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74HC258DB,112
P1-P3
P4-P6
P7-P9
P10-P12
P13-P14
74HC258_4
© NXP B.V
. 2008. All rights reserved.
Product data sheet
Rev
. 04 — 14 April 2008
7 of 14
NXP Semiconductors
74HC258
Quad 2-input multiple
xer; 3-state; in
ver
ting
11.
W
avef
orms
Measurement points are given in
T
ab
le
8
.
V
OL
and V
OH
are typical output voltage le
vels that occur with the output load.
Fig 6.
Input (nI0, nI1 and S) to output (nY) propa
gation delays and output transition times
001aab970
S, nI0, nI1
input
nY output
V
M
V
OH
V
I
GND
V
OL
t
PHL
t
THL
t
TLH
t
PLH
V
M
Measurement points are given in
T
ab
le
8
.
V
OL
and V
OH
are typical output voltage le
vels that occur with the output load.
Fig 7.
Enable and disable times
V
M
OE input
output
LOW to OFF
OFF to LOW
output
HIGH to OFF
OFF to HIGH
V
M
001aab971
t
f
t
r
t
PLZ
V
M
t
PZL
t
PHZ
t
PZH
V
X
V
Y
outputs
enabled
outputs
disabled
outputs
enabled
V
OH
V
I
GND
GND
V
OL
V
CC
T
ab
le 8.
Measurement points
Input
Output
V
M
V
M
V
X
V
Y
0.5
×
V
CC
0.5
×
V
CC
0.1
×
V
CC
0.9
×
V
CC
74HC258_4
© NXP B.V
. 2008. All rights reserved.
Product data sheet
Rev
. 04 — 14 April 2008
8 of 14
NXP Semiconductors
74HC258
Quad 2-input multiple
xer; 3-state; in
ver
ting
T
est data is given in
T
able 9
.
Definitions test circuit:
R
T
= T
er
mination resistance should be equal to output impedance Z
o
of the pulse generator
.
C
L
= Load capacitance including jig and probe capacitance.
R
L
= Load resistance.
S1 = T
est selection switch.
Fig 8.
T
est circuit f
or measuring switching times
V
M
V
M
t
W
t
W
10 %
90 %
0 V
V
I
V
I
negative
pulse
positive
pulse
0 V
V
M
V
M
90 %
10 %
t
f
t
r
t
r
t
f
001aad983
DUT
V
CC
V
CC
V
I
V
O
R
T
R
L
S1
C
L
open
G
T
ab
le 9.
T
est data
Supply v
oltage
Input
Load
S1
V
CC
V
I
t
r
= t
f
C
L
R
L
t
PZL
, t
PLZ
t
PZH
, t
PHZ
t
PHL
, t
PLH
2.0 V
V
CC
6 ns
50 pF
1 k
Ω
V
CC
GND
open
4.5 V
V
CC
6 ns
50 pF
1 k
Ω
V
CC
GND
open
6.0 V
V
CC
6 ns
50 pF
1 k
Ω
V
CC
GND
open
5.0 V
V
CC
6 ns
15 pF
1 k
Ω
V
CC
GND
open
74HC258_4
© NXP B.V
. 2008. All rights reserved.
Product data sheet
Rev
. 04 — 14 April 2008
9 of 14
NXP Semiconductors
74HC258
Quad 2-input multiple
xer; 3-state; in
ver
ting
12.
P
acka
g
e outline
Fig 9.
P
acka
ge outline SO
T38-4 (DIP16)
REFERENCES
OUTLINE
VERSION
EUROPEAN
PROJECTION
ISSUE DATE
IEC
JEDEC
JEITA
SOT38-4
95-01-14
03-02-13
M
H
c
(e )
1
M
E
A
L
seating plane
A
1
w
M
b
1
b
2
e
D
A
2
Z
16
1
9
8
E
pin 1 index
b
0
5
10 mm
scale
Note
1. Plastic or metal protrusions of 0.25 mm (0.01 inch) maximum per side are not included.
UNIT
A
max.
12
b
1
(1)
(1)
(1)
b
2
cD
E
e
M
Z
H
L
mm
DIMENSIONS (inch dimensions are derived from the original mm dimensions)
A
min.
A
max.
b
max.
w
M
E
e
1
1.73
1.30
0.53
0.38
0.36
0.23
19.50
18.55
6.48
6.20
3.60
3.05
0.254
2.54
7.62
8.25
7.80
10.0
8.3
0.76
4.2
0.51
3.2
inches
0.068
0.051
0.021
0.015
0.014
0.009
1.25
0.85
0.049
0.033
0.77
0.73
0.26
0.24
0.14
0.12
0.01
0.1
0.3
0.32
0.31
0.39
0.33
0.03
0.17
0.02
0.13
DIP16: plastic dual in-line package; 16 leads (300 mil)
SOT38-4
P1-P3
P4-P6
P7-P9
P10-P12
P13-P14
74HC258DB,112
Mfr. #:
Buy 74HC258DB,112
Manufacturer:
NXP Semiconductors
Description:
IC QUAD 2-IN MUX 3ST INV 16-SSOP
Lifecycle:
New from this manufacturer.
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