I
NTEGRATED
C
IRCUITS
D
IVISION
CPC7512
10 www.ixysic.com R01
3. Functional Description
3.1 Introduction
The CPC7512 Dual, 1Form-A, Shunt-Isolated
High-Voltage, High-Frequency, Analog Switch has two
symmetrical switch arrays with four operating states to
facilitate switching of high-frequency, high-voltage
signals using the AB and C switch states and the
flexibility to provide a variety of alternative switching
solutions for low-frequency high-voltage signal
applications. Operational states and logical behavior
of the device is shown in the “Truth Table” on
page 8. Switch organization consists of two channels,
each having three switches.
Within each channel there is an independent LATCH
input and a common Thermal Shutdown circuit that is
shared by the two channels. Other than the shared
TSD circuit, switch functionality under normal
operating conditions within each channel is
independent of the other channel. In designs where
the switches will be required to carry high load
currents or operate in higher temperature
environments, the thermal specifications should be
reviewed because the TSD circuit is shared by both
channels. An excess thermal condition in one channel
resulting in an active TSD event will cause an
interruption in the other channel as well when the TSD
protection circuit activates.
Solid-state switch construction of the CPC7512 offers
clean, bounce-free switching with simple TTL logic
level input control to provide access to high voltage
interfaces without the impulse noise generated by
traditional electromechanical switching techniques.
TTL logic level input control eliminates the additional
driver circuitry required by traditional techniques.
The low on-resistance (R
ON
) symmetrical linear
switches utilized in the AB switch state are configured
as matched pairs, SW1
A
/SW1
B
and SW2
A
/SW2
B
, for
improved performance when differential access is
required. Their symmetrical construction provides an
additional degree of design flexibility allowing either
side of the switch to be connected to the high voltage
network.
Integrated into the CPC7512 switches are high
frequency dynamic current limiting and thermal
shutdown mechanisms to provide protection for the
electronics being connected to a high voltage network
during a fault condition. High frequency positive and
negative transient currents such as lightning are
reduced by the dynamic current limiting function while
protection from prolonged low frequency power-cross
and DC currents is provided by the thermal shutdown
circuitry.
To protect against a high voltage fault in excess of the
CPC7512’s maximum voltage rating, use of an
over-voltage protector is required. The protector must
limit the voltage seen at the switch terminals to a level
less than the switches’ breakdown voltage. To
minimize the stress on the solid-state contacts, use of
a foldback or crowbar type protector is highly
recommended. With proper selection of the protector,
telecom applications using the CPC7512 will meet all
relevant ITU, LSSGR, TIA/EIA and IEC protection
requirements.
Operating from a single +5V supply the CPC7512 has
extremely low power consumption.
3.2 Under-Voltage Switch Lock-Out Circuitry
Smart logic in the CPC7512 provides for switch state
control during both power up and power loss
transients to prevent undesired connections to high
voltage networks. This is done by setting the switches’
logic to the All-Off state. An internal detector evaluates
the V
DD
supply against internally set thresholds to
determine when to de-assert the under-voltage switch
lock-out circuitry with a rising V
DD
, and when to assert
the under-voltage switch lock-out circuitry with a falling
V
DD
. Any time unsatisfactory low V
DD
conditions exist,
the lock-out circuit overrides user switch control by
blocking the external information applied to the input
pins, output by the internal latch, and conditioning the
internal switch commands to the All-Off state. Upon
restoration of V
DD
, the switches will remain off until the
LATCH
x
input is pulled low at which time proper
conditioning of the Sx
IN0
and Sx
IN1
inputs must be
made.
The rising V
DD
lock-out release threshold ensures all
internal logic is properly biased and functional before
accepting external switch commands from the inputs.
For a falling V
DD
event, the lock-out threshold is set to
assure proper logic and switch behavior up to the
moment the switches are forced off and external
inputs are suppressed.