8-O/P 1.8V PCIE GEN 1-2-3 CLOCK GENERATOR W/ZO=100OHMS 8 OCTOBER 18, 2016
9FGV0841 DATASHEET
Electrical Characteristics–DIF Low Power HCSL Outputs
Electrical Characteristics–Differential Output Phase Jitter Parameters
TA = T
AMB;
Supply Voltages per normal operation conditions, See Test Loads for Loading Conditions
PARAMETER SYMBOL CONDITIONS MIN TYP MAX UNITS NOTES
Scope avera
in
on fast settin
1.6 2.3 3.5
1,2,3
Scope averaging on slow setting 1.3 1.9 2.9
V/ns
1,2,3
Slew rate matchin
Δ
Trf Slew rate matchin
, Scope avera
in
on 7 20
1,2,4
Voltage High V
HIGH
660 784 850 7
Voltage Low V
LOW
-150 -33 150 7
Max Voltage Vmax 816 1150 7
Min Volta
e Vmin -300 -42 7
Vswin
Vswin
Scope avera
in
off 300 1634 mV 1,2,7
Crossing Voltage (abs) Vcross_abs Scope averaging off 250 427 550 mV 1,5,7
Crossing Voltage (var)
Δ
-Vcross Scope averaging off 12 140 mV 1,6,7
2
Measured from differential waveform
7
At default SMBus amplitude settin
s.
Measurement on single ended signal using
absolute value. (Scope avera
in
off)
mV
Slew rate Trf
Statistical measurement on single-ended signal
using oscilloscope math function. (Scope
averaging on)
mV
1
Guaranteed by design and characterization, not 100% tested in production.
3
Slew rate is measured through the Vswing voltage range centered around differential 0V. This results in a +/-150mV window around
differential 0V.
4
Matching applies to rising edge rate for Clock and falling edge rate for Clock#. It is measured using a +/-75mV window centered on the
average cross point where Clock rising meets Clock# falling. The median cross point is used to calculate the voltage thresholds the
oscilloscope is to use for the edge rate calculations.
5
Vcross is defined as voltage where Clock = Clock# measured on a component test board and only applies to the differential rising
edge (i.e. Clock rising and Clock# falling).
6
The total variation of all Vcross measurements in any particular system. Note that this is a subset of Vcross_min/max (Vcross
absolute) allowed. The intent is to limit Vcross induced modulation by setting
Δ
-Vcross to be smaller than Vcross absolute.
TA = T
AMB;
Supply Voltages per normal operation conditions, See Test Loads for Loading Conditions
PARAMETER SYMBOL CONDITIONS MIN TYP MAX
IND.
LIMIT
UNITS Notes
t
hPCIeG1
PCIe Gen 1 25 35 86 ps (p-p) 1,2,3
PCIe Gen 2 Lo Band
10kHz < f < 1.5MHz
0.9 1.2 3
ps
(rms)
1,2,3
PCIe Gen 2 High Band
1.5MHz < f < Nyquist (50MHz)
1.6 2.1
3.1
ps
(rms)
1,2,3
t
jphPCIeG3
PCIe Gen 3 Common Clock Architecture
(PLL BW of 2-4 or 2-5MHz, CDR = 10MHz)
(rms)
1,2,3
t
jphPCIeG3SRn
S
PCIe Gen 3 Separate Reference No Spread (SRnS)
(PLL BW of 2-4 or 2-5MHz, CDR = 10MHz)
0.4 0.5
0.7
ps
(rms)
1,2,3
1
Guaranteed by design and characterization, not 100% tested in production.
4
Applies to all differential outputs
Phase Jitter, PLL Mode
4
t
jphPCIeG2
2
See http://www.pcisig.com for complete specs
3
Sample size of at least 100K cycles. This figures extrapolates to 108ps pk-pk @ 1M cycles for a BER of 1-12.