HEXFET
®
Power MOSFET
Specifically designed for Automotive applications, these
HEXFET
®
Power MOSFET's in a Dual SO-8 package utilize
the lastest processing techniques to achieve extremely low
on-resistance per silicon area. Additional features of these
Automotive qualified HEXFET Power MOSFET's are a 175°C
junction operating temperature, fast switching speed and
improved repetitive avalanche rating. These benefits combine
to make this design an extremely efficient and reliable device
for use in Automotive applications and a wide variety of other
applications.
The efficient SO-8 package provides enhanced thermal
characteristics and dual MOSFET die capability making it ideal
in a variety of power applications. This dual, surface mount
SO-8 can dramatically reduce board space and is also available
in Tape & Reel.
Absolute Maximum Ratings
Description
03/25/09
www.irf.com 1
Advanced Process Technology
Dual N-Channel MOSFET
Ultra Low On-Resistance
175°C Operating Temperature
Repetitive Avalanche Allowed up to Tjmax
Automotive [Q101] Qualified
Benefits
Typical Applications
Anti-lock Braking Systems (ABS)
Electronic Fuel Injection
Power Doors, Windows & Seats
AUTOMOTIVE MOSFET
PD - 93944D
IRF7103Q
V
DSS
R
DS(on)
max (mW) I
D
50V 130@V
GS
= 10V 3.0A
200@V
GS
= 4.5V 1.5A
Symbol Parameter Typ. Max. Units
R
θJL
Junction-to-Drain Lead –– 20
R
θJA
Junction-to-Ambient ––– 62.5 °C/W
Thermal Resistance
Parameter Max. Units
I
D
@ T
C
= 25°C Continuous Drain Current, V
GS
@ 4.5V 3.0
I
D
@ T
C
= 70°C Continuous Drain Current, V
GS
@ 4.5V 2.5 A
I
DM
Pulsed Drain Current 25
P
D
@T
C
= 25°C Power Dissipation 2.4 W
Linear Derating Factor 16 mW/°C
V
GS
Gate-to-Source Voltage ± 20 V
E
AS
Single Pulse Avalanche Energy 22 mJ
I
AR
Avalanche Current See Fig.16c, 16d, 19, 20 A
E
AR
Repetitive Avalanche Energy mJ
dv/dt Peak Diode Recovery dv/dt 12 V/ns
T
J,
T
STG
Junction and Storage Temperature Range -55 to + 175 °C
D1
D1
D2
D2
G1
S2
G2
S1
Top View
8
1
2
3
4
5
6
7
SO-8
IRF7103Q
2 www.irf.com
Parameter Min. Typ. Max. Units Conditions
I
S
Continuous Source Current MOSFET symbol
(Body Diode) showing the
I
SM
Pulsed Source Current integral reverse
(Body Diode) p-n junction diode.
V
SD
Diode Forward Voltage ––– ––– 1.2 V T
J
= 25°C, I
S
= 1.5A, V
GS
= 0V
t
rr
Reverse Recovery Time ––– 35 53 ns T
J
= 25°C, I
F
= 1.5A
Q
rr
Reverse Recovery Charge ––– 45 67 nC di/dt = 100A/µs
Source-Drain Ratings and Characteristics
A
12



3.0

Notes:
Repetitive rating; pulse width limited by
max. junction temperature.
Pulse width 400µs; duty cycle 2%.
Surface mounted on 1 in square Cu board
Starting T
J
= 25°C, L = 4.9mH
R
G
= 25, I
AS
= 3.0A. (See Figure 12).
I
SD
2.0A, di/dt 155A/µs, V
DD
V
(BR)DSS
,
T
J
175°C
Limited by T
Jmax
, see Fig.16c, 16d, 19, 20 for typical repetitive
avalanche performance.
Parameter Min. Typ. Max. Units Conditions
V
(BR)DSS
Drain-to-Source Breakdown Voltage 50 ––– ––– V V
GS
= 0V, I
D
= 250µA
V
(BR)DSS
/T
J
Breakdown Voltage Temp. Coefficient –– 0.057 V/°C Reference to 25°C, I
D
= 1mA
––– ––– 130 V
GS
= 10V, I
D
= 3.0A
––– ––– 200 V
GS
= 4.5V, I
D
= 1.5A
V
GS(th)
Gate Threshold Voltage 1.0 ––– 3.0 V V
DS
= V
GS
, I
D
= 250µA
g
fs
Forward Transconductance 3.4 ––– –– S V
DS
= 15V, I
D
= 3.0A
––– ––– 2.0 V
DS
= 40V, V
GS
= 0V
––– ––– 25 V
DS
= 40V, V
GS
= 0V, T
J
= 55°C
Gate-to-Source Forward Leakage ––– ––– 100 V
GS
= 20V
Gate-to-Source Reverse Leakage ––– ––– -100 V
GS
= -20V
Q
g
Total Gate Charge –– 10 15 I
D
= 2.0A
Q
gs
Gate-to-Source Charge –– 1.2 ––– nC V
DS
= 40V
Q
gd
Gate-to-Drain ("Miller") Charge ––– 2.8 ––– V
GS
= 10V
t
d(on)
Turn-On Delay Time ––– 5.1 –– V
DD
= 25V
t
r
Rise Time ––– 1.7 ––– I
D
= 1.0A
t
d(off)
Turn-Off Delay Time ––– 15 ––– R
G
= 6.0
t
f
Fall Time ––– 2.3 ––– R
D
= 25
C
iss
Input Capacitance ––– 255 ––– V
GS
= 0V
C
oss
Output Capacitance ––– 69 ––– pF V
DS
= 25V
C
rss
Reverse Transfer Capacitance ––– 29 ––– ƒ = 1.0MHz
Electrical Characteristics @ T
J
= 25°C (unless otherwise specified)
I
GSS
µA
m
R
DS(on)
Static Drain-to-Source On-Resistance
I
DSS
Drain-to-Source Leakage Current
nA
ns
S
D
G
IRF7103Q
www.irf.com 3
Fig 3. Typical Transfer Characteristics
Fig 2. Typical Output Characteristics
Fig 1. Typical Output Characteristics
Fig 4. Normalized On-Resistance
Vs. Temperature
-60 -40 -20 0 20 40 60 80 100 120 140 160 180
0.0
0.5
1.0
1.5
2.0
2.5
T , Junction Temperature ( C)
R , Drain-to-Source On Resistance
(Normalized)
J
DS(on)
°
V =
I =
GS
D
10V
3.0A
3.0 6.0 9.0 12.0 15.0
V
GS
, Gate-to-Source Voltage (V)
1.00
10.00
100.00
I
D
,
D
r
a
i
n
-
t
o
-
S
o
u
r
c
e
C
u
r
r
e
n
t
(
Α
)
T
J
= 25°C
T
J
= 175°C
V
DS
= 25V
20µs PULSE WIDTH
0.1 1 10 100
V
DS
, Drain-to-Source Voltage (V)
1
10
100
I
D
,
D
r
a
i
n
-
t
o
-
S
o
u
r
c
e
C
u
r
r
e
n
t
(
A
)
4.5V
20µs PULSE WIDTH
Tj = 25°C
VGS
TOP 15V
10V
8.0V
7.0V
6.0V
5.5V
5.0V
BOTTOM 4.5V
0.1 1 10 100
V
DS
, Drain-to-Source Voltage (V)
0.1
1
10
100
I
D
,
D
r
a
i
n
-
t
o
-
S
o
u
r
c
e
C
u
r
r
e
n
t
(
A
)
4.5V
20µs PULSE WIDTH
Tj = 175°C
VGS
TOP 15V
10V
8.0V
7.0V
6.0V
5.5V
5.0V
BOTTOM 4.5V

IRF7103Q

Mfr. #:
Manufacturer:
Infineon Technologies
Description:
MOSFET 2N-CH 50V 3A 8-SOIC
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
T/T Paypal Visa MoneyGram Western Union

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