8V18

8V182512IDGGREP vs 8V18646AIPMREP vs 8V18502AIPMREP

 
PartNumber8V182512IDGGREP8V18646AIPMREP8V18502AIPMREP
DescriptionSpecialty Function Logic Mil Enhanced 3.3V ABT Scan Test DeviceSpecialty Function Logic Mil Enhanced 3.3V ABT Scan Test DeviceSpecialty Function Logic Mil Enhanced 3.3V ABT Scan Test Device
ManufacturerTexas InstrumentsTexas InstrumentsTexas Instruments
Product CategorySpecialty Function LogicSpecialty Function LogicSpecialty Function Logic
RoHSYNN
SeriesSN74LVTH182512-EPSN74LVTH18646A-EPSN74LVTH18502A-EP
Operating Supply Voltage3.3 V3.3 V3.3 V
Minimum Operating Temperature- 40 C--
Maximum Operating Temperature+ 85 C--
Package / CaseTSSOP-64LQFP-64LQFP-64
PackagingReelReelReel
FunctionScan Test Device with Universal Bus TransceiverScan Test Device with Bus Transceiver / RegisterScan Test Device with Universal Bus Transceiver
Number of Circuits222
Operating Temperature Range- 40 C to + 85 C--
BrandTexas InstrumentsTexas InstrumentsTexas Instruments
Mounting StyleSMD/SMTSMD/SMTSMD/SMT
Product TypeSpecialty Function LogicSpecialty Function LogicSpecialty Function Logic
Propagation Delay Time7.7 ns7.1 ns7.7 ns
Factory Pack Quantity200010001000
SubcategoryLogic ICsLogic ICsLogic ICs
Part # AliasesV62/04730-01XEV62/04731-01XEV62/04729-01XE
Unit Weight0.009263 oz0.011803 oz0.011803 oz
Moisture Sensitive-YesYes
Manufacturer Part # Description RFQ
Texas Instruments
Texas Instruments
8V182512IDGGREP Specialty Function Logic Mil Enhanced 3.3V ABT Scan Test Device
8V18646AIPMREP Specialty Function Logic Mil Enhanced 3.3V ABT Scan Test Device
8V18502AIPMREP Specialty Function Logic Mil Enhanced 3.3V ABT Scan Test Device
8V18646AIPMREP Specialty Function Logic Mil Enhanced 3.3V ABT Scan Test Device
8V18502AIPMREP Specialty Function Logic Mil Enhanced 3.3V ABT Scan Test Device
8V182512IDGGREP Specialty Function Logic Mil Enhanced 3.3V ABT Scan Test Device
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