74LVC2GU04 All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2017. All rights reserved.
Product data sheet Rev. 10 — 10 February 2017 6 of 19
NXP Semiconductors
74LVC2GU04
Dual unbuffered inverter
11. Dynamic characteristics
[1] Typical values are measured at T
amb
=25C and V
CC
= 1.8 V, 2.5 V, 2.7 V, 3.3 V and 5.0 V respectively.
[2] t
pd
is the same as t
PLH
and t
PHL
.
[3] C
PD
is used to determine the dynamic power dissipation (P
D
in W).
P
D
=C
PD
V
CC
2
f
i
N+(C
L
V
CC
2
f
o
) where:
f
i
= input frequency in MHz;
f
o
= output frequency in MHz;
C
L
= output load capacitance in pF;
V
CC
= supply voltage in V;
N = number of inputs switching;
(C
L
V
CC
2
f
o
) = sum of outputs.
12. Waveforms
Table 8. Dynamic characteristics
Voltages are referenced to GND (ground = 0 V). For test circuit see Figure 8.
Symbol Parameter Conditions 40 C to +85 C 40 C to +125 C Unit
Min Typ
[1]
Max Min Max
t
pd
propagation delay nA to nY; see Figure 7
[2]
V
CC
= 1.65 V to 1.95 V 0.5 2.3 5.0 0.5 6.3 ns
V
CC
= 2.3 V to 2.7 V 0.3 1.8 4.0 0.3 5.0 ns
V
CC
= 2.7 V 0.3 2.6 4.5 0.3 5.6 ns
V
CC
= 3.0 V to 3.6 V 0.3 2.3 3.7 0.3 4.5 ns
V
CC
= 4.5 V to 5.5 V 0.3 1.7 3.0 0.3 3.8 ns
C
PD
power dissipation
capacitance
V
I
= GND to V
CC
; V
CC
= 3.3 V
[3]
-7.8- pF
Measurement points are given in Table 9.
V
OL
and V
OH
are typical output voltage drop that occur with the output load.
Fig 7. The input (nA) to output (nY) propagation delay times
PQD
W
3+/
W
3/+
9
0
9
0
9
0
9
0
Q$LQSXW
Q<RXWSXW
*1'
9
,
9
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9
2/
74LVC2GU04 All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2017. All rights reserved.
Product data sheet Rev. 10 — 10 February 2017 7 of 19
NXP Semiconductors
74LVC2GU04
Dual unbuffered inverter
Table 9. Measurement points
Supply voltage Input Output
V
CC
V
M
V
M
1.65 V to 1.95 V 0.5 V
CC
0.5 V
CC
2.3 V to 2.7 V 0.5 V
CC
0.5 V
CC
2.7V 1.5V 1.5V
3.0V to 3.6V 1.5V 1.5V
4.5 V to 5.5 V 0.5 V
CC
0.5 V
CC
Test data is given in Table 10.
Definitions for test circuit:
R
L
= Load resistance.
C
L
= Load capacitance including jig and probe capacitance.
R
T
= Termination resistance should be equal to the output impedance Z
o
of the pulse generator.
V
EXT
= External voltage for measuring switching times.
Fig 8. Test circuit for measuring switching times
9
(;7
9
&&
9
,
9
2
PQD
'87
&
/
5
7
5
/
5
/
*
Table 10. Test data
Supply voltage Input Load V
EXT
V
CC
V
I
t
r
=t
f
C
L
R
L
t
PLH
, t
PHL
1.65 V to 1.95 V V
CC
2.0ns 30pF 1k open
2.3 V to 2.7 V V
CC
2.0ns 30pF 500 open
2.7V 2.7V 2.5ns 50pF 500 open
3.0V to 3.6V 2.7V 2.5ns 50pF 500 open
4.5 V to 5.5 V V
CC
2.5ns 50pF 500 open
74LVC2GU04 All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2017. All rights reserved.
Product data sheet Rev. 10 — 10 February 2017 8 of 19
NXP Semiconductors
74LVC2GU04
Dual unbuffered inverter
T
amb
= 25 C.
f
i
= 1 kHz.
V
O
is constant.
Fig 9. Typical forward transconductance as a
function of supply voltage
Fig 10. Test set-up for measuring forward
transconductance

9
&&
9




J
IV
P$9
PQE
PQD
9
&&
5
ELDV
 
LQSXW
)
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RXWSXW
$
,
2
9
,
g
fs
I
O
V
I
---------
=

74LVC2GU04GW,125

Mfr. #:
Manufacturer:
Nexperia
Description:
Inverters 3.3V DUAL INVERTER
Lifecycle:
New from this manufacturer.
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