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LQM18NN68NM00D

P1-P3P4-P6P7-P8
Spec No. JELF243B-0003R-01 P.1/8
MURATA MFG.CO., LTD
Reference
Only
CHIP COIL (CHIP INDUCTORS) LQM18NN□□□□00D Reference Specification
1. Scope
This Reference specification applies to LQM18NN series, Chip coil (Chip Inductors).
2. Part Numbering
(ex) LQ M 18 N N 47N M 0 0 D
Product ID Structure Dimension Applications Category Inductance Tolerance Features Electrode Packaging
(L×W) and
D: Taping
Characteristics
*B: BULK
*Bulk packing (B) also available
3. Rating
・Operating Temperature Range – 40°C to + 85°C
・Storage Temperature Range – 55°C to
+125°C
Customer
Part Number
MURATA
Part Number
Inductance
Q
DC
Resistance
Self
Resonant
Frequency
Rated
Current
(nH) Tolerance (min.) (Ω max.) (MHz min.) (mA)
LQM18NN47NM00D 47
±20%
10
0.30 260
50
LQM18NN68NM00D 68 0.30 250
LQM18NN82NM00D 82 0.30 245
LQM18NNR10K00D 100
±10%
15
0.50 240
LQM18NNR12K00D 120 0.50 205
LQM18NNR15K00D 150 0.60 180
LQM18NNR18K00D 180 0.60 165
LQM18NNR22K00D 220 0.80 150
LQM18NNR27K00D 270 0.80 136
LQM18NNR33K00D 330 0.85 125
35
LQM18NNR39K00D 390 1.00 110
LQM18NNR47K00D 470 1.35 105
LQM18NNR56K00D 560 1.55 95
LQM18NNR68K00D 680 1.70 90
LQM18NNR82K00D 820 2.10 85
LQM18NN1R0K00D 1.0µH
35
0.60 75
25
LQM18NN1R2K00D 1.2µH 0.80 65
LQM18NN1R5K00D 1.5µH 0.80 60
LQM18NN1R8K00D 1.8µH 0.95 55
LQM18NN2R2K00D 2.2µH 1.15 50 15
4. Testing Conditions
《Unless otherwise specified》 《In case of doubt》
Temperature : Ordinary Temperature / 15°C to 35°C Temperature : 20°C ± 2°C
Humidity
: Ordinary Humidity / 25%(RH) to 85%(RH) Humidity : 60%(RH) to 70%(RH)
Atmospheric Pressure : 86kPa to 106kPa
5. Appearance and Dimensions
■Unit Mass (Typical value)
0.005g
(in mm)
Electrode
Ferrite
0.35±0.15
1.6±0.15
0.8±0.15
0.8±0.15
Spec No. JELF243B-0003R-01 P.2/8
MURATA MFG.CO., LTD
Reference
Only
6. Electrical Performance
No. Item Specification Test Method
6.1 Inductance
Inductance shall meet item 3. Measuring Equipment:
Agilent 4291A or equivalent
(1mA)
Measuring Frequency:
50MHz / 47nH
to 82nH
25MHz / 100nH to 820nH
10MHz / 1.0µH to 2.2µH
6.2 Q Q shall meet item 3.
6.3 DC
Resistance
DC Resistance shall meet item 3. Measuring Equipment: Digital multi meter
DC resistance shall be measured after
putting chip coil between the terminal 2
under the condition of opening between
a and b.
Every measurement the terminal 1 shall
be shorted between a and b when
changing chip coil.
6.4 Self Resonant
Frequency (S.R.F)
S.R.F shall meet item 3. Measuring Equipment:
Agilent 4291A or equivalent (1mA)
6.5 Rated Current Self temperature rise shall be
limited to 25°C max.
Inductance Change: within ±10%
The rated current is applied.
7. Mechanical Performance
No. Item Specification Test Method
7.1 Shear Test Chip coil shall not be damaged afte
r
tested as follows.
Applied Direction
Force: 10N
Hold Duration: 5s±1s
Applied Direction: Parallel to PCB
7.2 Bending Test Chip coil shall not be damaged afte
r
tested as follows.
Substrate: Glass-epoxy substrate
(100mm×40mm×1.6mm)
(in mm)
Speed of Applying Force: 1mm / s
Deflection: 2mm
Hold Duration: 30 s
7.3 Vibration Appearance: No damage
Inductance Change: within ±10%
Total Amplitude: 1.5mm
Testing Time:
A period of 2 h in each of 3 mutually
perpendicular directions.
Digital multi meter
(TR6846 or equivalent)
terminal2terminal1
SW
a
b
45
R340
F
Deflection
45
Product
Pressure jig
F
Chip Coil
Substrate
Spec No. JELF243B-0003R-01 P.3/8
MURATA MFG.CO., LTD
Reference
Only
No. Item Specification Test Method
7.4 Solderability The wetting area of the electrode
shall be at least 90% covered with
new solder coating.
Flux: Ethanol solution of rosin 25(wt)%
(Immersed for 5s to 10s)
Solder: Sn-3.0Ag-0.5Cu
Pre-Heating: 150°C±10°C / 60s to 90s
Solder Temperature: 240°C±5°C
Immersion Time: 3s±1s
7.5 Resistance to
Soldering Heat
Appearance: No damage
Inductance Change: within ±10%
Flux: Ethanol solution of rosin 25(wt)%
(Immersed for 5s to 10s)
Solder: Sn-3.0Ag-0.5Cu
Pre-Heating: 150°C±10°C / 60s to 90s
Solder Temperature: 270°C±5°C
Immersion Time: 10s±1s
Then measured after exposure in the room
condition for 24h±2h.
8. Environmental Performance
It shall be soldered on the substrate.
No. Item Specification Test Method
8.1 Heat Resistance Appearance: No damage
Inductance Change: within ±10%
Q Change: within ±20%
Temperature: 85°C±2°C
Time: 1000h (+48h, -0h)
Then measured after exposure in the room
condition for 48h±2h.
8.2 Cold Resistance Temperature: -40°C±2°C
Time: 1000h (+48h, -0h)
Then measured after exposure in the room
condition for 48h±2h.
8.3 Humidity Temperature: 40°C±2°C
Humidity: 90%(RH) to 95%(RH)
Time: 1000h (+48h, -0h)
Then measured after exposure in the room
condition for 48h±2h.
8.4 Temperature
Cycle
1 cycle:
1 step: -40°C±2°C / 30 min±3 min
2 step: Ordinary temp. / 10 min to 15 min
3 step: +85°C±2°C / 30 min to 3 min
4 step: Ordinary temp. / 10 min to15 min
Total of 10 cycles
Then measured after exposure in the room
condition for 48h±2h.
9. Specification of Packaging
9.1 Appearance and Dimensions of paper tape (8mm-wide)
(in mm)
φ
1.5±
Direction of feed
1.1 max.
1.85±0.2
8.0±0.3
3.5±0.05
0.1
0
4.0±0.1
2.0±0.05
4.0±0.1
1.75±0.1
1.05±0.1
P1-P3P4-P6P7-P8

LQM18NN68NM00D

Mfr. #:
Buy LQM18NN68NM00D
Manufacturer:
Murata Electronics
Description:
Fixed Inductors 0603 68nH +/-20% DCR 0.30ohm
Lifecycle:
New from this manufacturer.
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