LONG-TERM V
OS
STABILITY
2,
3
V
OS
/Time 0.2 1.0 0.4 2.0 µV/M
O
INPUT OFFSET CURRENT I
OS
7 35 12 75 nA
INPUT BIAS CURRENT I
B
±10 ±40 ±15 ±80 nA
INPUT NOISE VOLTAGE
3, 4
e
n p-p
0.1 Hz to 10 Hz 0.08 0.18 0.09 0.25 µV p-p
INPUT NOISE e
n
f
O
= 10 Hz 3.5 5.5 3.8 8.0 nV/√Hz
Voltage Density
3
f
O
= 30 Hz 3.1 4.5 3.3 5.6 nV/√Hz
f
O
= 1000 Hz 3.0 3.8 3.2 4.5 nV/√Hz
INPUT NOISE i
n
f
O
= 10 Hz 1.7 4.0 1.7 pA/√Hz
Current Density
3
f
O
= 30 Hz 1.0 2.3 1.0 pA/√Hz
f
O
= 1000 Hz 0.4 0.6 0.4 0.6 pA/√Hz
INPUT RESISTANCE
Differential Mode
5
R
IN
1.3 6 0.7 4 MΩ
Common Mode R
INCM
3 2 GΩ
INPUT VOLTAGE RANGE IVR ±11.0 ±12.3 ±11.0 ±12.3 V
COMMON-MODE REJECTION RATIO CMRR V
CM
= ±11 V 114 126 100 120 dB
POWER SUPPLY REJECTION RATIO PSRR V
S
= ±4 V to ±18 V 1 10 2 20 µV/V
LARGE SIGNAL VOLTAGE GAIN A
VO
R
L
≥ 2 kΩ, V
O
= ±10 V 1000 1800 700 1500 V/mV
R
L
≥ 600 Ω, V
O
= ±10 V 800 1500 600 1500 V/mV
OUTPUT VOLTAGE SWING V
O
R
L
≥ 2 kΩ ±12.0 ±13.8 ±11.5 ±13.5 V
R
L
≥ 600 Ω ±10.0 ±11.5 ±10.0 ±11.5 V
SLEW RATE
6
SR R
L
≥ 2 kΩ 1.7 2.8 1.7 2.8 V/µs
GAIN BANDWIDTH PRODUCT
6
GBW 5.0 8.0 5.0 8.0 MHz
OPEN-LOOP OUTPUT RESISTANCE R
O
V
O
= 0, I
O
= 0 70 70 Ω
POWER CONSUMPTION P
d
V
O
90 140 100 170 mW
OFFSET ADJUSTMENT RANGE R
P
= 10 kΩ ±4.0 ±4.0 mV
1
Input offset voltage measurements are performed approximately 0.5 seconds after application of power. A/E grades guaranteed fully warmed up.
2
Long-term input offset voltage stability refers to the average trend line of V
OS
vs. time over extended periods after the first 30 days of operation. Excluding the initial
hour of operation, changes in V
OS
during the first 30 days are typically 2.5 µV. Refer to the Typical Performance Characteristics section.
3
Sample tested.
4
See voltage noise test circuit (Figure 31).
5
Guaranteed by input bias current.
6
Guaranteed by design.
