6N138, 6N139
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Vishay Semiconductors
Rev. 1.6, 23-Jan-15
4
Document Number: 83605
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Fig. 1 - Switching Test Circuit
Notes
(1)
Common mode transient immunity in logic high level is the maxium tolerable (positive) dVcm/dt on the leading edge of the common mode
pulse, V
CM
, to assure that the output will remain in a logic high state (i.e. V
O
> 2 V) common mode transient immunity in logic low level is
the maximum tolerable (negative) dVcm/dt on the trailing edge of the common mode pulse signal, V
CM
to assure that the output will remain
in a logic low state (i.e. V
O
< 0.8 V).
(2)
In applications where dV/dt may exceed 50 000 V/μs (such as state discharge) a series resistor, R
CC
should be included to protect I
C
from
destructively high surge currents. The recommend value is R
CC
≅ [(1 V)/(0.15 I
F
(mA)] kΩ
Fig. 2 - Test Circuit for Transient Immunity and Typical Waveforms
COMMON MODE TRANSIENT IMMUNITY
PARAMETER TEST CONDITION PART SYMBOL MIN. TYP. MAX. UNIT
Common mode transient
immunity, logic high level
output
(1)(2)
I
F
= 0 mA, R
L
= 2.2 kΩ,
R
CC
= 0, |V
CM
| = 10 V
P-P
|CM
H
| 500 V/μs
Common mode transient
immunity, logic low level
output
(1)(2)
I
F
= 16 mA, R
L
= 2.2 kΩ,
R
CC
= 0, |V
CM
| = 10 V
P-P
|CM
L
| - 500 V/μs
isfh6318t_01
Pulse
generator
Z
O
=50 Ω
t
r
=5ns
I
F
= monitor
10 % duty cycle
1/f < 100 µs
I
F
R
L
V
O
C
L
= 15 pF
0.1 µF
+ 5 V
R
m
1
2
3
4
8
7
6
5
t
r
5V
10 %
V
t
PLH
t
PHL
5V
V
OL
90 %
0
I
(saturated
response)
1.5 V
1.5 V
(non-saturated
response)
V
O
t
f
10 %
90 %
isfh6318t_02
1
2
3
4
8
7
6
5
I
F
R
L
V
O
0.1 µF
+ 5 V
V
CM
220 Ω
Pulse Generator
+–
V
CC
A
B
R
CC
(see Note 6)
V
CM
V
O
5V
0V
90 %
10 %
10 %
t
r
t
f
Switch at A: I
F
=0mA
Switch at B: I
F
= 1.6 mA
90 %
V
OL
V
O
t
f
+t
f
=16 ns
