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CPC7695ZC

P1-P3P4-P6P7-P9P10-P12P13-P15P16-P18P19-P21P22-P24P25-P25
I
NTEGRATED
C
IRCUITS
D
IVISION
CPC7695
10 www.ixysic.com R01
1.6.6 Ringing Test Switch: SW8
Parameter Test Conditions Symbol Minimum Typical Maximum Unit
Off-State
Leakage Current
V
SW8
(differential) = R
TESTin
to
R
RINGING
All-Off state.
+25°C,
V
SW
(differential) = -320V to GND
V
SW
(differential) = +320V to GND
I
SW
-
0.1
1 A
+85°C
V
SW
(differential) = -330V to GND
V
SW
(differential) = +330V to GND
0.3
-40°C
V
SW
(differential) = -310V to GND
V
SW
(differential) = +310V to GND
0.1
On-Resistance
I
SW
(on) = ±10mA, ±40mA
+25°C
R
ON
-
35 -
+85°C 50 70
-40°C 26 -
DC current limit
V
SW
(on) = ±10V
+25°C
I
SW
- 140 -
mA+85°C 80 100 -
-40°C - 210 250
Dynamic current limit
(t 0.5 s)
Ringing test switches on, all other
switches off. Apply ±1kV, 10x1000s
pulse with appropriate protection in
place.
I
SW
-2.5- A
Logic input to switch
output isolation
V
SW8
(R
RINGING
, R
TESTin
)
Logic inputs = GND
+25°C, V
SW
= ±320V
I
SW
-
0.1
1 A
+85°C, V
SW
= ±330V
0.3
-40°C, V
SW
= ±310V
0.1
Transient Immunity
100V
PP
Square Wave, 100Hz
(Not production tested - limits are
guaranteed by design and quality
control sampling audits.)
dV/dt 1500 2100 - V/s
I
NTEGRATED
C
IRCUITS
D
IVISION
CPC7695
R01 www.ixysic.com 11
1.6.7 TESTin Switches: SW9 and SW10
Parameter Test Conditions Symbol Minimum Typical Maximum Unit
Off-state leakage
current
V
SW9
(differential) = T
TESTin
to T
BAT
V
SW10
(differential) = R
TESTin
to R
BAT
All-Off state.
+25°C,
V
SW
(differential) = -320V to GND
V
SW
(differential) = +260V to -60V
I
SW
-
0.1
1 A
+85°C,
V
SW
(differential) = -330V to GND
V
SW
(differential) =+270V to -60V
0.3
-40°C,
V
SW
(differential) = -310V to GND
V
SW
(differential) = +250V to -60V
0.1
On-Resistance
I
SW
(on) = ±10mA, ±40mA
+25°C
R
ON
-
35 -
+85°C 50 70
-40°C 26 -
DC current limit
V
SW
(on) = ±10V
+25°C
I
SW
- 160 -
mA+85°C 80 110 -
-40°C - 210 250
Logic input to switch
output isolation
Logic inputs = GND
+25°C, V
SW
(T
TESTin
, R
TESTin
) = ±320V
I
SW
-
0.1
1 A
+85°C, V
SW
(T
TESTin
, R
TESTin
) = ±330V
0.3
-40°C, V
SW
(T
TESTin
, R
TESTin
) = ±310V
0.1
Transient Immunity
100V
PP
Square Wave, 100Hz
(Not production tested - limits are
guaranteed by design and quality
control sampling audits.)
dV/dt 1500 2100 - V/s
I
NTEGRATED
C
IRCUITS
D
IVISION
CPC7695
12 www.ixysic.com R01
1.7 Digital I/O Electrical Specifications
Parameter Test Conditions Symbol Minimum Typical Maximum Unit
Input Characteristics
Input voltage, Logic low Input voltage falling
V
IL
0.8 1.1 -
V
Input voltage, Logic high Input voltage rising
V
IH
-1.72.0
Input leakage current,
IN
RINGING
, IN
TESTin
,
and IN
TESTout
Logic high
V
DD
= 5.5V, V
BAT
= -75V, V
IH
= 2.4V I
IH
-0.11A
Input leakage current,
IN
RINGING
, IN
TESTin
,
and IN
TESTout
Logic low
V
DD
= 5.5V, V
BAT
= -75V, V
IL
= 0.4V I
IL
-0.11A
Input leakage current,
LATCH Logic high
V
DD
= 4.5V, V
BAT
= -75V, V
IH
= 2.4V I
IH
10 19 - A
Input leakage current,
LATCH Logic low
V
DD
= 5.5V, V
BAT
= -75V, V
IL
= 0.4V I
IL
- 47 125 A
Input leakage current,
T
SD
Logic high
V
DD
= 5.5V, V
BAT
= -75V, V
IH
= V
DD
I
IH
10 16 30 A
Input leakage current,
T
SD
Logic low
V
DD
= 5.5V, V
BAT
= -75V, V
IL
= 0.4V I
IL
10 16 30 A
Output Characteristics
Output voltage,
T
SD
Logic high
V
DD
= 5.5V, V
BAT
= -75V, I
TSD
= 10AV
TSD_off
2.4
V
DD
-V
Output voltage,
T
SD
Logic low
V
DD
= 5.5V, V
BAT
= -75V, I
TSD
= 1mA
(Not production tested - limits are
guaranteed by design and quality
control sampling audits.)
V
TSD_on
-00.4V
P1-P3P4-P6P7-P9P10-P12P13-P15P16-P18P19-P21P22-P24P25-P25

CPC7695ZC

Mfr. #:
Buy CPC7695ZC
Manufacturer:
IXYS Integrated Circuits
Description:
Switch ICs - Various LCASw/Protection SCR 20-Pin SOIC, MTS
Lifecycle:
New from this manufacturer.
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