NE1617A All information provided in this document is subject to legal disclaimers. © NXP B.V. 2012. All rights reserved.
Product data sheet Rev. 5 — 20 March 2012 16 of 30
NXP Semiconductors
NE1617A
Temperature monitor for microprocessor systems
9.2 Power sequencing considerations
9.2.1 Power supply slew rate
When powering-up the NE1617A, ensure that the slew rate of V
DD
is less than 18 mV/s.
A slew rate larger than this may cause power-on reset issues and yield unpredictable
results.
9.2.2 Application circuit
Figure 5 shows a typical application circuit for the NE1617A, using a discrete sensor
transistor connected via a shielded, twisted pair cable. The pull-ups on SCLK, SDATA,
and ALERT
are required only if they are not already provided elsewhere in the system.
The SCLK and SDATA pins of the NE1617A can be interfaced directly to the SMBus of an
I/O controller, such as the Intel 820 chip set.
(1) Typical value, placed close to temperature sensor.
Fig 5. Typical application circuit
002aad511
NE1617A
STBYV
DD
215
D+
D
remote sensor
2N3904 (NPN),
2N3906 (PNP)
or similar stand-alone
ASIC or processor
thermal diode
ADD0 ADD1 GND GND
C1
(1)
2200 pF
3
4
10678
ALERT
SDATA
SCLK
clock
data
microcontroller
interrupt
14
12
11
R
10 kΩ
R
10 kΩ
R
10 kΩ
V
DD
0.1 μF
NE1617A All information provided in this document is subject to legal disclaimers. © NXP B.V. 2012. All rights reserved.
Product data sheet Rev. 5 — 20 March 2012 17 of 30
NXP Semiconductors
NE1617A
Temperature monitor for microprocessor systems
10. Limiting values
Table 12. Limiting values
In accordance with the Absolute Maximum Rating System (IEC 60134).
Symbol Parameter Conditions Min Max Unit
V
DD
supply voltage V
DD
to GND 0.3 +6 V
V
I
input voltage D+, ADD0, ADD1 0.3 V
DD
+0.3 V
D to GND 0.3 +0.8 V
SCLK, SDATA, ALERT
, STBY 0.3 +6 V
I
I
input current SDATA 1+50 mA
D - 1mA
T
amb
ambient temperature operating 55 +125 C
T
j(max)
maximum junction
temperature
-+150C
T
stg
storage temperature 65 +150 C
NE1617A All information provided in this document is subject to legal disclaimers. © NXP B.V. 2012. All rights reserved.
Product data sheet Rev. 5 — 20 March 2012 18 of 30
NXP Semiconductors
NE1617A
Temperature monitor for microprocessor systems
11. Characteristics
[1] The value of V
DD
below which the internal A/D converter is disabled. This is designed to be a minimum of 200 mV above the power-on
reset. During the time that it is disabled, the temperature that is in the ‘read temperature registers’ will remain at the value that it was
before the ADC was disabled. This is done to eliminate the possibility of reading unexpected false temperatures due to the A/D
converter not working correctly due to low voltage. In case of power-up (rising V
DD
), the reading that is stored in the ‘read temperature
registers’ will be the default value of 0 C. As soon as V
DD
has risen to the value of UVLO, the ADC will function correctly and normal
temperatures will be read.
[2] V
DD
(rising edge) voltage below which the ADC is disabled.
[3] V
DD
(falling edge) voltage below which the logic is reset.
[4] Address is read at power-up and at start of conversion for all conversions except the fastest rate.
[5] Due to the bias current, any pull-up/pull-down resistors should be 2k.
Table 13. Characteristics
V
DD
= 3.0 V to 3.6 V; T
amb
=0
C to +125
C; unless otherwise specified.
Symbol Parameter Conditions Min Typ Max Unit
T
res
temperature resolution 1 - - C
T
acc(loc)
local temperature accuracy T
amb
=+60C to +100 C-<1 2 C
T
amb
=0C to +125 C-<2 3 C
T
acc(rem)
remote temperature accuracy T
remote
=+60C to +100 C--3 C
T
remote
= 40 C to +125 C--5 C
V
th(UVLO)
undervoltage lockout threshold
voltage
[1]
V
DD
supply
[2]
- 2.7 2.95 V
V
th(POR)
power-on reset threshold
voltage
V
DD
supply (falling edge)
[3]
1.0 - 2.5 V
I
DD(AV)
average supply current conversion rate = 0.25 per second - - 70 A
conversion rate = 2 per second - - 180 A
I
DD(stb)
standby supply current SMBus inactive - 3 10 A
t
conv
conversion time from STOP bit to conversion
complete; both channels
--170ms
E
f(conv)
conversion rate error percentage error in programmed
rate
30 - +30 %
I
source
source current remote sensor
HIGH level - 100 - A
LOW level - 10 - A
I
bias
bias current ADD0, ADD1; momentary as the
address is being read
[4][5]
- 160 - A

NE1617ADS,118

Mfr. #:
Manufacturer:
NXP Semiconductors
Description:
Board Mount Temperature Sensors TEMP SENSOR DIGITAL
Lifecycle:
New from this manufacturer.
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