MTFDDAK060MBD-2AH12ITYY Datasheet MTFDDAK128MBD-1AK12ITYY, MTFDDAK064MBD-1AH12ITYY, MTFDDAK256MBD-1AK12ITYY | P7-P9

Performance

Measured performance can vary for a number of reasons. The major factors affecting

drive performance are the capacity of the drive and the interface of the host. Addition-

ally, overall system performance can affect the measured drive performance. When

comparing drives, it is recommended that all system variables are the same, and only

the drive being tested varies.

Performance numbers will vary depending on the host system configuration.

For SSDs designed for the industrial market, Micron specifies performance in fresh-out-

of-box (FOB) state. Data throughput measured in "steady state" may be lower than FOB

state, depending on the nature of the data workload.

For a description of these performance states and of Micron's best practices for per-

formance measurement, refer to Micron's technical marketing brief "Best Practices for

SSD Performance Measurement"

(www.micron.com/products/solid-state-storage/).

Table 6: Drive Performance

Capacity 60GB 120GB 240GB 64GB 128GB 256GB

UnitInterface Speed 6 Gb/s 6 Gb/s 6 Gb/s 6 Gb/s 6 Gb/s 6 Gb/s

Sequential read (128KB

transfer)

500 500 500 500 500 500 MB/s

Sequential write (128KB

transfer)

130 130 250 130 130 250 MB/s

Random read (4KB trans-

fer)

55,000 55,000 65,000 55,000 55,000 65,000 IOPS

Random write (4KB trans-

fer)

35,000 35,000 60,000 35,000 35,000 60,000 IOPS

READ latency (TYP) 160 160 160 160 160 160 µs

WRITE latency (TYP) 40 40 40 40 40 40 µs

Notes:

1. Performance numbers are maximum values, except as noted.

2. Typical I/O performance numbers as measured using Iometer with a queue depth of 32

and write cache enabled. Fresh-out-of-box (FOB) state is assumed. For performance

measurement purposes, the SSD may be restored to FOB state using the SECURE ERASE

command.

3. Iometer measurements are performed on an 20GB span of logical block addresses

(LBAs).

4. 4KB transfers with a queue depth of 1 are used to measure READ/WRITE latency values

with write cache enabled.

M500IT 2.5-Inch NAND Flash MLC SSD

Performance

09005aef864ead5e

m500it_2_5_MLC_industrial_ssd.pdf - Rev. G 6/16 EN

Micron Technology, Inc. reserves the right to change products or specifications without notice.

Reliability

Micron’s SSDs incorporate advanced technology for defect and error management.

They use various combinations of hardware-based error correction algorithms and

firmware-based static and dynamic wear-leveling algorithms.

Over the life of the SSD, uncorrectable errors may occur. An uncorrectable error is de-

fined as data that is reported as successfully programmed to the SSD but when it is read

out of the SSD, the data differs from what was programmed.

Table 7: Uncorrectable Bit Error Rate

Uncorrectable Bit Error Rate Operation

<1 sector per 10

bits read READ

Mean Time To Failure

Mean time to failure (MTTF) for the SSD can be predicted based on the component reli-

ability data using the methods referenced in the Telcordia SR-332 reliability prediction

procedures for electronic equipment.

Table 8: MTTF

Capacity (GB) MTTF (Operating Hours)

60 3.0 million

120 3.0 million

240 3.0 million

64 3.0 million

128 3.0 million

256 3.0 million

Note:

1. The product achieves a mean time to failure (MTTF) of 3.0 million hours, based on popu-

lation statistics not relevant to individual units.

Endurance

Endurance for the SSD can be predicted based on the usage conditions applied to the

device, the internal NAND component cycles, the write amplification factor, and the

wear-leveling efficiency of the drive. For each SSD capacity, the table below shows drive

lifetime and sequential input based on predefined usage conditions.

Table 9: Drive Lifetime

Capacity (GB) Drive Lifetime (Total Bytes Written)

60 60TB

120 120TB

240 240TB

64 60TB

128 120TB

M500IT 2.5-Inch NAND Flash MLC SSD

Reliability

09005aef864ead5e

m500it_2_5_MLC_industrial_ssd.pdf - Rev. G 6/16 EN

Micron Technology, Inc. reserves the right to change products or specifications without notice.

Table 9: Drive Lifetime (Continued)

Capacity (GB) Drive Lifetime (Total Bytes Written)

256 240TB

Notes:

1. Total bytes written validated with the drive 90% full.

2. Access patterns used during reliability testing are 25% sequential and 75% random and

consist of the following: 50% are 4 KB; 40% are 64 KB; and 10% are 128 KB.

3. Host workload parameters, including write cache settings, I/O alignment, transfer sizes,

randomness, and percent full, that are substantially different than the described notes

may result in varied endurance results.

4. GB/day can be calculated by dividing the total bytes written value by (365 × number of

years). For example: 100 TB/5 years/365 days = 54 GB/day for 5 years.

M500IT 2.5-Inch NAND Flash MLC SSD

Reliability

09005aef864ead5e

m500it_2_5_MLC_industrial_ssd.pdf - Rev. G 6/16 EN

Micron Technology, Inc. reserves the right to change products or specifications without notice.

P1-P3 P4-P6 P7-P9 P10-P12 P13-P15 P16-P18 P19-P21 P22-P24 P25-P27 P28-P30 P31-P33 P34-P36

MTFDDAK060MBD-2AH12ITYY

Mfr. #:

Buy MTFDDAK060MBD-2AH12ITYY

Manufacturer:

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Description:

SSD 60GB 2.5" MLC SATA III 3.3V

Lifecycle:

New from this manufacturer.

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