MC100EPT21
http://onsemi.com
4
Table 5. LVTTL/LVCMOS OUTPUT DC CHARACTERISTICS V
CC
= 3.3 V, GND = 0.0 V, T
A
= −40°C to 85°C
Symbol Characteristic Condition Min Typ Max Unit
V
OH
Output HIGH Voltage I
OH
= −3.0 mA 2.4 V
V
OL
Output LOW Voltage I
OL
= 24 mA 0.5 V
I
CCH
Power Supply Current Outputs set to HIGH 5 17 25 mA
I
CCL
Power Supply Current Outputs set to LOW 8 21 30 mA
I
OS
Output Short Circuit Current −130 −80 mA
NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared
operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit
values are applied individually under normal operating conditions and not valid simultaneously.
Table 6. AC CHARACTERISTICS V
CC
= 3.0 V to 3.6 V, GND = 0.0 V (Note 5)
Symbol Characteristic
−40°C 25°C 85°C
Unit
Min Typ Max Min Typ Max Min Typ Max
f
max
Maximum Frequency
(Figure 2) 275 350 275 350 275 350
MHz
t
PLH
,
t
PHL
Propagation Delay to
Output Differential
800
1200
1400
1400
2050
1800
800
1200
1400
1400
2250
1800
900
1100
1600
1300
2950
1900
ps
t
SKEW
Duty Cycle Skew (Note 6) 45 50 55 45 50 55 45 50 55 %
t
SKPP
Part−to−Part Skew (Note 6) 500 500 500 ps
t
JITTER
Random Clock Jitter (RMS) 3.5 5 3.5 5 3.5 5 ps
V
PP
Input Voltage Swing
(Differential Configuration)
150 800 1200 150 800 1200 150 800 1200 mV
t
r
t
f
Output Rise/Fall Times
(0.8V − 2.0V) Q, Q 250 600 900 250 600 900 250 600 900
ps
NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared
operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit
values are applied individually under normal operating conditions and not valid simultaneously.
5. Measured with a 750 mV 50% duty−cycle clock source. R
L
= 500 W to GND and C
L
= 20 pF to GND. Refer to FIgure 3.
6. Skews are measured between outputs under identical transitions. Duty cycle skew is measured between differential outputs using the
deviations of the sum Tpw− and Tpw+.
