PBHV9040Z_2 © NXP B.V. 2009. All rights reserved.
Product data sheet Rev. 02 — 15 January 2009 8 of 12
NXP Semiconductors
PBHV9040Z
500 V, 0.25 A PNP high-voltage low V
CEsat
(BISS) transistor
8. Test information
8.1 Quality information
This product has been qualified in accordance with the Automotive Electronics Council
(AEC) standard
Q101 - Stress test qualification for discrete semiconductors
, and is
suitable for use in automotive applications.
9. Package outline
10. Packing information
[1] For further information and the availability of packing methods, see Section 14.
Fig 12. Test circuit for switching times
R
C
R2
R1
DUT
mgd624
V
o
R
B
(probe)
450 Ω
(probe)
450 Ω
oscilloscope
oscilloscope
V
BB
V
I
V
CC
Fig 13. Package outline SOT223 (SC-73)
04-11-10Dimensions in mm
6.7
6.3
3.1
2.9
1.8
1.5
7.3
6.7
3.7
3.3
1.1
0.7
132
4
4.6
2.3
0.8
0.6
0.32
0.22
Table 8. Packing methods
The indicated -xxx are the last three digits of the 12NC ordering code.
[1]
Type number Package Description Packing quantity
1000 4000
PBHV9040Z SOT223 8 mm pitch, 12 mm tape and reel -115 -135