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Z0109MN,135
P1-P3
P4-P6
P7-P9
P10-P12
P13-P15
P16-P16
NXP Semiconductors
Z0109MN
4Q T
riac
Z0109MN
All information provided in this document is subject to legal disclaimers.
© NXP N.V. 2013. All rights reserved
Product data sheet
26 August 2013
3 / 15
7.
Limiting values
T
able 4.
Limiting values
In accordance with the Absolute Maximum Rating System (IEC 60134).
Symbol
Parameter
Conditions
Min
Max
Unit
V
DRM
repetitive peak off-state voltage
-
600
V
I
T(RMS)
RMS on-state current
full sine wave; T
sp
≤ 105 °C;
Fig. 1
;
Fig. 2
;
Fig. 3
-
1
A
full sine wave; T
j(init)
= 25 °C;
t
p
= 20 ms;
Fig. 4
;
Fig. 5
-
8
A
I
TSM
non-repetitive peak on-state
current
full sine wave; T
j(init)
= 25 °C;
t
p
= 16.7 ms
-
8.5
A
I
2
t
I2t for fusing
t
p
= 10 ms; SIN
-
0.32
A
2
s
I
T
= 1 A; I
G
= 20 mA; dI
G
/dt = 0.1 A/µs;
T2+ G+
-
50
A/µs
I
T
= 1 A; I
G
= 20 mA; dI
G
/dt = 0.1 A/µs;
T2+ G-
-
50
A/µs
I
T
= 1 A; I
G
= 20 mA; dI
G
/dt = 0.1 A/µs;
T2- G-
-
50
A/µs
dI
T
/dt
rate of rise of on-state current
I
T
= 1 A; I
G
= 20 mA; dI
G
/dt = 0.1 A/µs;
T2- G+
-
20
A/µs
I
GM
peak gate current
-
1
A
P
GM
peak gate power
-
2
W
P
G(A
V)
average gate power
over any 20 ms period
-
0.1
W
T
stg
storage temperature
-40
150
°C
T
j
junction temperature
-
125
°C
NXP Semiconductors
Z0109MN
4Q T
riac
Z0109MN
All information provided in this document is subject to legal disclaimers.
© NXP N.V. 2013. All rights reserved
Product data sheet
26 August 2013
4 / 15
003
aac269
0
2
4
6
8
10
-2
10
-1
1
10
s
urge
du
ration (s)
I
T(
RMS
)
(A)
f = 50 Hz; T
sp
= 105 °C
Fig. 1.
RMS on-state current as a function of surge
duration; maximum values
0
0
3
a
a
c
2
7
0
0
0
.
4
0
.
8
1
.
2
-
5
0
0
5
0
1
0
0
1
5
0
T
s
p
(
°
C
)
I
T
(
R
M
S)
(
A
)
Fig. 2.
RMS on-state current as a function of solder
point temperature; maximum values
003aac259
0
.
0
0
.
4
0
.
8
1
.
2
1
.
6
2
.
0
0
0
.
2
0
.
4
0
.
6
0
.
8
1
1
.
2
I
T
(
RM
S
)
(
A)
P
t
o
t
(
W
)
alpha
=
1
8
0
°
1
2
0
°
9
0
°
6
0
°
3
0
°
conduction
angle
(degrees)
form
factor
a
30
60
90
120
180
4
2.8
2.2
1.9
1.57
alpha
alpha = conduction angle
a = form factor = I
T(RMS)
/ I
T(A
V)
Fig. 3.
T
otal power dissipation as a function of RMS on-state current; maximum values
NXP Semiconductors
Z0109MN
4Q T
riac
Z0109MN
All information provided in this document is subject to legal disclaimers.
© NXP N.V. 2013. All rights reserved
Product data sheet
26 August 2013
5 / 15
0
0
3
a
a
d
3
1
8
0
2
4
6
8
1
0
1
1
0
1
0
2
1
0
3
n
u
m
b
e
r
o
f
c
y
c
l
e
s
I
T
S
M
(
A
)
I
TSM
t
I
T
T
j(init)
= 25
°
C max
1/f
f = 50 Hz
Fig. 4.
Non-repetitive peak on-state current as a function of the number of sinusoidal current cycles; maximum
values
0
0
3
a
a
d
3
1
9
1
1
0
1
0
2
1
0
3
1
0
-
5
1
0
-
4
1
0
-
3
1
0
-
2
1
0
-
1
t
p
(
s
)
I
T
S
M
(
A)
(
1
)
(
2
)
I
TSM
t
I
T
T
j(init)
= 25
°
C max
t
p
t
p
≤ 20 ms
(1) dI
T
/dt limit
(2) T2- G+ quadrant limit
Fig. 5.
Non-repetitive peak on-state current as a function of pulse width; maximum values
P1-P3
P4-P6
P7-P9
P10-P12
P13-P15
P16-P16
Z0109MN,135
Mfr. #:
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Manufacturer:
WeEn Semiconductors
Description:
Triacs 600V 1A
Lifecycle:
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Z0109MN,135