MX7547SQ/883B

MODE SELECTION TABLE:
MX7547
___
CSA
___
CSB
___
WR Function
X X 1 No data transfer
1 1 X No data transfer
↑↑
0
___ ___
A rising edge on CSA or CSB transfer data to the respective DAC.
01
DAC A register loaded from data bus.
10
DAC B register loaded from data bus.
00
DAC A and DAC B registers loaded from data bus.
X= don’t care WR input is edge-triggered.
ORDERING INFORMATION:
Package Pkg. Code Device ID SMD Number
01 24 pin CERDIP J24 MX7537UQ/883B 5962-8776303LA
02 24 pin CERDIP J24 MX7537TQ/883B 5962-8776302LA
03 24 pin CERDIP J24 MX7537SQ/883B 5962-8776301LA
01 28 pin LCC L28 MX7537UE/883B 5962-87763033C
02 28 pin LCC L28 MX7537TE/883B 5962-87763023C
03 28 pin LCC L28 MX7537SE/883B 5962-87763013C
04 24 pin CERDIP J24 MX7547UQ/883B 5962-8965703LA
05 24 pin CERDIP J24 MX7547TQ/883B 5962-8965702LA
06 24 pin CERDIP J24 MX7547SQ/883B 5962-8965701LA
04 28 pin LCC L28 MX7547UE/883B 5962-89657033C
05 28 pin LCC L28 MX7547TE/883B 5962-89657023C
06 28 pin LCC L28 MX7547SE/883B 5962-89657013C
TERMINAL CONNECTIONS:
MX7537 MX7537 MX7547 MX7547 MX7537 MX7537 MX7547 MX7547
J24 L28 J24 L28 J24 L28 J24 L28
1 AGNDA NC AGNDA NC 15 A0 NC D8 NC
2I
OUTA
AGNDA I
OUTA
AGNDA 16 A1 D6 D9 D6
3RFBA I
OUTA
RFBA I
OUTA
17 ____
CLR
D7 D10 D7
4 VREFA RFBA VREFA RFBA 18 ___
WR
A0 D11
(MSB)
D8
5__
CS
VREFA ___
CSA
VREFA 19 ___
UPD
A1 ___
WR
D9
6D0 __
CS
(LSB)D0 ___
CSA
20 V
DD
____
CLR
____
CSB
D10
7 D1 D0 D1 (LSB)D0 21 VREFB ___
WR
V
DD
D11
8D2 NCD2 NC22RFBBNCVREFBNC
9D3D1D3D123I
OUTB
___
UPD
RFBB ___
WR
10 D4 D2 D4 D2 24 AGNDB V
DD
I
OUTB
____
CSB
11 D5 D3 D5 D3 25 VREFB V
DD
12 DGND D4 DGND D4 26 RFBB VREFB
13 D6 D5 D6 D5 27 I
OUTB
RFBB
14 D7 DGND D7 DGND 28 AGNDB I
OUTB
----------------------- Electrical Characteristics of MX7537/47/883B for /883B 19-0057 Rev. C
and SMD 5962-87763 and SMD 5962-89657 Page 5 of 7
QUALITY ASSURANCE
Sampling and inspection procedures shall be in accordance with MIL-Prf-38535, Appendix A as specified in Mil-Std-883.
Screening shall be in accordance with Method 5004 of Mil-Std-883. Burn-in test Method 1015:
1. Test Condition, A, B, C, or D.
2. TA = +125°C minimum.
3. Interim and final electrical test requirements shall be specified in Table 2.
Quality conformance inspection shall be in accordance with Method 5005 of Mil-Std-883, including Groups A, B, C, and D inspection.
Group A inspection:
1. Tests as specified in Table 2.
2. Selected subgroups in Table 1, Method 5005 of Mil-Std-883 shall be omitted.
Group C and D inspections:
a. End-point electrical parameters shall be specified in Table 1.
b. Steady-state life test, Method 1005 of Mil-Std-883:
1. Test condition A, B, C, D.
2. TA = +125°C, minimum.
3. Test duration, 1000 hours, except as permitted by Method 1005 of Mil-Std-883.
TABLE 2. ELECTRICAL TEST REQUIREMENTS
Mil-Std-883 Test Requirements Subgroups
per Method 5005, Table 1
Interim Electric Parameters
Method 5004
1
Final Electrical Parameters
Method 5005
1*, 2, 3, 9, 10, 11
Group A Test Requirements
Method 5005
1, 2, 3, 4**, 5**, 6**, 9, 10**, 11**
Group C and D End-Point Electrical Parameters
Method 5005
1
* PDA applies to Subgroup 1 only.
** If not tested shall be guaranteed to the limits specified in Table 1.
----------------------- Electrical Characteristics of MX7537/47/883B for /883B 19-0057 Rev. C
and SMD 5962-87763 and SMD 5962-89657 Page 6 of 7

MX7547SQ/883B

Mfr. #:
Manufacturer:
Maxim Integrated
Description:
IC DAC 12BIT A-OUT 24CDIP
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
T/T Paypal Visa MoneyGram Western Union

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