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N08L63W2A
Timing Test Conditions
Item
Input Pulse Level
0.1V
CC
to 0.9 V
CC
Input Rise and Fall Time 5ns
Input and Output Timing Reference Levels
0.5 V
CC
Output Load CL = 30pF
Operating Temperature
-40 to +85
o
C
Timing
Item Symbol
2.3 - 3.6 V 2.7 - 3.6 V
Units
Min. Max. Min. Max.
Read Cycle Time
t
RC
85 70 ns
Address Access Time (Random Access)
t
AA
85 70 ns
Address Access Time (Page Mode)
t
AAP
30 25 ns
Chip Enable to Valid Output
t
CO
85 70 ns
Output Enable to Valid Output
t
OE
30 25 ns
Byte Select to Valid Output
t
LB
, t
UB
85 70 ns
Chip Enable to Low-Z output
t
LZ
10 10 ns
Output Enable to Low-Z Output
t
OLZ
55ns
Byte Select to Low-Z Output
t
LBZ
, t
UBZ
10 10 ns
Chip Disable to High-Z Output
t
HZ
020020ns
Output Disable to High-Z Output
t
OHZ
020020ns
Byte Select Disable to High-Z Output
t
LBHZ
, t
UBHZ
020020ns
Output Hold from Address Change
t
OH
55ns
Write Cycle Time
t
WC
85 70 ns
Chip Enable to End of Write
t
CW
50 50 ns
Address Valid to End of Write
t
AW
50 50 ns
Byte Select to End of Write
t
LBW
, t
UBW
50 50 ns
Write Pulse Width
t
WP
40 40 ns
Address Setup Time
t
AS
00ns
Write Recovery Time
t
WR
00ns
Write to High-Z Output
t
WHZ
20 20 ns
Data to Write Time Overlap
t
DW
40 40 ns
Data Hold from Write Time
t
DH
00
ns
End Write to Low-Z Output
t
OW
55ns
