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STGB7NB40LZT4

P1-P3P4-P6P7-P8
Obsolete Product(s) - Obsolete Product(s) Obsolete Product(s) - Obsolete Product(s)
STGB7NB40LZ
4/8
Capacitance Variations
Normalized Collector-Emitter On Voltage vs
Temperature
Normalized Break-down Voltage vs Temp. Clamping Voltage vs Gate Resistance
Gate-Charge vs Gate-Emitter Voltage
Collector-Emitter On Voltage vs Gate-Emitter
Voltage
Obsolete Product(s) - Obsolete Product(s) Obsolete Product(s) - Obsolete Product(s)
5/8
STGB7NB40LZ
Fig. 4: Gate Charge test CircuitFig. 3: Test Circuit For Inductive Load Switching
And Diode Recovery Times
Fig. 2: Unclamped Inductive WaveformFig. 1: Unclamped Inductive Load Test Circuit
Obsolete Product(s) - Obsolete Product(s) Obsolete Product(s) - Obsolete Product(s)
STGB7NB40LZ
6/8
1
DIM.
mm. inch
MIN. TYP MAX. MIN. TYP. MAX.
A 4.4 4.6 0.173 0.181
A1 2.49 2.69 0.098 0.106
A2 0.03 0.23 0.001 0.009
B 0.7 0.93 0.027 0.036
B2 1.14 1.7 0.044 0.067
C 0.45 0.6 0.017 0.023
C2 1.23 1.36 0.048 0.053
D 8.95 9.35 0.352 0.368
D1 8 0.315
E 10 10.4 0.393
E1 8.5 0.334
G 4.88 5.28 0.192 0.208
L 15 15.85 0.590 0.625
L2 1.27 1.4 0.050 0.055
L3 1.4 1.75 0.055 0.068
M 2.4 3.2 0.094 0.126
R 0.4 0.015
V2 0º 8º
D
2
PAK MECHANICAL DATA
3
P1-P3P4-P6P7-P8

STGB7NB40LZT4

Mfr. #:
Buy STGB7NB40LZT4
Manufacturer:
STMicroelectronics
Description:
IGBT 430V 14A 100W D2PAK
Lifecycle:
New from this manufacturer.
Delivery:
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