APT11GF120KRG

052-6213 Rev C 1-2006
APT11GF120KR(G)
TYPICAL PERFORMANCE CURVES
MAXIMUM RATINGS All Ratings: T
C
= 25°C unless otherwise specified.
STATIC ELECTRICAL CHARACTERISTICS
Characteristic / Test Conditions
Collector-Emitter Breakdown Voltage (V
GE
= 0V, I
C
= 400µA)
Gate Threshold Voltage (V
CE
= V
GE
, I
C
= 350µA, T
j
= 25°C)
Collector-Emitter On Voltage (V
GE
= 15V, I
C
= 8A, T
j
= 25°C)
Collector-Emitter On Voltage (V
GE
= 15V, I
C
= 8A, T
j
= 125°C)
Collector Cut-off Current (V
CE
= 1200V, V
GE
= 0V, T
j
= 25°C)
2
Collector Cut-off Current (V
CE
= 1200V, V
GE
= 0V, T
j
= 125°C)
2
Gate-Emitter Leakage Current (V
GE
= ±20V)
Symbol
V
(BR)CES
V
GE(TH)
V
CE(ON)
I
CES
I
GES
Units
Volts
µA
nA
Symbol
V
CES
V
GE
I
C1
I
C2
I
CM
SSOA
P
D
T
J
,T
STG
T
L
APT11GF120KR(G)
1200
±30
25
14
44
44A @ 1200V
156
-55 to 150
300
UNIT
Volts
Amps
Watts
°C
Parameter
Collector-Emitter Voltage
Gate-Emitter Voltage
Continuous Collector Current @ T
C
= 25°C
Continuous Collector Current @ T
C
= 100°C
Pulsed Collector Current
1
Switching Safe Operating Area @ T
J
= 150°C
Total Power Dissipation
Operating and Storage Junction Temperature Range
Max. Lead Temp. for Soldering: 0.063" from Case for 10 Sec.
APT Website - http://www.advancedpower.com
CAUTION: These Devices are Sensitive to Electrostatic Discharge. Proper Handling Procedures Should Be Followed.
MIN TYP MAX
1200
4.5 5.5 6.5
2.5 3.0
3.1
400
2000
±100
The Fast IGBT is a new generation of high voltage power IGBTs. Using Non-Punch through
technology, the Fast IGBT combined with an APT free wheeling Ultra Fast Recovery Epi
-
taxial Diode (FRED) offers superior ruggedness and fast switching speed.
Low Forward Voltage Drop • High Freq. Switching to 20KHz
RBSOA and SCSOA Rated Ultra Low Leakage Current
Ultrafast Soft Recovery Anti-parallel Diode
FAST IGBT & FRED
®
1200V
APT11GF120KR
APT11GF120KRG*
*G Denotes RoHS Compliant, Pb Free Terminal Finish.
TO-220
G
C
E
052-6213 Rev C 1-2006
APT11GF120KR(G)
THERMAL AND MECHANICAL CHARACTERISTICS
UNIT
°C/W
gm
MIN TYP MAX
.80
N/A
5.9
Characteristic
Junction to Case (IGBT)
Junction to Case (DIODE)
Package Weight
Symbol
R
θ
JC
R
θ
JC
W
T
DYNAMIC CHARACTERISTICS
Symbol
C
ies
C
oes
C
res
V
GEP
Q
g
Q
ge
Q
gc
SSOA
t
d(on)
t
r
t
d(off)
t
f
E
on1
E
on2
E
off
t
d(on)
t
r
t
d(off)
t
f
E
on1
E
on2
E
off
Test Conditions
Capacitance
V
GE
= 0V, V
CE
= 25V
f = 1 MHz
Gate Charge
V
GE
= 15V
V
CE
= 600V
I
C
= 8A
T
J
= 150°C, R
G
= 10Ω, V
GE
=
15V, L = 100µH,V
CE
= 1200V
Inductive Switching (25°C)
V
CC
= 800V
V
GE
= 15V
I
C
= 8A
R
G
= 10
T
J
= +25°C
Inductive Switching (125°C)
V
CC
= 800V
V
GE
= 15V
I
C
= 8A
R
G
= 10
T
J
= +125°C
Characteristic
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
Gate-to-Emitter Plateau Voltage
Total Gate Charge
3
Gate-Emitter Charge
Gate-Collector ("Miller ") Charge
Switching Safe Operating Area
Turn-on Delay Time
Current Rise Time
Turn-off Delay Time
Current Fall Time
Turn-on Switching Energy
4
Turn-on Switching Energy (Diode)
5
Turn-off Switching Energy
6
Turn-on Delay Time
Current Rise Time
Turn-off Delay Time
Current Fall Time
Turn-on Switching Energy
4
4
Turn-on Switching Energy (Diode)
55
Turn-off Switching Energy
6
MIN TYP MAX
620
90
40
10.0
65
10
35
44
7
5
100
55
300
485
285
7
5
115
46
295
915
325
UNIT
pF
V
nC
A
ns
µJ
ns
µJ
1
Repetitive Rating: Pulse width limited by maximum junction temperature.
2
For Combi devices, I
ces
includes both IGBT and FRED leakages
3
See MIL-STD-750 Method 3471.
4
E
on1
is the clamped inductive turn-on energy of the IGBT only, without the effect of a commutating diode reverse recovery current
adding to the IGBT turn-on loss. Tested in inductive switching test circuit shown in figure 21, but with a Silicon Carbide diode.
5
E
on2
is the clamped inductive turn-on energy that includes a commutating diode reverse recovery current in the IGBT turn-on switching
loss. (See Figures 21, 22.)
6
E
off
is the clamped inductive turn-off energy measured in accordance with JEDEC standard JESD24-1. (See Figures 21, 23.)
APT Reserves the right to change, without notice, the specifications and information contained herein.
052-6213 Rev C 1-2006
APT11GF120KR(G)
TYPICAL PERFORMANCE CURVES
V
GS(TH)
, THRESHOLD VOLTAGE V
CE
, COLLECTOR-TO-EMITTER VOLTAGE (V) I
C
, COLLECTOR CURRENT (A) I
C
, COLLECTOR CURRENT (A)
(NORMALIZED)
I
C,
DC COLLECTOR CURRENT(A) V
CE
, COLLECTOR-TO-EMITTER VOLTAGE (V) V
GE
, GATE-TO-EMITTER VOLTAGE (V) I
C
, COLLECTOR CURRENT (A)
250µs PULSE
TEST<0.5 % DUTY
CYCLE
30
25
20
15
10
5
0
30
25
20
15
10
5
0
6
5
4
3
2
1
0
1.15
1.10
1.05
1.00
0.95
0.90
0.85
0.80
0.75
0.70
0 1 2 3 4 5 6 7 0 5 10 15
0 2 4 6 8 10 12 14 0 10 20 30 40 50 60 70 80
8 10 12 14 16 0 25 50 75 100 125 150
-50 -25 0 25 50 75 100 125 150 -50 -25 0 25 50 75 100 125 150
40
35
30
25
20
15
10
5
0
16
14
12
10
8
6
4
2
0
5.0
4.5
4.0
3.5
3.0
2.5
2.0
1.5
1.0
0.5
0
35
30
25
20
15
10
5
0
V
CE
, COLLECTER-TO-EMITTER VOLTAGE (V) V
CE
, COLLECTER-TO-EMITTER VOLTAGE (V)
FIGURE 1, Output Characteristics(T
J
= 25°C) FIGURE 2, Output Characteristics (T
J
= 125°C)
V
GE
, GATE-TO-EMITTER VOLTAGE (V) GATE CHARGE (nC)
FIGURE 3, Transfer Characteristics FIGURE 4, Gate Charge
V
GE
, GATE-TO-EMITTER VOLTAGE (V) T
J
, Junction Temperature (°C)
FIGURE 5, On State Voltage vs Gate-to- Emitter Voltage FIGURE 6, On State Voltage vs Junction Temperature
T
J
, JUNCTION TEMPERATURE (°C) T
C
, CASE TEMPERATURE (°C)
FIGURE 7, Threshold Voltage vs. Junction Temperature FIGURE 8, DC Collector Current vs Case Temperature
15V
13V
12V
9V
14V
8V
V
GE
= 15V.
250µs PULSE TEST
<0.5 % DUTY CYCLE
T
J
= 125°C
T
J
= 25°C
T
J
= -55°C
T
J
= 125°C
T
J
= 25°C
T
J
= -55°C
V
GE
= 15V
V
CE
= 960V
V
CE
= 600V
V
CE
= 240V
I
C
= 8A
T
J
= 25°C
T
J
= 25°C.
250µs PULSE TEST
<0.5 % DUTY CYCLE
I
C
= 16A
I
C
= 8A
I
C
= 4A
11V
10V
I
C
= 16A
I
C
= 8A
I
C
= 4A

APT11GF120KRG

Mfr. #:
Manufacturer:
Microchip / Microsemi
Description:
Lifecycle:
New from this manufacturer.
Delivery:
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