13
FN6818.0
December 5, 2008
A back-to-back transformer scheme is used to improve
common-mode rejection, which keeps the common-mode
level of the input matched to V
CM
. The value of the shunt
resistor should be determined based on the desired load
impedance.
The sample and hold circuit design uses a switched
capacitor input stage, which creates current spikes when the
sampling capacitance is reconnected to the input voltage.
This creates a disturbance at the input which must settle
before the next sampling point. Lower source impedance will
result in faster settling and improved performance. Therefore
a 1:1 transformer and low shunt resistance are
recommended for optimal performance.
A differential amplifier can be used in applications that
require dc coupling. In this configuration the amplifier will
typically determine the achievable SNR and distortion. A
typical differential amplifier circuit is shown in Figure 25.
Clock Input
The sample clock input circuit is a differential pair (see
Figure 29). Driving these inputs with a high level (up to
1.8V
PP
on each input) sine or square wave will provide the
lowest jitter performance.
The recommended drive circuit is shown in Figure 26. The
clock can be driven single-ended, but this will reduce the
edge rate and may impact SNR performance.
Use of the clock divider is optional. The KAD2710L's ADC
requires a clock with 50% duty cycle for optimum
performance. If such a clock is not available, one option is to
generate twice the desired sampling rate and use the
KAD2710L's divide-by-2 setting. This frequency divider uses
the rising edge of the clock, so 50% clock duty cycle is
assured. Table 2 describes the CLKDIV connection.
CLKDIV is internally pulled low, so a pull-up resistor or logic
driver must be connected for undivided clock.
Jitter
In a sampled data system, clock jitter directly impacts the
achievable SNR performance. The theoretical relationship
between clock jitter (t
J
) and SNR is shown in Equation 1 and
is illustrated in Figure 27.
Where t
J
is the RMS uncertainty in the sampling instant.
FIGURE 23. TRANSFORMER INPUT, GENERAL APPLICATION
ADT1-1WT
0.1µF
KAD2710L
VCM
50O
0.01µF
Analog
In
ADT1-1WT
FIGURE 24. TRANSFORMER INPUT FOR HIGH IF
APPLICATIONS
ADTL1-12
0.1µF
KAD2710L
VCM
ADTL1-12
1000pF
1000pF
Analog
Input
25O
25O
KAD2710
VCM
0.1µF
0.22µF
69.8O
49.9O
100O
100O
69.8O
348O
348O
CM
217O
25O
25O
Analog
Input
FIGURE 25. DIFFERENTIAL AMPLIFIER INPUT
TABLE 2. CLKDIV PIN SETTINGS
CLKDIV PIN DIVIDE RATIO
AVSS 2
AVDD 1
TC4-1W
1nF
AVDD2
200O
CLKP
CLKN
1kO 1kO
1nF
Clock
Input
FIGURE 26. RECOMMENDED CLOCK DRIVE
SNR 20 log
10
1
2f
IN
t
J
--------------------


=
(EQ. 1)
tj=100ps
tj = 1 0p s
tj = 1 p s
tj=0.1ps
10 B i ts
12 Bits
14 Bits
50
55
60
65
70
75
80
85
90
95
10 0
1 10 100 1000
Input Frequency - MHz
SNR - dB
FIGURE 27. SNR vs CLOCK JITTER
KAD2710L
14
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Intersil Corporation’s quality certifications can be viewed at www.intersil.com/design/quality
Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design, software and/or specifications at any time without
notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and
reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result
from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.
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FN6818.0
December 5, 2008
This relationship shows the SNR that would be achieved if
clock jitter were the only non-ideal factor. In reality,
achievable SNR is limited by internal factors such as
linearity, aperture jitter and thermal noise. Internal aperture
jitter is the uncertainty in the sampling instant shown in
Figure 1.
Any internal aperture jitter combines with the input clock jitter
in a root-sum-square fashion, since they are not statistically
correlated, and this determines the total jitter in the system.
The total jitter, combined with other noise sources, then
determines the achievable SNR.
Digital Outputs
Data is output on a parallel bus with LVDS-compatible
drivers.
The output format (Binary or Two’s Complement) is selected
via the 2SC pin as shown in Table 3.
TABLE 3. 2SC PIN SETTINGS
2SC PIN MODE
AVSS Two’s Complement
AVDD (or unconnected) Binary
Equivalent Circuits
FIGURE 28. ANALOG INPUTS FIGURE 29. CLOCK INPUTS
FIGURE 30. LVDS OUTPUTS
AVDD3
INP
INN
AVDD3
F1
F1
F2
Csamp
0.3pF
To
Charge
Pipeline
2pF
2pF
F2
Csamp
0.3pF
To
Charge
Pipeline
AVDD2
CLKP
CLKN
AVDD2
AVDD2
To Clock
Generation
D[9:0]P,
ORP
OVDD
OVDD
DATA
DATA
DATA
DATA
D[9:0]N,
ORN
OVDD
KAD2710L
15
FN6818.0
December 5, 2008
Layout Considerations
Split Ground and Power Planes
Data converters operating at high sampling frequencies
require extra care in PC board layout. If analog and digital
ground planes are separate, analog supply and ground
planes should be laid out under signal and clock inputs and
digital planes under outputs and logic pins. Grounds should
be joined under the chip.
Clock Input Considerations
Use matched transmission lines to the inputs for the analog
input and clock signals. Locate transformers, drivers and
terminations as close to the chip as possible.
Bypass and Filtering
Bulk capacitors should have low equivalent series
resistance. Tantalum is recommended. Keep ceramic
bypass capacitors very close to device pins. Longer traces
will increase inductance, resulting in diminished dynamic
performance and accuracy. Make sure that connections to
ground are direct, and low impedance.
LVDS Outputs
Output traces and connections must be designed for 50
(100 differential) characteristic impedance. Keep trace
lengths equal, and minimize bends where possible. Avoid
crossing ground and power-plane breaks with signal traces.
Unused Inputs
The RST and 2SC inputs are internally pulled up, and can be
left open-circuit if not used.
CLKDIV is internally pulled low, which divides the input clock
by two.
VREFSEL is internally pulled up. It must be held low for
internal reference, but can be left open for external
reference.
Definitions
Analog Input Bandwidth is the analog input frequency at
which the spectral output power at the fundamental
frequency (as determined by FFT analysis) is reduced by
3dB from its full-scale low-frequency value. This is also
referred to as Full Power Bandwidth.
Aperture Delay or Sampling Delay is the time required
after the rise of the clock input for the sampling switch to
open, at which time the signal is held for conversion.
Aperture Jitter is the RMS variation in aperture delay for a
set of samples.
Clock Duty Cycle is the ratio of the time the clock wave is at
logic high to the total time of one clock period.
Differential Non-Linearity (DNL) is the deviation of any
code width from an ideal 1 LSB step.
Effective Number of Bits (ENOB) is an alternate method of
specifying Signal to Noise-and-Distortion Ratio (SINAD). In
dB, it is calculated as: ENOB = (SINAD - 1.76)/6.02
Gain Error is the ratio of the difference between the voltages
that cause the lowest and highest code transitions to the
full-scale voltage (less 2 LSB). It is typically expressed in
percent.
Integral Non-Linearity (INL) is the deviation of each
individual code from a line drawn from negative full-scale
(1/2 LSB below the first code transition) through positive full-
scale (1/2 LSB above the last code transition). The deviation
of any given code from this line is measured from the center
of that code.
Least Significant Bit (LSB) is the bit that has the smallest
value or weight in a digital word. Its value in terms of input
voltage is V
FS
/(2
N
-1) where N is the resolution in bits.
Missing Codes are output codes that are skipped and will
never appear at the ADC output. These codes cannot be
reached with any input value.
Most Significant Bit (MSB) is the bit that has the largest
value or weight.
Pipeline Delay, or latency, is the number of clock cycles
between the initiation of a conversion and the appearance at
the output pins of the data.
Power Supply Rejection Ratio (PSRR) is the ratio of a
change in input voltage necessary to correct a change in
output code that results from a change in power supply
voltage.
Signal to Noise-and-Distortion (SINAD) is the ratio of the
RMS signal amplitude to the RMS sum of all other spectral
components below one half the clock frequency, including
harmonics but excluding DC.
Signal-to-Noise Ratio (SNR) (without Harmonics) is the
ratio of the RMS signal amplitude to the RMS sum of all
other spectral components below one-half the sampling
frequency, excluding harmonics and DC.
SNR and SINAD are either given in units of dBc when the
power level of the fundamental is used as the reference, or
dBFS (dB to full scale) when the converter’s full-scale input
power is used as the reference.
Spurious-Free-Dynamic Range (SFDR) is the ratio of the
RMS signal amplitude to the RMS value of the peak spurious
spectral component. The peak spurious spectral component
may or may not be a harmonic.
Two-Tone SFDR is the ratio of the RMS value of the lowest
power input tone to the RMS value of the peak spurious
component, which may or may not be an IMD product.
KAD2710L

KAD2710L-27Q68

Mfr. #:
Manufacturer:
Renesas / Intersil
Description:
Analog to Digital Converters - ADC 10-BIT 275MSPS SINGL ADC PROG
Lifecycle:
New from this manufacturer.
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