ICS854S202AYI-01 REV. A DECEMBER 18, 2012 4 ©2012 Integrated Device Technology, Inc.
ICS854S202I-01 Data Sheet 12:2, DIFFERENTIAL-TO-LVDS MULTIPLEXER
Table 3B. SEL_A Control Input Function Table
Table 3C. SEL_B Control Input Function Table
Control Input
Input Selected to QA, nQA
SELA_3 SELA_2 SELA_1 SELA_0
0000 CLK0, nCLK0 (default)
0001 CLK1, nCLK1
0010 CLK2, nCLK2
0011 CLK3, nCLK3
0100 CLK4, nCLK4
0101 CLK5, nCLK5
0110 CLK6, nCLK6
0111 CLK7, nCLK7
1000 CLK8, nCLK8
1001 CLK9, nCLK9
1010 CLK10, nCLK10
1011 CLK11, nCLK11
1100 Output at logic LOW
1101 Output at logic LOW
1110 Output at logic LOW
1111 Output at logic LOW
Control Input
Input Selected to QB, nQB
SELB_3 SELB_2 SELB_1 SELB_0
0000 CLK0, nCLK0 (default)
0001 CLK1, nCLK1
0010 CLK2, nCLK2
0011 CLK3, nCLK3
0100 CLK4, nCLK4
0101 CLK5, nCLK5
0110 CLK6, nCLK6
0111 CLK7, nCLK7
1000 CLK8, nCLK8
1001 CLK9, nCLK9
1010 CLK10, nCLK10
1011 CLK11, nCLK11
1100 Output at logic LOW
1101 Output at logic LOW
1110 Output at logic LOW
1111 Output at logic LOW
ICS854S202AYI-01 REV. A DECEMBER 18, 2012 5 ©2012 Integrated Device Technology, Inc.
ICS854S202I-01 Data Sheet 12:2, DIFFERENTIAL-TO-LVDS MULTIPLEXER
Absolute Maximum Ratings
NOTE: Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These ratings are stress
specifications only. Functional operation of product at these conditions or any conditions beyond those listed in the DC Characteristics or AC
Characteristics is not implied. Exposure to absolute maximum rating conditions for extended periods may affect product reliability.
Supply Voltage, V
DD
4.6V
Inputs, V
I
-0.5V to V
DD
+ 0.5V
Outputs, I
O
(LVDS)
Continuous Current
Surge Current
10mA
15mA
Package Thermal Impedance, T
JA
70.2qC/W (0 mps)
Storage Temperature, T
STG
-65qC to 150qC
Table 4A. Power Supply DC Characteristics, V
DD
= 2.5V ± 5%, T
A
= -40°C to 85°C
Table 4B. LVCMOS/LVTTL DC Characteristics, V
DD
= 2.5V ± 5%, T
A
= -40°C to 85°C
Table 4C. Differential DC Characteristics, V
DD
= 2.5V ± 5%, T
A
= -40°C to 85°C
NOTE 1: V
IL
should not be less than -0.3V.
NOTE 2: Common mode voltage is defined as V
IH.
Item Rating
Symbol Parameter T
est Conditions Minimum Typical Maximum Units
V
DD
Power Supply Voltage 2.375 2.5 2.625 V
I
DD
Power Supply Current 110 128 ma
Symbol Parameter Test Conditions Minimum Typical Maximum Units
V
IH
Input High Voltage 1.7 V
DD
+ 0.3 V
V
IL
Input Low Voltage -0.3 0.7 V
I
IH
Input High
Current
SELA_[3:0],
SELB_[3:0]
V
DD
= 2.625V 150 PA
OEA, OEB V
DD
= 2.625V 10 PA
I
IL
Input Low
Current
SELA_[3:0,
SELB_[3:0]
V
DD
= 2.625V, V
IN
= 0V -10 PA
OEA, OEB V
DD
= 2.625V, V
IN
= 0V -150 PA
Symbol Parameter Test Conditions Minimum Typical Maximum Units
I
IH
Input High
Current
CLK[0:11],
nCLK[0:11]
V
DD
= V
IN
= 2.625V 150 PA
I
IL
Input Low
Current
CLK[0:11] V
DD
= 2.625V, V
IN
= 0V -10 PA
nCLK[0:11] V
DD
= 2.625V, V
IN
= 0V -150 PA
V
PP
Peak-to-Peak Input Voltage; NOTE 1 0.15 1.5 V
V
CMR
Common Mode Input Voltage:
NOTE 1, 2
GND + 0.5 V
DD
– 0.7 V
ICS854S202AYI-01 REV. A DECEMBER 18, 2012 6 ©2012 Integrated Device Technology, Inc.
ICS854S202I-01 Data Sheet 12:2, DIFFERENTIAL-TO-LVDS MULTIPLEXER
Table 4D. LVDS DC Characteristics, V
DD
= 2.5V ± 5%, T
A
= -40°C to 85°C
Table 5. AC Characteristics, V
DD
= 2.5V ± 5%, T
A
= -40°C to 85°C
NOTE: Electrical parameters are guaranteed over the specified ambient operating temperature range. NOTE that phase noise may increase
slightly with higher operating temperature. However, they will remain in spec as long as the maximum transistor junction temperature is not
violated. The device will meet specifications after thermal equilibrium has been reached under these conditions.
NOTE 1: Measured from the differential input cross point to the differential output cross point.
NOTE 2: Defined as skew between outputs at the same supply voltage and with equal load conditions. Measured at the differential output
cross point.
NOTE 3: This parameter is defined in accordance with JEDEC Standard 65.
NOTE 4: Defined as skew between outputs on different devices operating a the same supply voltage, same frequency, same temperature and
with equal load conditions. Using the same type of input on each device, measured at the differential output cross point.
NOTE 5: Driving only one input clock.
NOTE 6: The output duty cycle will depend on the input duty cycle.
Symbol Parameter Test Conditions Minimum Typical Maximum Units
V
OD
Differential Output Voltage 247 454 mV
'V
OD
V
OD
Magnitude Change 50 mV
V
OS
Offset Voltage 1.2 1.4 V
'V
OS
V
OS
Magnitude Change 50 mV
Symbol Parameter Test Conditions Minimum Typical Maximum Units
f
OUT
Output Frequency 3GHz
tp
LH
Propagation Delay, Low to High;
NOTE 1
f
OUT
< 2GHz 450 660 1100 ps
f
OUT
> 2GHz 550 700 900 ps
tp
HL
Propagation Delay, High to Low;
NOTE 1
f
OUT
< 2GHz 450 660 1100 ps
f
OUT
> 2GHz 550 700 900 ps
tsk(o) Output Skew; NOTE 2, 3 25 50 ps
tsk(i) Input Skew; NOTE 3 25 100 ps
tsk(pp) Part-to-Part Skew; NOTE 3, 4 250 ps
tjit
Buffer Additive Phase Jitter, RMS;
refer to Additive Phase Jitter
section, NOTE 5
155.52MHz,
Integration Range:
12kHz - 20MHz
0.16 0.215 ps
t
R
/ t
F
Output Rise/Fall Time 20% to 80% 50 110 250 ps
odc Output Duty Cycle; NOTE 6 40 50 60 %
MUX
ISOLATION
MUX Isolation f
OUT
< 1.2GHz 75 dB

854S202AYI-01LF

Mfr. #:
Manufacturer:
IDT
Description:
Clock Drivers & Distribution 12:2 Differential LVDS Multiplexer
Lifecycle:
New from this manufacturer.
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