ILD1, ILD2, ILD5, ILQ1, ILQ2, ILQ5
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Vishay Semiconductors
Rev. 1.8, 28-Jun-11
4
Document Number: 83646
For technical questions, contact: optocoupleranswers@vishay.com
THIS DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT
ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000
Note
• According to DIN EN 60747-5-2 (VDE 0884) (see figure 2). These optocouplers are suitable for “safety electrical insulation” only within the
safety ratings. Compliance with the safety ratings shall be ensured by means of suitable protective circuits.
Fig. 1 - Derating Diagram Fig. 2 - Test Pulse Diagram for Sample Test according
to DIN EN 60747-5-2 (VDE 0884); IEC 60747-5-5
SAFETY AND INSULATION RATINGS
PARAMETER TEST CONDITION SYMBOL MIN. TYP. MAX. UNIT
Isolation test voltage
between emitter and detector
V
ISO
5300 V
RMS
Isolation resistance
V
IO
= 500 V, T
amb
= 25 °C
R
IO
10
12
V
IO
= 500 V, T
amb
= 100 °C 10
11
Climatic classification
(according to IEC 68 part 1)
55/100/21
Comparative tracking index CTI 175
Rated impulse voltage V
IOTM
10 kV
Maximum working voltage Recurring peak voltage V
IORM
890 V
Forward current I
SI
275 mA
Power dissipation P
SO
400 mW
Safety temperature T
SI
175 °C
Creepage distance 7.0 mm
Clearance distance 7.0 mm
Insulation distance per IEC 60950 2.10.5.1 0.4 mm
T
SI
- Safety Temperature (°C)
0
50
100
150
200
250
300
350
400
450
0 25 50 75 100 125 150 175
Phototransistor
P
SO
(mW)
IR-diode
I
SI
(mA)
t
13930
t
1
, t
2
= 1 s to 10 s
t
3
, t
4
= 1 s
t
test
= 10 s
t
stres
= 12 s
V
IOTM
V
pd
V
IOWM
V
IORM
0
t
1
t
test
t
Tr
= 60 s
t
stres
t
3
t
4
t
2
