126
113016
MM Series – MLCC for Medical Applications
NP0 (C0G) – Specifications & Test Methods
Parameter/Test NP0 Specification Limits Measuring Conditions
Operating Temperature Range -55ºC to +125ºC Temperature Cycle Chamber
Capacitance Within specified tolerance Freq.: 1.0 MHz ± 10% for cap ≤ 1000 pF
Q
<30 pF: Q≥ 400+20 x Cap Value 1.0 kHz ± 10% for cap > 1000 pF
≥30 pF: Q≥ 1000 Voltage: 1.0Vrms ± .2V
Insulation Resistance
100,000MΩ or 1000MΩ - μF, Charge device with rated voltage for
whichever is less 60 ± 5 secs @ room temp/humidity
Charge device with 300% of rated voltage for
Dielectric Strength No breakdown or visual defects 1-5 seconds, w/charge and discharge current
limited to 50 mA (max)
Note: Charge device with 150% of rated
voltage for 500V devices.
Appearance No defects Deflection: 2mm
Capacitance Test Time: 30 seconds
Resistance to Variation
±5% or ±.5 pF, whichever is greater
Flexure
Q Meets Initial Values (As Above)
Stresses
Insulation
≥ Initial Value x 0.3
Resistance
Solderability
≥ 95% of each terminal should be covered Dip device in eutectic solder at 230 ± 5ºC
with fresh solder for 5.0 ± 0.5 seconds
Appearance No defects, <25% leaching of either end terminal
Capacitance
Variation
≤ ±2.5% or ±.25 pF, whichever is greater
Dip device in eutectic solder at 260ºC for 60
Q Meets Initial Values (As Above)
seconds. Store at room temperature for 24 ± 2
Resistance to
hours before measuring electrical properties.
Solder Heat
Insulation
Meets Initial Values (As Above)
Resistance
Dielectric
Meets Initial Values (As Above)
Strength
Appearance No visual defects Step 1: -55ºC ± 2º 30 ± 3 minutes
Capacitance
Variation
≤ ±2.5% or ±.25 pF, whichever is greater Step 2: Room Temp ≤ 3 minutes
Q Meets Initial Values (As Above) Step 3: +125ºC ± 2º 30 ± 3 minutes
Thermal
Shock
Insulation
Meets Initial Values (As Above) Step 4: Room Temp ≤ 3 minutes
Resistance
Dielectric
Meets Initial Values (As Above)
Repeat for 5 cycles and measure after
Strength 24 hours at room temperature
Appearance No visual defects
Capacitance
Variation
≤ ±3.0% or ± .3 pF, whichever is greater
Charge device with twice rated voltage in
≥ 30 pF: Q≥ 350 test chamber set at 125ºC ± 2ºC
Load Life
Q
≥10 pF, <30 pF: Q≥ 275 +5C/2 for 1000 hours (+48, -0).
(C=Nominal Cap)
<10 pF: Q≥ 200 +10C
Insulation
≥ Initial Value x 0.3 (See Above)
Remove from test chamber and stabilize at
Resistance room temperature for 24 hours
Dielectric
Meets Initial Values (As Above)
before measuring.
Strength
Appearance No visual defects
Capacitance
Variation
≤ ±5.0% or ± .5 pF, whichever is greater
Store in a test chamber set at 85ºC ± 2ºC/
≥ 30 pF: Q≥ 350 85% ± 5% relative humidity for 1000 hours
Load Q ≥10 pF, <30 pF: Q≥ 275 +5C/2 (+48, -0) with rated voltage applied.
Humidity <10 pF: Q≥ 200 +10C
Insulation
≥ Initial Value x 0.3 (See Above)
Remove from chamber and stabilize at
Resistance room temperature for 24 ± 2 hours
Dielectric
Meets Initial Values (As Above)
before measuring.
Strength
