Philips Semiconductors Product data
74LV03Quad 2-input NAND gate
2003 Mar 03
4
RECOMMENDED OPERATING CONDITIONS
SYMBOL PARAMETER CONDITIONS MIN TYP. MAX UNIT
V
CC
DC supply voltage See Note1 1.0 3.3 5.5 V
V
I
Input voltage 0 – V
CC
V
V
O
Output voltage 0 – V
CC
V
T
amb
Operating ambient temperature range in free air See DC and AC characteristics
–40
–40
+85
+125
°C
V
CC
= 1.0 V to 2.0 V – – 500 ns/V
p
V
CC
= 2.0 V to 2.7 V – – 200
r
,
f
u
V
CC
= 2.7 V to 3.6 V – – 100
V
CC
= 3.6 V to 5.5 V – – 50
NOTES:
1 The LV is guaranteed to function down to V
CC
= 1.0 V (input levels GND or V
CC
); DC characteristics are guaranteed from V
CC
= 1.2 V to
V
CC
= 5.5 V.
ABSOLUTE MAXIMUM RATINGS
1,
2
In accordance with the Absolute Maximum Rating System (IEC 134).
Voltages are referenced to GND (ground = 0 V).
SYMBOL
PARAMETER CONDITIONS RATING UNIT
V
CC
DC supply voltage –0.5 to +7.0 V
±I
IK
DC input diode current V
I
< –0.5 or V
I
> V
CC
+ 0.5 V 20 mA
±I
OK
DC output diode current V
O
< –0.5 or V
O
> V
CC
+ 0.5 V 50 mA
±I
O
DC output source or sink current
– standard outputs
–0.5V < V
O
< V
CC
+ 0.5 V
25
mA
±I
GND
,
±I
CC
DC V
CC
or GND current for types with
–standard outputs 50
mA
T
stg
Storage temperature range –65 to +150 °C
P
TOT
Power dissipation per package
–plastic mini-pack (SO)
for temperature range: –40 °C to +125 °C
above +70 °C derate linearly with 8 mW/K
500 mW
NOTES:
1 Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the
device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to
absolute-maximum-rated conditions for extended periods may affect device reliability.
2 The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
