Table 11: DDR2 I
DD
Specifications and Conditions – 1GB (Die Revision H) (Continued)
Values shown for MT47H64M16 DDR2 SDRAM only and are computed from values specified in the 1Gb (64 Meg x 16) com-
ponent data sheet
Parameter Symbol -800 -667 Units
Active standby current: All device banks open;
t
CK =
t
CK (I
DD
),
t
RAS =
t
RAS MAX
(I
DD
),
t
RP =
t
RP (I
DD
); CKE is HIGH, S# is HIGH between valid commands; Other control
and address bus inputs are switching; Data bus inputs are switching
I
DD3N
2
280 256 mA
Operating burst write current: All device banks open; Continuous burst writes; BL
= 4, CL = CL (I
DD
), AL = 0;
t
CK =
t
CK (I
DD
),
t
RAS =
t
RAS MAX (I
DD
),
t
RP =
t
RP (I
DD
); CKE is
HIGH, S# is HIGH between valid commands; Address bus inputs are switching; Data
bus inputs are switching
I
DD4W
1
668 568 mA
Operating burst read current: All device banks open; Continuous burst read, I
OUT
= 0mA; BL = 4, CL = CL (I
DD
), AL = 0;
t
CK =
t
CK (I
DD
),
t
RAS =
t
RAS MAX (I
DD
),
t
RP =
t
RP
(I
DD
); CKE is HIGH, S# is HIGH between valid commands; Address bus inputs are
switching; Data bus inputs are switching
I
DD4R
1
628 528 mA
Burst refresh current:
t
CK =
t
CK (I
DD
); REFRESH command at every
t
RFC (I
DD
) inter-
val; CKE is HIGH, S# is HIGH between valid commands; Other control and address bus
inputs are switching; Data bus inputs are switching
I
DD5
2
628 608 mA
Self refresh current: CK and CK# at 0V; CKE 0.2V; Other control and address bus
inputs are floating; Data bus inputs are floating
I
DD6
2
56 56 mA
Operating bank interleave read current: All device banks interleaving reads; I
OUT
= 0mA; BL = 4, CL = CL (I
DD
), AL =
t
RCD (I
DD
) - 1 ×
t
CK (I
DD
);
t
CK =
t
CK (I
DD
),
t
RC =
t
RC
(I
DD
),
t
RRD =
t
RRD (I
DD
),
t
RCD =
t
RCD (I
DD
); CKE is HIGH, S# is HIGH between valid
commands; Address bus inputs are stable during deselects; Data bus inputs are
switching
I
DD7
1
1068 948 mA
Notes:
1. Value calculated as one module rank in this operating condition; all other module ranks
in I
DD2P
(CKE LOW) mode.
2. Value calculated reflects all module ranks in this operating condition.
Table 12: DDR2 I
DD
Specifications and Conditions – 1GB (Die Revision M)
Values shown for MT47H64M16 DDR2 SDRAM only and are computed from values specified in the 1Gb (64 Meg x 16) com-
ponent data sheet
Parameter Symbol -800 -667 Units
Operating one bank active-precharge current:
t
CK =
t
CK (I
DD
),
t
RC =
t
RC (I
DD
),
t
RAS =
t
RAS MIN (I
DD
); CKE is HIGH, S# is HIGH between valid commands; Address bus
inputs are switching; Data bus inputs are switching
I
DD0
1
360 340 mA
Operating one bank active-read-precharge current: I
OUT
= 0mA; BL = 4, CL = CL
(I
DD
), AL = 0;
t
CK =
t
CK (I
DD
),
t
RC =
t
RC (I
DD
),
t
RAS =
t
RAS MIN (I
DD
),
t
RCD =
t
RCD (I
DD
);
CKE is HIGH, S# is HIGH between valid commands; Address bus inputs are switching;
Data pattern is same as I
DD4W
I
DD1
1
420 400 mA
Precharge power-down current: All device banks idle;
t
CK =
t
CK (I
DD
); CKE is LOW;
Other control and address bus inputs are stable; Data bus inputs are floating
I
DD2P
2
80 80 mA
Precharge quiet standby current: All device banks idle;
t
CK =
t
CK (I
DD
); CKE is
HIGH, S# is HIGH; Other control and address bus inputs are stable; Data bus inputs
are floating
I
DD2Q
2
208 208 mA
512MB, 1GB (x64, DR) 200-Pin DDR2 SODIMM
I
DD
Specifications
PDF: 09005aef831ec770
htf8c64_128x64hdz.pdf - Rev. E 4/14 EN
13
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2008 Micron Technology, Inc. All rights reserved.
Table 12: DDR2 I
DD
Specifications and Conditions – 1GB (Die Revision M) (Continued)
Values shown for MT47H64M16 DDR2 SDRAM only and are computed from values specified in the 1Gb (64 Meg x 16) com-
ponent data sheet
Parameter Symbol -800 -667 Units
Precharge standby current: All device banks idle;
t
CK =
t
CK (I
DD
); CKE is HIGH, S# is
HIGH; Other control and address bus inputs are switching; Data bus inputs are
switching
I
DD2N
2
240 208 mA
Active power-down current: All device banks open;
t
CK =
t
CK
(I
DD
); CKE is LOW; Other control and address bus inputs are stable;
Data bus inputs are floating
Fast PDN exit
MR[12] = 0
I
DD3P
2
240 224 mA
Slow PDN exit
MR[12] = 1
160 160
Active standby current: All device banks open;
t
CK =
t
CK (I
DD
),
t
RAS =
t
RAS MAX
(I
DD
),
t
RP =
t
RP (I
DD
); CKE is HIGH, S# is HIGH between valid commands; Other control
and address bus inputs are switching; Data bus inputs are switching
I
DD3N
2
304 288 mA
Operating burst write current: All device banks open; Continuous burst writes; BL
= 4, CL = CL (I
DD
), AL = 0;
t
CK =
t
CK (I
DD
),
t
RAS =
t
RAS MAX (I
DD
),
t
RP =
t
RP (I
DD
); CKE is
HIGH, S# is HIGH between valid commands; Address bus inputs are switching; Data
bus inputs are switching
I
DD4W
1
680 580 mA
Operating burst read current: All device banks open; Continuous burst read, I
OUT
= 0mA; BL = 4, CL = CL (I
DD
), AL = 0;
t
CK =
t
CK (I
DD
),
t
RAS =
t
RAS MAX (I
DD
),
t
RP =
t
RP
(I
DD
); CKE is HIGH, S# is HIGH between valid commands; Address bus inputs are
switching; Data bus inputs are switching
I
DD4R
1
640 540 mA
Burst refresh current:
t
CK =
t
CK (I
DD
); REFRESH command at every
t
RFC (I
DD
) inter-
val; CKE is HIGH, S# is HIGH between valid commands; Other control and address bus
inputs are switching; Data bus inputs are switching
I
DD5
2
680 660 mA
Self refresh current: CK and CK# at 0V; CKE 0.2V; Other control and address bus
inputs are floating; Data bus inputs are floating
I
DD6
2
56 56 mA
Operating bank interleave read current: All device banks interleaving reads; I
OUT
= 0mA; BL = 4, CL = CL (I
DD
), AL =
t
RCD (I
DD
) - 1 ×
t
CK (I
DD
);
t
CK =
t
CK (I
DD
),
t
RC =
t
RC
(I
DD
),
t
RRD =
t
RRD (I
DD
),
t
RCD =
t
RCD (I
DD
); CKE is HIGH, S# is HIGH between valid
commands; Address bus inputs are stable during deselects; Data bus inputs are
switching
I
DD7
1
1080 960 mA
Notes:
1. Value calculated as one module rank in this operating condition; all other module ranks
in I
DD2P
(CKE LOW) mode.
2. Value calculated reflects all module ranks in this operating condition.
Serial Presence-Detect
For the latest SPD data, refer to Micron's SPD page: www.micron.com/SPD.
Table 13: SPD EEPROM Operating Conditions
Parameter/Condition Symbol Min Max Units
Supply voltage V
DDSPD
1.7 3.6 V
Input high voltage: logic 1; All inputs V
IH
V
DDSPD
× 0.7 V
DDSPD
+ 0.5 V
Input low voltage: logic 0; All inputs V
IL
–0.6 V
DDSPD
× 0.3 V
512MB, 1GB (x64, DR) 200-Pin DDR2 SODIMM
Serial Presence-Detect
PDF: 09005aef831ec770
htf8c64_128x64hdz.pdf - Rev. E 4/14 EN
14
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2008 Micron Technology, Inc. All rights reserved.
Table 13: SPD EEPROM Operating Conditions (Continued)
Parameter/Condition Symbol Min Max Units
Output low voltage: I
OUT
= 3mA V
OL
0.4 V
Input leakage current: V
IN
= GND to V
DD
I
LI
0.1 3 µA
Output leakage current: V
OUT
= GND to V
DD
I
LO
0.05 3 µA
Standby current I
SB
1.6 4 µA
Power supply current, READ: SCL clock frequency = 100 kHz I
CCR
0.4 1 mA
Power supply current, WRITE: SCL clock frequency = 100 kHz I
CCW
2 3 mA
Table 14: SPD EEPROM AC Operating Conditions
Parameter/Condition Symbol Min Max Units Notes
SCL LOW to SDA data-out valid
t
AA 0.2 0.9 µs 1
Time bus must be free before a new transition can start
t
BUF 1.3 µs
Data-out hold time
t
DH 200 ns
SDA and SCL fall time
t
F 300 ns 2
SDA and SCL rise time
t
R 300 ns 2
Data-in hold time
t
HD:DAT 0 µs
Start condition hold time
t
HD:STA 0.6 µs
Clock HIGH period
t
HIGH 0.6 µs
Noise suppression time constant at SCL, SDA inputs
t
I 50 ns
Clock LOW period
t
LOW 1.3 µs
SCL clock frequency
t
SCL 400 kHz
Data-in setup time
t
SU:DAT 100 ns
Start condition setup time
t
SU:STA 0.6 µs 3
Stop condition setup time
t
SU:STO 0.6 µs
WRITE cycle time
t
WRC 10 ms 4
Notes:
1. To avoid spurious start and stop conditions, a minimum delay is placed between SCL = 1
and the falling or rising edge of SDA.
2. This parameter is sampled.
3. For a restart condition or following a WRITE cycle.
4. The SPD EEPROM WRITE cycle time (
t
WRC) is the time from a valid stop condition of a
write sequence to the end of the EEPROM internal ERASE/PROGRAM cycle. During the
WRITE cycle, the EEPROM bus interface circuit is disabled, SDA remains HIGH due to
pull-up resistance, and the EEPROM does not respond to its slave address.
512MB, 1GB (x64, DR) 200-Pin DDR2 SODIMM
Serial Presence-Detect
PDF: 09005aef831ec770
htf8c64_128x64hdz.pdf - Rev. E 4/14 EN
15
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2008 Micron Technology, Inc. All rights reserved.

MT8HTF12864HTZ-667H1

Mfr. #:
Manufacturer:
Micron
Description:
MODULE DDR2 SDRAM 1GB 200SODIMM
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
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