MX7547SQ/883B

SCOPE: CMOS, PARALLEL-LOADING, DUAL, MULTIPLYING 12-BIT D/A CONVERTER
Device Type Generic Number
01 MX7537U(x)/883B
02 MX7537T(x)/883B
03 MX7537S(x)/883B
04 MX7547U(x)/883B
05 MX7547T(x)/883B
06 MX7547S(x)/883B
Case Outline(s). The case outlines shall be designated in Mil-Std-1835 and as follows:
Outline Letter Mil-Std-1835
Case Outline Package Code
MAXIM SMD
Q L GDIP1-T24 or CDIP2-T24 24 LEAD CERDIP J24
E 3 CQCC1-N28 28 LEADLESS CHIP L28
Absolute Maximum Ratings:
V
DD
to DGND ........................................................................................………. -0.3V, + 17V
V
RFBA
, V
RFBB
to AGND .......................................................................................………. ±25V
V
REFA
, V
REFB
to AGND .......................................................................................………. ±25V
Digital Input Voltage to DGND .....................................................……… -0.3V, (V
DD
+0.3V)
IOUTA, IOUTB Voltage to DGND ...............................................…….... -0.3V, (V
DD
+0.3V)
AGND to DGND ............................................................................…….... -0.3V, (V
DD
+0.3V)
Lead Temperature (soldering, 10 seconds) ........................................................................ +300°C
Storage Temperature ........................................................................................... -65°C to +150°C
Continuous Power Dissipation ..........................................................................……... T
A
=+70°C
24 pin CERDIP(derate 12.5mW/°C above +70°C) ...............................................…….. 1000mW
28 pin LCC(derate 10.2mW/°C above +70°C) .......................................................…….. 816mW
Junction Temperature T
J
.....................................................................................…….... +150°C
Thermal Resistance, Junction to Case, ΘJC
24 pin CERDIP................................................................................................…….... 40°C/W
28 pin LCC .....................................................................................................……..... 15°C/W
Thermal Resistance, Junction to Ambient, ΘJA:
24 pin CERDIP................................................................................................…….... 80°C/W
28 pin LCC .....................................................................................................………. 98°C/W
Recommended Operating Conditions
Ambient Operating Range (T
A
) ............................................................……... -55°C to +125°C
Logic Supply Voltage (V
LOGIC
) ................................................................……... +4.5V to +5.5V
Positive Supply Voltage (V
DD
)..............................................................……... +11.4V to +16.5V
Negative Supply Voltage (V
EE
)...............................................................……... -11.4V to -16.5V
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device.
These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
-
---------------------- Electrical Characteristics of MX7537/47/883B for /883B 19-0057 Rev. C
and SMD 5962-87763 and SMD 5962-89657 Page 2 of 7
TABLE 1. ELECTRICAL TESTS:
TEST Symbol
CONDITIONS
-55 °C <=T
A
<= +125°C 1/
Unless otherwise specified
Group A
Subgroup
Device
type
Limits
Min
Limits
Max
Units
ACCURACY
Resolution RES 1,2,3
All
12.0 Bits
Relative Accuracy RA V
DD
=+10.8V and V
DD
=+16.5V
V
DD
=10.8V (MX7547 only)
1,2,3
1,2,4,5
3,6
±0.5
±1.0
LSB
Differential Nonlinearity DNL Guaranteed monotonic 1,2,3
All
±1.0
LSB
Gain Error AE Measured using R
FBA
, R
FBB
; DAC
registers loaded with all 1’s,
V
DD
=10.8V
1,2,3
1,4
2,5
3,6
±2.0
±3.0
±6.0
LSB
Gain Tempco
Gain/Temperature
NOTE 2
TCFS 4
All
±5.0 ppm/°C
Output Leakage Current
IOUTA, IOUTB
ILKG V
DD
=+16.5V, DAC registers
loaded with all 0s
1,3
2
All
±10
±250
nA
VREFA, VREFB Input
Leakage
RREF V
DD
=+10.8V 1,2,3
All
920
k
VREFA, VREFB Input
Resistance Match
RREF
V
DD
=+10.8V 1,2,3 1,4
2,3,5,6
±1.0
±3.0
%
Digital Input High
Voltage
V
IH
V
DD
=+10.8V and V
DD
=+16.5V 1,2,3
All
2.4 V
Digital Input Low
Voltage
V
IL
V
DD
=+10.8V and V
DD
=+16.5V 1,2,3
All
0.8 V
Digital Input Leakage
Current
I
IN
V
IN
=+0V or 16.5V 1,3
2
All
±1.0
±10
µA
Digital Input Capacitance C
IN
4
All
10 pF
Supply Voltage V
DD
Operating range, V
DD
=16.5V
1,2,3 All
10.8 16.5 V
Supply Current I
DD
1,2,3 All
2.0 mA
Current Settling Time t
SL
To 0.5 LSB, IOUT load =100,
CEXT=13pF, DAC output ___
measured from falling edge of WR
9,10,11
4,5,6
1.5
µs
Current Settling Time t
SL
To 0.5 LSB, IOUT load =100,
CEXT=13pF, DAC output ___
measured from rising edge of WR
4
1,2,3
1.5
µs
VREFA
to IOUTA
Feedthrough
Error
VREFB
to IOUTB
NOTE 2
FTE
DAC VREFA=20Vp-p
registers 10kHz sine wave,
loaded VREFB=0V
with all 0s
VREFB=20Vp-p
10kHz sine wave,
VREFA=0V
4,5,6
(SMD)
4,5,6
-70 -65
(SMD)
dB
VREFA
to IOUTA
Feedthrough
Error
VREFB
to IOUTB
NOTE 2
FTE
DAC VREFA=20Vp-p
registers 10kHz sine wave,
loaded VREFB=0V
with all 0s
VREFB=20Vp-p
10kHz sine wave,
VREFA=0V
4
(SMD)
1,2,3
-70 -65
(SMD)
dB
-
---------------------- Electrical Characteristics of MX7537/47/883B for /883B 19-0057 Rev. C
and SMD 5962-87763 and SMD 5962-89657 Page 3 of 7
TEST Symbol
CONDITIONS
-55 °C <=T
A
<= +125°C 1/
Unless otherwise specified
Group A
Subgroup
Device
type
Limits
Min
Limits
Max
Units
Power-Supply
Rejection Ratio
PSRR
V
DD
=10.8V, V
DD
=12V±5%
V
DD
=10.8V, V
DD
=V
DD
MAX -
V
DD
MIN
1
2,3
1
2,3
01,02,03
All
±0.01
±0.02
±0.01
±0.02
%/%
Output Capacitance
(IOUTA, IOUTB)
C
OUT
DAC A, DAC B loaded with 0s
DAC A, DAC B loaded with 1s
4
All
-70
140
dB
Channel-to-Channel
Isolation
VREFA
to IOUTA
VREFB to
IOUTB
VREFA=20Vp-p, 10kHz sine
wave, VREFB=0V
VREFB=20Vp-p, 10kHz sine
wave, VREFA=0V
4
All
-84
dB
TIMING
Address Valid to
Write-setup Time
t
1
9
10,11
01,02,03
20
30
ns
Address Valid to
Write-hold Time
t
2
9
10,11
01,02,03
15
25
ns
Data-setup Time t
3
9
10,11
All
60
80
ns
Data-hold Time t
4
9,10,11
All
25 ns
Chip Select or Update
to Write-setup Time t
5
9,10,11
9
10,11
01,02,03
04,05,06
0
80
100
ns
Chip Select orUpdate
to Write Hold Time
t
6
9,10,11
All
0ns
Write Pulse Width t
7
9
10,11
All
80
100
ns
Clear Pulse Width t
8
9
10,11
All
80
100
ns
NOTE 1: Conditions unless otherwise specified, 4.5VV
DD
5.5V. VDD=10.8V to 16.5V, AGND=DGND=0V,
use maximum possible reference voltage.
NOTE 2: Typical number, for design aid only.
MODE SELECTION TABLE:
MX7537
___
CLR
___
UPD
___
CS
___
WR A1 A0 Function
1 1 1 X X X No data transfer
1 1 X 1 X X No data transfer
0 X X X X X All registers cleared
1 1 0 0 0 0 DAC A LS input register loaded with D7-D0
1 1 0 0 0 1 DAC A MS input register loaded with D3-D0
1 1 0 0 1 0 DAC B LS input register loaded with D7-D0
1 1 0 0 1 1 DAC B MS input register loaded with D3-D0
1 0 1 0 X X DAC A, DAC B registers updated simultaneously from input
registers. Input registers not changed.
1 0 0 0 X X DAC A, DAC B registers are transparent. Input registers loaded.
X = Don’t care
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---------------------- Electrical Characteristics of MX7537/47/883B for /883B 19-0057 Rev. C
and SMD 5962-87763 and SMD 5962-89657 Page 4 of 7

MX7547SQ/883B

Mfr. #:
Manufacturer:
Maxim Integrated
Description:
IC DAC 12BIT A-OUT 24CDIP
Lifecycle:
New from this manufacturer.
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