SIGNAL GAIN (dB)
25°C
-40°C
4
−40
0
0
S22
f, FREQUENCY (GHz)
Figure 3. Input/Output Return Loss versus
Frequency
V
CC
= 5 Vdc
I
CC
= 54 mA
S11
−10
−20
−30
123
S11, S22 (dB)
16
10
17
8
P
out
, OUTPUT POWER (dBm)
Figure 4. Small-Signal Gain versus Output
Power
V
CC
= 5 Vdc
I
CC
= 54 mA
16
15
14
13
12
9
11
3.532.521.510.5
12
19
18
17
15
13
V
CC
= 5 Vdc
I
CC
= 54 mA
f, FREQUENCY (GHz)
Figure 5. P1dB versus Frequency
P1dB, 1 dB COMPRESSION POINT (dBm)
16
14
5.4
0
100
4
V
CC
, COLLECTOR VOLTAGE (V)
Figure 6. Collector Current versus Collector
Voltage
60
40
10
4.2 5 5.2
I
CC
, COLLECTOR CURRENT (mA)
20
4.4 4.6 4.8
4
21
36
0
f, FREQUENCY (GHz)
Figure 7. Third Order Output Intercept Point
versus Frequency
33
30
27
24
123
V
CC
= 5 Vdc
I
CC
= 54 mA
1 MHz Tone Spacing
IP3, THIRD ORDER OUTPUT INTERCEPT POINT (dBm)
1311
G
p
, SMALL−SIGNAL GAIN (dB)
V
CC
= 5 Vdc
900 MHz
2140 MHz
1960 MHz
2600 MHz
3500 MHz
70
50
30
10 12 14 15
90
80
AR
C
HIVE INF
O
RMATI
O
N
ARCHIVE INFORMATION
MMG3010NT1
5
RF Device Data
Freescale Semiconductor
50 OHM TYPICAL CHARACTERISTICS
21
36
4.9
V
CC
, COLLECTOR VOLTAGE (V)
Figure 8. Third Order Output Intercept Point
versus Collector Voltage
33
30
27
24
IP3, THIRD ORDER OUTPUT INTERCEPT POINT (dBm)
4.95 5 5.15.05
f = 900 MHz
1 MHz Tone Spacing
100−40 −20 0 20 40 60 80
26
33
T, TEMPERATURE (_C)
Figure 9. Third Order Output Intercept Point
versus Case Temperature
31
30
29
28
IP3, THIRD ORDER OUTPUT INTERCEPT POINT (dBm)
27
Figure 10. Third Order Intermodulation versus
Output Power
P
out
, OUTPUT POWER (dBm)
IMD, THIRD ORDER
INTERMODULATION DISTORTION (dBc)
−3 0 3
6
9
−80
−30
−50
−60
−70
V
CC
= 5 Vdc
I
CC
= 54 mA
f = 900 MHz
1 MHz Tone Spacing
−40
150
10
3
10
5
120
Figure 11. MTTF versus Junction Temperature
10
4
125 130 135 140 145
T
J
, JUNCTION TEMPERATURE (°C)
NOTE: The MTTF is calculated with V
CC
= 5 Vdc, I
CC
= 54 mA
MTTF (YEARS)
4
0
8
0
f, FREQUENCY (GHz)
Figure 12. Noise Figure versus Frequency
V
CC
= 5 Vdc
I
CC
= 54 mA
6
4
2
123
NF, NOISE FIGURE (dB)
−70
−20
−3
P
out
, OUTPUT POWER (dBm)
Figure 13. Single-Carrier W-CDMA Adjacent
Channel Power Ratio versus Output Power
−30
−40
−50
−60
960
ACPR, ADJACENT CHANNEL POWER RATIO (dBc)
15
32
3
V
CC
= 5 Vdc
f = 900 MHz
1 MHz Tone Spacing
V
CC
= 5 Vdc, I
CC
= 54 mA, f = 2140 MHz
Single−Carrier W−CDMA, 3.84 MHz Channel Bandwidth
Input Signal PAR = 8.5 dB @ 0.01% Probability (CCDF)
1512
12
AR
C
HIVE INF
O
RMATI
O
N
ARCHIVE INFORMATION
6
RF Device Data
Freescale Semiconductor
MMG3010NT1
50 OHM APPLICATION CIRCUIT: 40-300 MHz
Figure 14. 50 Ohm Test Circuit Schematic
RF
OUTPUT
RF
INPUT
V
SUPPLY
C3 C4
Z1 Z2
C1
Z5
C2
R1
L1
V
CC
Z4Z3
DUT
Figure 15. S21, S11 and S22 versus Frequency
−40
20
0
f, FREQUENCY (MHz)
V
CC
= 5 Vdc
I
CC
= 54 mA
S22
200 300 400 500
10
0
−10
−20
−30
Figure 16. 50 Ohm Test Circuit Component Layout
C1
L1
C2
R1
C4
C3
Z1, Z5 0.347 x 0.058Microstrip
Z2 0.575 x 0.058Microstrip
Z3 0.172 x 0.058Microstrip
Z4 0.403 x 0.058Microstrip
PCB Getek Grade ML200C, 0.031, ε
r
= 4.1
S21, S11, S22 (dB)
S21
S11
100
MMG30XX
Rev 2
Table 8. 50 Ohm Test Circuit Component Designations and Values
Part Description Part Number Manufacturer
C1, C2, C3 0.01 µF Chip Capacitors C0603C103J5RAC Kemet
C4 1000 pF Chip Capacitor C0603C102J5RAC Kemet
L1 470 nH Chip Inductor BK2125HM471-T Taiyo Yuden
R1
0 W Chip Resistor
ERJ3GEY0R00V Panasonic

MMG3010NT1

Mfr. #:
Manufacturer:
NXP Semiconductors
Description:
IC AMP CELLULAR 0HZ-6GHZ SOT89-4
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
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