NCP1573
http://onsemi.com
3
ELECTRICAL CHARACTERISTICS (0°C < T
J
< 125°C, 11.4 V < V
CC
< 12.6 V, C
GATE(H)
= C
GATE(L)
= 3.3 nF,
C
PGDELAY
= 0.01 μF, C
COMP
= 0.1 μF; unless otherwise specified.)
Characteristic Test Conditions Min Typ Max Unit
Error Amplifier
V
FB
Bias Current V
FB
= 0 V − 0.2 2.0 μA
COMP Source Current COMP = 1.5 V, V
FB
= 0.8 V 15 30 60 μA
COMP Sink Current COMP = 1.5 V, V
FB
= 1.2 V 15 30 60 μA
Reference Voltage COMP = V
FB
T
J
< 25°C
0.970
0.965
0.980
0.980
0.990
0.995
V
V
COMP Max Voltage V
FB
= 0.8 V 2.4 2.7 − V
COMP Min Voltage V
FB
= 1.2 V − 0.1 0.2 V
Open Loop Gain − − 98 − dB
Unity Gain Bandwidth − − 20 − kHz
PSRR @ 1.0 kHz − − 70 − dB
Output Transconductance − − 32 − mmho
Output Impedance − − 2.5 − MΩ
GATE(H) and GATE(L)
Rise Time 1.0 V < GATE(L), GATE(H) < V
CC
− 2.0 V − 40 80 ns
Fall Time V
CC
− 2.0 V < GATE(L), GATE(H) < 1.0 V − 40 80 ns
GATE(H) to GATE(L) Delay GATE(H) < 2.0 V, GATE(L) > 2.0 V 40 60 100 ns
GATE(L) to GATE(H) Delay GATE(L) < 2.0 V, GATE(H) > 2.0 V 40 60 100 ns
Minimum Pulse Width GATE(X) = 4.0 V − 250 − ns
High Voltage (AC) Measure GATE(L) or GATE(H)
0.5 nF < C
GATE(H)
= C
GATE(L)
< 10 nF
Note 2.
V
CC
− 0.5 V
CC
− V
Low Voltage (AC) Measure GATE(L) or GATE(H)
0.5 nF < C
GATE(H)
= C
GATE(L)
< 10 nF
Note 2.
− 0 0.5 V
GATE(H)/(L) Pull−Down Resistance to GND. Note 2. 20 50 115 kΩ
Power Good
Lower Threshold, V
O
Rising
T
J
< 25°C
0.852
0.847
0.882
0.882
0.912
0.917
V
V
Lower Threshold, V
O
Falling
T
J
< 25°C
0.663
0.658
0.685
0.685
0.709
0.714
V
V
PWRGD Low Voltage I
SINK
= 1.0 mA, V
FB
= 0 V − 0.15 0.4 V
Delay Charge Current PGDELAY = 2.0 V 7.0 12 18 μA
Delay Clamp Voltage − 3.45 4.0 4.3 V
Delay Charge Threshold Ramp PGDELAY, Monitor PWRGD 3.1 3.3 3.5 V
“Good” Signal Delay With 0.01 μF. Note 2. 1.0 3.0 5.0 ms
2. Guaranteed by design. Not tested in production.