TLP117(F)

TLP117
2014-09-01
4
Switching Characteristics
(Unless otherwise specified, Ta=-40 to 105°C, V
CC
=4.5 to 5.5V)
Characteristic Symbol
Tes t
Circuit
Conditions Min Typ. Max Unit
Propagation delay time
to logic high output
t
pHL
5
V
IN
= 0 5V
R
IN
=360Ω
C
IN
=22pF
V
L
=0V
(Note 5)
— —
30 ns
Propagation delay time
to logic low output
t
pLH
V
IN
= 5 0V — —
30 ns
Switching time dispersion
between ON and OFF
|t
pHL
t
pLH
|
V
IN
= 5V
10 ns
Output fall time (90-10%) t
f
V
IN
= 0 5V
3
ns
Output rise time (10-90%) t
r
V
IN
= 5 0V
2
ns
Propagation delay time
to logic high output
t
pHL
6
V
IN
= 1.1 5V
R
IN
=360Ω
C
IN
=22pF
VL=1.1V
(Note 5)
20
ns
Propagation delay time
to logic low output
t
pLH
V
IN
= 5 1.1V
20
ns
Propagation delay skew T
psk
16
ns
Switching time dispersion
between ON and OFF
|t
pHL
t
pLH
|
2
8 ns
Output fall time (90-10%) T
f
V
IN
= 1.1 5V
3
ns
Output rise time (10-90%) t
r
V
IN
= 5 1.1V
3
ns
Data rate T
50
MBd
Common mode transient
immunity at high Level
output
CM
H
7
V
CM
=1000V
p-p
, Ta=25°C
I
F
=0mA, V
CC
=5V, V
O
(Min)=4V,
10000
— —
V/μs
Common mode transient
immunity at low level
output
CM
L
V
CM
=1000Vp-p, ,Ta=25°C
I
F
=10mA, V
CC
=5V, V
O
(Max)=0.4V
-10000
— —
V/μs
*All typical values are at Ta=25°C, V
CC
=5V.
Note 5: C
L
is approximately 15pF which includes probe and Jig/stray wiring capacitance.
Note 6: This product has an automatic threshold control (ATC) circuit in order to reduce input current dependence of
its switching time. The ATC circuit may not be able to respond accordingly when an input signal is driven after
a prolonged absence of signals to the product. As a result, switching operation, pertaining to the first pulse of
an input signal, could be unstable. Theoretically however, stable switching operation should be achievable
from the second pulse onwards. As such, please check the switching operation and take the appropriate
measures when designing applications in which this product shall be used.
TLP117
2014-09-01
5
TEST CIRCUIT 1: V
OL
TEST CIRCUIT 2: V
OH
TEST CIRCUIT 3: I
CCL
TEST CIRCUIT 4: I
CCH
TEST CIRCUIT 5: tpHL , tpLH
V
CC
IF
V
CC
GND
SHIELD
0.1μF
V
OL
1
3
6
5
4
V
I
OL
V
CC
V
CC
GND
SHIELD
0.1μF
V
OH
1
3
6
5
4
V
I
OH
1
6
V
CC
GND
SHIELD
3
5
4
I
CCL
A
IF
V
CC
V
CC
GND
SHIELD
V
CC
1
3
6
5
4
I
CCH
A
V
CC
*CL=15pF
0.1μF
R
IN
=360
*CL=15pF
V
CC
GND
SHIELD
INPUT MONITORING NODE
V
IN
=05V(P.G)
(f=25MHz , duty=50%)
CL is capacitance of the probe and JIG.
(P.G): Pulse Generator
Vo
MONITORING
NODE
C
IN
=22pF
10%
90%
tpHL
tpLH
50%
V
OL
V
OH
tf
tr
10%
90%
50%
VL=0V
GND
tr=4.5ns tf=4.5ns
V
IN
V
O
0.1μF
0.1μF
TLP117
2014-09-01
6
TEST CIRCUIT 6: tpHL , tpLH
(example for LED drive circuit)
TEST CIRCUIT 7: Common-Mode Transient Immunity Test Circuit
CM
L
CM
H
V
CM
10%
90%
1000V
・SW B : I
F
=0mA
0.4V
4V
tr
tf
・SW A : I
F
=10mA
)(
)(800
s
t
r
V
H
CM
μ
=
)(
)(800
s
t
f
V
L
CM
μ
=
0.1μF
V
O
V
CC
SW
IF
1
3
6
5
4
V
CM
B
V
CC
GND
SHIELD
A
10%
90%
tpHL
tpLH
V
IN
V
O
50%
V
OL
VOH
tf
tr
10%
90%
50%
GND
tf=4.5ns
VL=1.1V
tr=4.5ns
V
CC
*CL=15pF
0.1μF
R
IN
=360
*CL=15pF
V
CC
GND
SHIELD
INPUT MONITORING NODE
V
IN
=1.15V(P.G)
(f=25MHz , duty=50%)
CL is capacitance of the probe and JIG.
(P.G) : Pulse Generator
Vo
MONITORING
NODE
C
IN
=22pF
CIN=22pF
C
IN
22
0.1μF
*CL=15pF
V
CC
GND
VCC
GND
P. G
5V
f=25MHz
SHIELD
R
IN1
=300
R
IN2
=180
R
IN3
=1.6k
TC7SZ08F/FU
C
IN
=47pF
INPUT MONITORING NODE
Vo
MONITORING
NODE
V
CC
CL is capacitance of the probe and JIG.
(P.G) : Pulse Generator

TLP117(F)

Mfr. #:
Manufacturer:
Toshiba
Description:
High Speed Optocouplers IC cplr 50Mbps Inverter logic
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
T/T Paypal Visa MoneyGram Western Union

Products related to this Datasheet