Nexperia
BAV70SRA
Quad high-speed switching diodes
BAV70SRA All information provided in this document is subject to legal disclaimers.
©
Nexperia B.V. 2017. All rights reserved
Product data sheet 26 June 2017 7 / 12
11. Test information
t
rr
(1)
+ I
F
t
output signal
t
r
t
p
t
10 %
90 %
V
R
input signal
V = V
R
+ I
F
× R
S
R
S
= 50 Ω
I
F
D.U.T.
R
i
= 50 Ω
SAMPLING
OSCILLOSCOPE
mga881
(1) I
R
= 1 mA
Input signal: reverse pulse rise time t
r
= 0.6 ns; reverse voltage pulse duration t
p
= 100 ns; duty cycle δ = 0.05
Oscilloscope: rise time t
r
= 0.35 ns
Fig. 8. Reverse recovery time test circuit and waveforms
t
r
t
t
p
10 %
90 %
I
input signal
R
S
= 50 Ω
I
R
i
= 50 Ω
OSCILLOSCOPE
1 kΩ 450 Ω
D.U.T.
mga882
V
FR
t
output signal
V
Input signal: forward pulse rise time t
r
= 20 ns; forward current pulse duration t
p
≥ 100 ns; duty cycle δ ≤ 0.005
Fig. 9. Forward recovery voltage test circuit and waveforms
Quality information
This product has been qualified in accordance with the Automotive Electronics Council (AEC)
standard Q101 - Stress test qualification for discrete semiconductors, and is suitable for use in
automotive applications.
