ADuM7223 Data Sheet
PACKAGE CHARACTERISTICS
Table 3.
Parameter Symbol Min Typ Max Unit Test Conditions/Comments
Resistance (Input-to-Output) R
I-O
10
12
Ω
Capacitance (Input-to-Output) C
I-O
2.0 pF f = 1 MHz
Input Capacitance C
I
4.0 pF
IC Junction-to-Ambient Thermal Resistance θ
JA
96.3 °C/W
IC Junction-to-Case Thermal Resistance θ
JC
43.2 °C/W
INSULATION AND SAFETY-RELATED SPECIFICATIONS
Table 4.
Parameter Symbol Value Unit Test Conditions/Comments
Functional Dielectric Insulation Voltage
1
2500 V rms 1 minute duration
Minimum External Air Gap (Clearance) L(I01) 3.5 min mm
Measured from input terminals to output terminals,
shortest distance through air
Minimum External Tracking (Creepage) L(I02) 3.5 min mm
Measured from input terminals to output terminals,
shortest distance path along body
Minimum Internal Gap (Internal Clearance) 0.017 min mm Insulation distance through insulation
Tracking Resistance (Comparative Tracking Index) CTI >400 V DIN IEC 112/VDE 0303 Part 1
Isolation Group II
Material Group (DIN VDE 0110, 1/89, Table 1)
1
Insulation voltage guaranteed by design, not tested in production. Insulation is similar in structure to devices that are tested to 5 kV rms in production.
Figure 2. Thermal Derating Curve
RECOMMENDED OPERATING CONDITIONS
Table 5.
Parameter Symbol Min Max Unit
Operating Junction
Temperature
T
J
−40 +125 °C
Supply Voltages
1
V
DD1
3.0 5.5 V
V
DDA
, V
DDB
4.5 18 V
Maximum Input Signal Rise
and Fall Times
T
VIA,
T
VIB
1 ms
Common-Mode Transient
Static
2
−50 +50 kV/µs
Common-Mode Transient
Immunity Dynamic
3
−25 +25 kV/µs
1
All voltages are relative to their respective ground. See the Applications
Information section for information on immunity to external magnetic fields.
2
Static common-mode transient immunity is defined as the largest dv/dt
between GND
1
and GND
A
/GND
B
with inputs held either high or low such that
the output voltage remains either above 0.8 × V
DD2
for V
IA
/V
IB
= high, or 0.8 V
for V
IA
/V
IB
= low. Operation with transients above recommended levels can
cause momentary data upsets.
3
Dynamic common-mode transient immunity is defined as the largest dv/dt
between GND
1
and GND
A
/GND
B
with switching edge coincident with the
transient test pulse. Operation with transients above recommended levels
can cause momentary data upsets.
0
0.2
0.4
0.6
0.8
1
1.2
1.4
0 50 100 150 200
SAFE LIMITING POWER (W)
AMBIENT TEMPERATURE (ºC)
11740-002
Rev. A | Page 6 of 16
Data Sheet ADuM7223
ABSOLUTE MAXIMUM RATINGS
Ambient temperature = 25°C, unless otherwise noted.
Table 6.
Parameter Symbol Rating
Storage Temperature T
ST
−55°C to +150°C
Operating Junction
Temperature
T
J
−40°C to +150°C
Supply Voltages
1
V
DD1
−0.3 V to +6.0 V
V
DD2
−0.3 V to +20 V
Input Voltage
1, 2
V
IA
, V
IB
−0.3 V to V
DDI
+ 0.3 V
Output Voltage
1, 2
V
OA
, V
OB
−0.3 to V
DDO
+ 0.3 V
Average Output
Current, per Pin
3
I
O
−35 mA to +35 mA
Common-Mode
Transients
4
CM
H
, CM
L
100 kV/µs to +100 kV/µs
1
All voltages are relative to their respective ground.
2
V
DDI
and V
DDO
refer to the supply voltages on the input and output sides of a
given channel, respectively.
3
See Figure 2 for information on maximum allowable current for various
temperatures.
4
Refers to common-mode transients across the insulation barrier. Common-
mode transients exceeding the Absolute Maximum Rating can cause
latch-up or permanent damage.
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
ESD CAUTION
Table 7. Maximum Continuous Working Voltage
1
Parameter Max Unit Constraint
AC Voltage, Bipolar Waveform 565 V peak
50-year minimum lifetime
AC Voltage, Unipolar Waveform
Functional Insulation 1131 V peak
50-year minimum lifetime
DC Voltage
Functional Insulation
1131
V peak
50-year minimum lifetime
1
Refers to continuous voltage magnitude imposed across the isolation barrier. See the Insulation Lifetime section for more details.
Table 8. Truth Table (Positive Logic)
1
DISABLE V
IA
Input V
IB
Input V
DD1
State V
DDA
/V
DDB
State V
OA
Output V
OB
Output Notes
L L L Powered Powered L L
Outputs return to the input state
within 1 µs of DISABLE = set to low.
L L H Powered Powered L H
Outputs return to the input state
within 1 µs of DISABLE = set to low.
L H L Powered Powered H L
Outputs return to the input state
within 1 µs of DISABLE = set to low.
L H H Powered Powered H H
Outputs return to the input state
within 1 µs of DISABLE = set to low.
H X X Powered Powered L L
Outputs take on default low state
within 3 µs of DISABLE = set to high.
L
L
L
Unpowered
Powered
L
L
Outputs return to the input state
within 1 µs of V
DD1
power restoration.
X X X Powered Unpowered Indeterminate Indeterminate
Outputs return to the input state
within 50 µs of V
DDA
/V
DDB
power
restoration.
1
X = don’t care.
Rev. A | Page 7 of 16
ADuM7223 Data Sheet
PIN CONFIGURATION AND FUNCTION DESCRIPTIONS
Figure 3. Pin Configuration
Table 9. Pin Function Descriptions
Pin No. Mnemonic Description
1 GND
1
Ground Reference for Input Logic Signals.
2 V
IA
Logic Input A.
3 V
IB
Logic Input B.
4, 6 NC
No Connect. Not internally connected.
5 DISABLE Input Disable. Disables the isolator inputs and refresh circuits. Outputs take on default low state.
7
V
DD1
Input Supply Voltage.
8 GND
B
Ground Reference for Output B.
9 V
OB
Output B.
10 V
DDB
Output B Supply Voltage.
11 GND
A
Ground Reference for Output A.
12 V
OA
Output A.
13 V
DDA
Output A Supply Voltage.
11740-003
V
IA
GND
1
V
IB
NC
DISABLE
NC = NO CONNECT. NOT INTERNALLY CONNECTED.
NC
ADuM7223
TOP VIEW
(Not to Scale)
1
2
3
4
5
6
7
13
12
11
10
9
8
V
DD1
V
OA
V
DDA
GND
A
V
DDB
V
OB
GND
B
Rev. A | Page 8 of 16

ADUM7223CCCZ

Mfr. #:
Manufacturer:
Analog Devices Inc.
Description:
Gate Drivers Isolated Precision Gate Drivr 4A Output
Lifecycle:
New from this manufacturer.
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