ICS8305 Data Sheet LOW SKEW, 1-TO-4 MULTIPLEXED DIFFERENTIAL/LVCMOS-TO-LVCMOS/LVTTL FANOUT BUFFER
ICS8305AG REVISION C
MAY 30, 2014 7 ©2014 Integrated Device Technology, Inc.
Table 5C. AC Characteristics, V
DD
= 3.3V ± 5%, V
DDO
= 1.8V ± 0.15V, T
A
= 0°C to 70°C
NOTE: Electrical parameters are guaranteed over the specified ambient operating temperature range, which is established when the device is
mounted in a test socket with maintained transverse airflow greater than 500 lfpm. The device will meet specifications after thermal equilibrium
has been reached under these conditions.
All parameters measured at ƒ 350MHz unless noted otherwise.
NOTE 1A: Measured from the V
DD
/2 of the input to V
DDO
/2 of the output.
NOTE 1B: Measured from the differential input crossing point to V
DDO
/2 of the output.
NOTE 2: Defined as skew between outputs at the same supply voltage and with equal load conditions. Measured at V
DDO
/2.
NOTE 3: Defined as skew between outputs on different devices operating a the same supply voltages and with equal load conditions. Using
the same type of input on each device, the output is measured at V
DDO
/2.
NOTE 4: These parameters are guaranteed by characterization. Not tested in production.
NOTE 5: Driving only one input clock.
NOTE 6: This parameter is defined in accordance with JEDEC Standard 65.
Table 5D. AC Characteristics, V
DD
= 3.3V ± 5%, V
DDO
= 1.5V ± 5%, T
A
= 0°C to 70°C
For NOTES, see Table 5C above.
Parameter Symbol Test Conditions Minimum Typical Maximum Units
f
MAX
Output Frequency 350 MHz
tp
LH
Propagation
Delay,
Low to High
LVCMOS_CLK;
NOTE 1A
CLK/nCLK;
NOTE 1B
1.95 3.65 ns
tsk(o) Output Skew; NOTE 2, 6 Measured on the Rising Edge 35 ps
tsk(pp) Part-to-Part Skew; NOTE 3, 6 900 ps
tjit
Buffer Additive Phase Jitter, RMS;
refer to Additive Phase Jitter
Section, NOTE 5
0.04 ps
t
R
/ t
F
Output Rise/Fall Time; NOTE 4 20% to 80% 100 700 ps
odc Output Duty Cycle
Ref = CLK/nCLK 44 56 %
Ref = LVCMOS_CLK, ƒ 300MHz 44 56 %
t
EN
Output Enable Time; NOTE 4 5ns
t
DIS
Output Disable Time; NOTE 4 5ns
Parameter Symbol Test Conditions Minimum Typical Maximum Units
f
MAX
Output Frequency 350 MHz
tp
LH
Propagation
Delay,
Low to High
LVCMOS_CLK;
NOTE 1A
CLK/nCLK;
NOTE 1B
24ns
tsk(o) Output Skew; NOTE 2, 6 Measured on the Rising Edge 35 ps
tsk(pp) Part-to-Part Skew; NOTE 3, 6 1ns
tjit
Buffer Additive Phase Jitter, RMS;
refer to Additive Phase Jitter
Section, NOTE 5
0.04 ps
t
R
/ t
F
Output Rise/Fall Time; NOTE 4 20% to 80% 200 900 ps
odc Output Duty Cycle
ƒ 166MHz 45 55 %
ƒ > 166MHz 42 58 %
t
EN
Output Enable Time; NOTE 4 5ns
t
DIS
Output Disable Time; NOTE 4 5ns
ICS8305 Data Sheet LOW SKEW, 1-TO-4 MULTIPLEXED DIFFERENTIAL/LVCMOS-TO-LVCMOS/LVTTL FANOUT BUFFER
ICS8305AG REVISION C
MAY 30, 2014 8 ©2014 Integrated Device Technology, Inc.
Additive Phase Jitter
The spectral purity in a band at a specific offset from the fundamental
compared to the power of the fundamental is called the dBc Phase
Noise. This value is normally expressed using a Phase noise plot
and is most often the specified plot in many applications. Phase noise
is defined as the ratio of the noise power present in a 1Hz band at a
specified offset from the fundamental frequency to the power value of
the fundamental. This ratio is expressed in decibels (dBm) or a ratio
of the power in the 1Hz band to the power in the fundamental. When
the required offset is specified, the phase noise is called a dBc value,
which simply means dBm at a specified offset from the fundamental.
By investigating jitter in the frequency domain, we get a better
understanding of its effects on the desired application over the entire
time record of the signal. It is mathematically possible to calculate an
expected bit error rate given a phase noise plot.
As with most timing specifications, phase noise measurements has
issues relating to the limitations of the equipment. Often the noise
floor of the equipment is higher than the noise floor of the device. This
is illustrated above. The device meets the noise floor of what is
shown, but can actually be lower. The phase noise is dependent on
the input source and measurement equipment.
SSB Phase Noise dBc/Hz
Offset Frequency (Hz)
100 1k 10k 100k 1M 10M 100M
0
-10
-20
-30
-40
-50
-60
-70
-80
-90
-100
-110
-120
-130
-140
-150
-160
-170
-180
-190
Additive Phase Jitter at 155.52MHz
= 0.04ps (typical)
ICS8305 Data Sheet LOW SKEW, 1-TO-4 MULTIPLEXED DIFFERENTIAL/LVCMOS-TO-LVCMOS/LVTTL FANOUT BUFFER
ICS8305AG REVISION C
MAY 30, 2014 9 ©2014 Integrated Device Technology, Inc.
Parameter Measurement Information
3.3V Core/3.3V LVCMOS Output Load AC Test Circuit
3.3V Core/1.8V LVCMOS Output Load AC Test Circuit
Differential Input Level
3.3V Core/2.5V LVCMOS Output Load AC Test Circuit
3.3V Core/1.5V LVCMOS Output Load AC Test Circuit
Output Skew
SCOPE
Qx
LVCMOS
C
L
25pF*
*For t
R
/t
F
measurement only
V
DD,
1.65V±5%
-1.65V±5%
V
DDO
SCOPE
Qx
GND
V
DDO
V
DD
0.9V±0.075V
-0.9V±0.075V
2.4V±0.09V
V
DD
GND
V
CMR
Cross Points
V
PP
nCLK
CLK
SCOPE
Qx
GND
V
DD
1.25V±5%
-1.25V±5%
V
DDO
2.05V±5%
SCOPE
Qx
GND
V
DDO
V
DD
0.75V±5%
-0.9V±0.75V
2.55V±5%
Qx
Qy
tsk(b)
V
CCO
2
V
CCO
2

8305AGLFT

Mfr. #:
Manufacturer:
IDT
Description:
Clock Drivers & Distribution 1:4 Multiplex Diff/L VCMOS to LVCMOS/LVTT
Lifecycle:
New from this manufacturer.
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