TLP3825,TLP3825F
3
7.
7.
7.
7. Internal Circuit
Internal Circuit
Internal Circuit
Internal Circuit
8.
8.
8.
8. Absolute Maximum Ratings (Note) (Unless otherwise specified, T
Absolute Maximum Ratings (Note) (Unless otherwise specified, T
Absolute Maximum Ratings (Note) (Unless otherwise specified, T
Absolute Maximum Ratings (Note) (Unless otherwise specified, T
a
a
a
a
= 25
= 25
= 25
= 25
)
)
)
)
LED
Detector
Common
Characteristics
Input forward current
Input forward current derating
Input forward current (pulsed)
Input reverse voltage
Input power dissipation
Input power dissipation derating
Junction temperature
OFF-state output terminal voltage
ON-state current (A connection)
ON-state current (B connection)
ON-state current (C connection)
ON-state current derating (A connection)
ON-state current derating (B connection)
ON-state current derating (C connection)
ON-state current (pulsed)
Output power dissipation
Output power dissipation derating
Junction temperature
Storage temperature
Operating temperature
Lead soldering temperature
Isolation voltage
(T
a
≥ 25 )
(100 µs pulse, 100 pps)
(T
a
≥ 25 )
(T
a
≥ 25 )
(T
a
≥ 25 )
(T
a
≥ 25 )
(t = 100 ms, duty = 1/10)
(T
a
≥ 25 )
(10 s)
AC, 60 s, R.H. ≤ 60 %
Symbol
I
F
∆I
F
/∆T
a
I
FP
V
R
P
D
∆P
D
/∆T
a
T
j
V
OFF
I
ON
∆I
ON
/∆T
a
I
ONP
P
O
∆P
O
/∆T
a
T
j
T
stg
T
opr
T
sol
BV
S
Note
(Note 1)
(Note 1)
(Note 2)
Rating
30
-0.3
1
5
50
-0.5
125
200
1.5
1.5
3.0
-15
-15
-30
4.5
750
-7.5
125
-55 to 125
-40 to 110
260
2500
Unit
mA
mA/
A
V
mW
mW/
V
A
mA/
A
mW
mW/
Vrms
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
Note 1: For an application circuit example, see Chapter 14.1.
Note 2: This device is considered as a two-terminal device: Pins 1, 2, 3 and 4 are shorted together, and pins 5, 6, 7
and 8 are shorted together.
2017-09-26
Rev.2.0
©2016-2017
Toshiba Electronic Devices & Storage Corporation
