EVAL-ADN4650EBZ

UG-933 EVAL-ADN4650EB1Z User Guide
Rev. 0 | Page 4 of 9
GND1
GND1
GND2
GND2
V
DD2
V
DD1
V
IN1
V
IN2
P4
R1
R12 R11 R10
R2
R4
R8
R5
R3
R7
TP8
TP7
TP9
TP10
R6
R9
J9
J1
J2
J3
J4
J5
J6
J7
J8
J10
J22
J21
32J42J
U1
P7
E
VA
L
-A
DN4650EB1Z
2.5V OR 3.3V
SUPPLY
2.5V OR 3.3V
SUPPLY
OSCILLOSCOPE
SIGNAL
GENERATOR
13761-004
Figure 4. Basic LVDS Isolator Evaluation Board Operation
Table 1. Jumper Configuration
Jumper Position Description
P4 Open 3.3 V power supply connected to Connector J9 for V
IN1
Closed 2.5 V power supply connected to Connector J9, V
IN1
shorted to V
DD1
P7 Open 3.3 V power supply connected to Connector J9 for V
IN2
Closed 2.5 V power supply connected to Connector J9, V
IN2
shorted to V
DD2
Table 2. Side 1 Connector Descriptions
Connector Description
J9 Power supply, 3.3 V (Jumper P4 open) or 2.5 V (Jumper P4 closed)
J1 D
IN1+
, noninverted LVDS input for Isolator Channel 1
J2 D
IN1
, inverted LVDS input for Isolator Channel 1
J3 D
IN2+
, noninverted LVDS input for Isolator Channel 2
J4 D
IN2−
, inverted LVDS input for Isolator Channel 2
J22 Connects to Connector J21 (test trace for calibration)
J24 Connects to Connector J23 (test trace for calibration)
Table 3. Side 2 Connector Descriptions
Connector Description
J10 Power supply, 3.3 V (Jumper P7 open) or 2.5 V (Jumper P7 closed)
J5 D
OUT1+
, noninverted LVDS output for Isolator Channel 1
J6 D
OUT1−
, inverted LVDS output for Isolator Channel 1
J7 D
OUT2+
, noninverted LVDS output for Isolator Channel 2
J8 D
OUT2−
, inverted LVDS output for Isolator Channel 2
J21 Connects to Connector J22 (test trace for calibration)
J23
Connects to Connector J24 (test trace for calibration)
EVAL-ADN4650EB1Z User Guide UG-933
Rev. 0 | Page 5 of 9
RADIATED EMISSIONS TEST RESULTS (EN 55022)
SIGNAL
GENERATOR
10m COAX CABLE ×2
NOTES
1. SIGNAL GENERATOR OUTSIDE TEST CHAMBER
2. INPUT SIGNAL: |V
ID
| = 300mV, V
IC
= 1.1V, 600MBPS PRBS7 OR 300MHz CLOCK
13761-105
GND1
GND1
GND2
GND2
V
DD2
V
DD1
V
IN1
V
IN2
P4
R1
R12 R11 R10
R2
R4
R8
R5
R3
R7
TP8
TP7
TP9
TP10
R6
R9
J9
J1
J2
J3
J4
J5
J6
J7
J8
J10
J22
J21
32J42J
U1
P7
EVAL-ADN4650EB1Z
2 × AA BATTERY
3V TO 3.15V
2 × AA BATTERY
3V TO 3.15V
Figure 5. Test Setup for EN 55022 Radiated Emissions Testing
Radiated emissions testing is performed at an independent
external test facility with the EVAL-ADN4650EB1Z. Evaluating
the EVAL-ADN4650EB1Z to the EN 55022 standard is undertaken
in a 10 m radiated emissions test chamber using the test setup
shown in Figure 5. The setup comprises a battery-powered
EVAL-ADN4650EB1Z connected to a signal generator located
outside the chamber via coaxial cables. As specified by the
EN 55022 standard, both horizontal and vertical peak scans are
undertaken with any visible emissions peaks investigated using
quasi-peak detector measurement. For each frequency measured
using a quasi-peak detector, the device under test rotates through
360 degrees to find the worst case angle. The receiving antenna
then elevates from 1 m to 4 m in height to find the worst case
elevation. The worst case quasi-peak measurements are compared
to the EN 55022 Class B and Class A limits.
The test results are shown in Table 4; a classification report is
available on request (please contact Analog Devices or the
component distributor for support). Radiated emissions are
measured across 30 MHz to 1 GHz and from 1 GHz to 3 GHz.
With a 600 Mbps PRBS7 input, the EVAL-ADN4650EB1Z passes
the EN 55022 Class B limits.
With a 300 MHz clock input, the EVAL-ADN4650EB1Z passes
the EN 55022 Class A limits. To pass the Class B limits when
isolating high frequency clocks, reduce the printed circuit board
(PCB) clearance from the 8 mm implemented on EVAL-
ADN4650EB1Z to, for example, 2 mm.
Table 4. EN 55022 Radiated Emissions Classification
Test Condition Result
600 Mbps PRBS7 Passes EN 55022 Class B
300 MHz Clock Passes EN 55022 Class A
UG-933 EVAL-ADN4650EB1Z User Guide
Rev. 0 | Page 6 of 9
EVALUATION BOARD SCHEMATIC AND ARTWORK
13761-005
DECOUPLING
100NF
DNP
DNP
DNP
DNP
DNP
DNP
100NF
100
1UF
10UF
DNP
100NF
1UF
DNP
1UF
10UF
100NF
1UF
DNP
DNP
DNP
DNP
100
20 PIN SOIC WB
DNP
DNP
100
100
R7
P4
TP42TP41
P7
TP6
J23
J24
R9
R10
R11
R12
C8
C6
C7
C5
C12
J10
R6
C20
C19
R8
R5
R4
J21
J22
C4
C3
TP1
C2
C1
C11
C9
TP5
J9
C18
C17
R2
R1
J1
TP3
J2
R3
J4
TP2
J3
8J
C10
J5
J7
J6
TP40
U1
VIN1
VIN1
VIN2
VDD2
VDD1
VDD1
VIN2
15
14
13
12
11
10
9
8
7
6
5
4
3
2
1
2
1
2
1
NP
NP
19
16
18
20
17
AGND1
AGND2
AGND1
AGND1
AGND2
AGND2
AGND2
AGND2
AGND2
AGND2
AGND3
AGND1
AGND1
AGND1
AGN D1
TP9
TP8
TP7
01PT
Figure 6. EVAL-ADN4650EB1Z Schematic
13761-006
Figure 7. EVAL-ADN4650EB1Z Silkscreen

EVAL-ADN4650EBZ

Mfr. #:
Manufacturer:
Analog Devices Inc.
Description:
Interface Development Tools ADN4650 SSOP Evaluation Board
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
T/T Paypal Visa MoneyGram Western Union

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